Systems and methods for evaluating configuration changes on a machine in a manufacturing line are provided. The machine is controlled by a PLC that stores a plurality of parameters associated with the machine. The method involves operating one or more processors to: obtain, from the PLC, a plurality of first parameter values corresponding to the plurality of parameters stored at the PLC at a first time and a plurality of second parameter values corresponding to the plurality of parameters stored at the PLC at a second time; determine a plurality of parameter value differences; identify a plurality of configuration parameters from the plurality of parameters based on the plurality of parameter value differences, each configuration parameter corresponding to a user-manipulatable parameter associated with controlling the machine; and store a plurality of first configuration parameter values in association with a first timestamp corresponding to the first time.

The present disclosure relates to a PLC device capable of variably setting parameters, the PLC device converting variable parameters into a parameter program command rather than into the parameters themselves so as to store same in a program memory, thereby enabling parameter values to be actively changed according to changes in sensor values of factory equipment.

The present disclosure relates to a PLC device capable of variably setting parameters, the PLC device converting variable parameters into a parameter program command rather than into the parameters themselves so as to store same in a program memory, thereby enabling parameter values to be actively changed according to changes in sensor values of factory equipment.