An instant correction method for an encoder includes the following steps. The motion of a device under test is sensed to obtain a first wave signal and a second wave signal. The first and second wave signals are sampled to generate N first digital signal values and N second digital signal values. N positioning positions are generated according to the N first and second digital signal values, and the N positioning positions are added to a calculation group. A regression analysis is performed for the calculation group to generate a regression curve. The (N+1)-th prediction position is predicted using the regression curve. The ideal position of the device under test is determined at a time point of the (N+1)-th prediction position according to an ideal position curve. An error value between the (N+1)-th prediction position and the ideal position is applied to correct the device under test.

An infusion management method and a system are provided. The system includes the following. A central station is configured to acquire first patient information and first medication information, and send the first patient information and the first medication information to a work station. The work station is configured to receive the first patient information and the first medication information and save the first patient information and the first medication information as first information. The central station is further configured to generate a patient information carrier and a medication information carrier corresponding to the first medication information and the first medication information. An information reading device is configured to acquire second information from the patient information carrier and the medication information carrier. The work station is configured to acquire third information from the central station, acquire the second information, and determine whether the information are the same.

An instant correction method for an encoder includes the following steps. The motion of a device under test is sensed to obtain a first wave signal and a second wave signal. The first and second wave signals are sampled to generate N first digital signal values and N second digital signal values. N positioning positions are generated according to the N first and second digital signals, and the N positioning positions are added to a calculation group. A regression analysis is performed for the calculation group to generate a regression curve. The (N+1)-th prediction position is predicted using the regression curve. The ideal position of the device under test is determined at a time point of the (N+1)-th prediction position according to an ideal position curve. An error value between the (N+1)-th prediction position and the ideal position is applied to correct the device under test.