G05B2219/31308

INDIVIDUAL IDENTIFICATION SYSTEM
20220414851 · 2022-12-29 · ·

A registration means for storing an image of a product as a registration image in association with information representing the passing sequence that the product passed through an upstream side process; a management means for managing the matching sequence in a downstream side process; and a matching means for performing matching between an image of a product carried into the downstream side process and the registration image according to the matching sequence, are included. Each time the matching means succeeds in matching, the management means updates the matching sequence to sequence in which registration images not having succeeded in matching with any matching image are put in order on the basis of the passing sequence that the products passed through the upstream side process.

IMAGE PROCESSING DEVICE
20220346296 · 2022-10-27 · ·

The image processing device displays, on a display, a virtual screen obtained by viewing, from above, an aggregate board in which multiple unit boards having a common component configuration are arranged. A control section of the image processing device uses one unit board at a predetermined position among the multiple unit boards as a reference unit board, generates a detailed image in which respective components are arranged on the unit board based on positional information of all components to be mounted on the unit boards, for the reference unit board, generates a simplified image obtained by simplifying the unit board, for a non-reference unit board other than the reference unit board among the multiple unit boards, and displays a simple virtual screen displaying the detailed image at a position of the reference unit board and the simplified image at a position of the non-reference unit board as the virtual screen.

Hinge mechanism, electronic device and method capable of automatically executing angle rotation

An electronic device has a method capable of automatically executing angle rotation. A second body is rotatably connected to a first body of the electronic device. A hinge mechanism is disposed between the first body and the second body. The hinge mechanism includes a hinge component, a motor unit, a coupling component and an angle detecting unit. The first body and the second body are connected to the hinge component. The motor unit is electrically connected to a controller of the electronic device. The coupling component is connected between the hinge component and the motor unit. The angle detecting unit is connected to the hinge component or the coupling component to read its rotary angle. The controller drives the motor unit to rotate the hinge component via the coupling component, and the second body can be moved relative to the first body and be fixed at a predetermined position.

Computer automatic assembly system
11256235 · 2022-02-22 ·

A computer automatic assembly system is proposed. The computer automatic assembly system includes: a database for storing information of an assembly and mounting area of a part combined to a mainboard, and program information such as information of a BIOS, a driving driver, and an operating system, and periodically updating the corresponding information through a communication part including a wired/wireless communication network; a device digestive module for checking the part through a photographing means, moving the checked part to the assembly and mounting area of the part provided on the mainboard through the photographing means and a robot arm for transfer, assembling, and mounting the part, and then writing a driving program and circuit information of the part; and an administrator terminal for periodically upgrading or updating part information necessary for the device digestive module by a part company server through a communication network including the wired/wireless communication network.

Data analyzer, semiconductor manufacturing system, data analysis method, and semiconductor manufacturing method

A data analyzer includes a data collector that acquires data on each analysis target parameter of each of a plurality of apparatuses from the apparatus, the plurality of apparatuses including a light source apparatus, an exposure apparatus that exposes a wafer to pulsed light outputted from the light source apparatus, and a wafer inspection apparatus that inspects the exposed wafer, an image generator that visualizes the data on each of the parameters collected by the data collector from the apparatuses that process the wafer for each predetermined area of the wafer to convert the data into an image and generates a plurality of mapped images for each of the parameters of the apparatuses, and a correlation computing section that performs pattern matching on arbitrary ones of the mapped images generated from the wafer to determine a correlation value between arbitrary ones of the parameters of the apparatuses.

RAPID AUTOMATION SYSTEM AND METHOD FOR LINE CLEARANCE
20220113708 · 2022-04-14 ·

An automated line clearance inspection system will enable fast and accurate inspection of packaging equipment lines to reduce or prevent product intermixing. The system includes a set of image capturing devices that are controlled via a central processing unit whereby end run images are compared with control images to determine if a line is cleared.

Pharmaceutical Manufacturing Process Line Clearance
20210200193 · 2021-07-01 · ·

A computer-implemented process and computer apparatus for generating a quality control, QC, record to document line clearance of a pharmaceutical production line. The computer apparatus comprises a process data structure defining a sequence of operator actions and a line clearance protocol comprising content items and associated fields; and a mapping data structure that links operator actions to content items and fields. The operator populates the fields while progressing through the operator actions supported by an augmented reality, AR, headset which receives overlay image data of the content items and fields and transmits user input populating the fields. An automated QC check of the line clearance is performed based on an automated analysis of the field entries and outputs a QC check outcome. The QC record and QC check outcome are then transmitted to a workstation for review by a supervisor who makes a line clearance decision on that basis.

Systems and methods for automated welding

An automated welding system includes a mounting platform configured to receive an object, a welding tool, an imaging device configured to acquire at least one image associated with the object, and a controller. The controller is configured to receive the at least one acquired image, analyze at least one pixel in the at least one acquired image, identify, based upon the analyzing, an area to be welded in the at least one acquired image, wherein the area to be welded includes a defect, and generate, based upon the identifying, control instructions for controlling at least one of the mounting platform and the welding tool to weld the area to be welded.

DATA ANALYZER, SEMICONDUCTOR MANUFACTURING SYSTEM, DATA ANALYSIS METHOD, AND SEMICONDUCTOR MANUFACTURING METHOD

A data analyzer includes a data collector that acquires data on each analysis target parameter of each of a plurality of apparatuses from the apparatus, the plurality of apparatuses including a light source apparatus, an exposure apparatus that exposes a wafer to pulsed light outputted from the light source apparatus, and a wafer inspection apparatus that inspects the exposed wafer, an image generator that visualizes the data on each of the parameters collected by the data collector from the apparatuses that process the wafer for each predetermined area of the wafer to convert the data into an image and generates a plurality of mapped images for each of the parameters of the apparatuses, and a correlation computing section that performs pattern matching on arbitrary ones of the mapped images generated from the wafer to determine a correlation value between arbitrary ones of the parameters of the apparatuses.

Machine control measurements device
10445872 · 2019-10-15 · ·

A method according to a set of instructions stored on the memory of a computing device. The method including the steps of locating, identifying and determining. The locating step locates at least one reference item in an image of a machine, the reference item having at least one predefined dimensional characteristic. The identifying step identifies a plurality of target points on the machine, the plurality of target points including a first target point and a second target point. The determining step determines a location of the first target point relative to the second target point dependent upon the at least one predefined dimensional characteristic.