A method and associated system for applying an optimized processing treatment to items in an industrial treatment line are described. First, settings for a value of a working parameter in the treatment line are defined. The settings are associated with value ranges of a parameter representative of an external property of items. Then, a value of the parameter representative of the external property of the item is measured. A setting for the value of the working parameter associated with a value range from the set of value ranges comprising the measured value is compared to the current setting of the working parameter. When a difference is detected between the associated setting and the current setting, the current setting is changed to the associated setting.

A method includes receiving topic names from a metrology interface device, where the topic names correspond to data generated by metrology devices associated with a manufacturing operation. The method also includes accessing a data stream from the metrology interface device. The data stream includes converted metrology data (in a common format) from the metrology devices and corresponding topic names. The method further includes extracting first converted metrology data from the data stream based on a first topic name of the topic names. The first converted metrology data is generated by converting first metrology data from a first metrology device of the metrology devices to the first converted metrology data having the common format. The method also includes comparing the first converted metrology data to a specification, detecting a condition based on the comparison, and sending a command to a manufacturing device based on the condition.

A method includes receiving topic names from a metrology interface device, where the topic names correspond to data generated by metrology devices associated with a manufacturing operation. The method also includes accessing a data stream from the metrology interface device. The data stream includes converted metrology data (in a common format) from the metrology devices and corresponding topic names. The method further includes extracting first converted metrology data from the data stream based on a first topic name of the topic names. The first converted metrology data is generated by converting first metrology data from a first metrology device of the metrology devices to the first converted metrology data having the common format. The method also includes comparing the first converted metrology data to a specification, detecting a condition based on the comparison, and sending a command to a manufacturing device based on the condition.

A method and associated system for applying an optimized processing treatment to items in an industrial treatment line are described. First, settings for a value of a working parameter in the treatment line are defined. The settings are associated with value ranges of a parameter representative of an external property of items. Then, a value of the parameter representative of the external property of the item is measured. A setting for the value of the working parameter associated with a value range from the set of value ranges comprising the measured value is compared to the current setting of the working parameter. When a difference is detected between the associated setting and the current setting, the current setting is changed to the associated setting.