A method of the present disclosure includes (a) retrieving from a memory a plurality of measured values of the factor variable, and a label indicating good or bad of the quality corresponding to each of the plurality of measured values, (b) dividing a factor variable space defined by the factor variable into a plurality of grids by equally dividing a range determined by a maximum value and a minimum value of the plurality of measured values for each factor variable, (c) setting a plurality of candidate areas each of which includes one grid or a plurality of adjacent grids, and deriving, for each of the plurality of candidate areas, a good density based on the label associated with the measured value that is within the candidate area, and (d) selecting one of the plurality of candidate areas as the factor variable area, based on the good density.

A method includes defining a manufacturing transformation for a mobile workpiece based on mobile workpiece state information of the mobile workpiece, where the manufacturing transformation is an automated operation to be performed on the mobile workpiece. The method includes selecting a set of one or more manufacturing systems from among the one or more manufacturing systems for the mobile workpiece based on the manufacturing transformation and manufacturing system state information associated with the one or more manufacturing systems, where the manufacturing system state information provides data related to at least one of availability, capability, and constraints of the of the one or more manufacturing systems. The method includes defining manufacturing process steps of the manufacturing transformation based on the set of one or more manufacturing systems. The method includes defining a location for performing the manufacturing process steps on the mobile workpiece.

A system for monitoring one or more conditions of an automation system of a semiconductor factory includes one or more instrumented substrates, one or more sealable containers and one or more system servers. The one or more instrumented substrates include one or more sensors. The one or more sensors measure one or more conditions of the one or more instrumented substrates as the one or more sealable containers transport the one or more instrumented substrates through the semiconductor factory. The one or more sealable containers also receive sensor data from the one or more sensors included on the one or more instrumented substrates. The one or more system servers are configured to receive the sensor data from the one or more sealable containers. The one or more servers are configured to identify one or more deviations in the measured one or more conditions.

A control program is automatically created using an action chart that is easy to create for an automated manufacturing machine with a complex operation. A subchart is pre-created for a set of consecutive subperiods of multiple subperiods included in an action chart. The action chart includes a subchart representation in a subperiod for identifying the subchart to represent the set of consecutive subperiods corresponding to the subchart. The action chart and the subchart are read together. Program elements for element actions in the subperiods on the action chart are combined together. For the subperiod with the subchart representation on the action chart, program elements for element actions assigned to the consecutive subperiods on the subchart are combined together in an order of the consecutive subperiods on the subchart. The control program is thus generated.

A process control system includes an engineering system for a project configuration of hardware and software components of a process control system, an operator system having a runtime component for operator control and monitoring of a technical process, and an archive system for archiving project configuration inputs of the engineering system and for archiving operator inputs in the operator system, via which a project engineer and/or an operator may be provided with the relationships between engineering-relevant actions or events and runtime-relevant actions or events.

A plant system includes: an access node connected to a network; a plurality of controllers configured to perform distributed control on a plurality of field devices provided in a plant; and a wireless communication unit provided in each group of a plurality of groups into which the plurality of controllers are grouped and connected to each controller in the corresponding group via a wired connection, and configured to connect each controller to the access node via a wireless connection.

Methods, systems, and computer readable medium for a multi-source item creation system. The method includes receiving, through a user interface and from a requesting member of a digital platform, manufacturing parameters for an item to be manufactured, dynamically altering the user interface based on the manufacturing parameters to include different user interface elements that correspond to a subset of attributes, determining, based on interaction with the different user interface elements, additional manufacturing parameters, generating, using one or more machine learning models, a set of manufacturers based on the manufacturing parameters and the additional manufacturing parameters, wherein the one or more machine learning models have been trained to generate the set of manufacturers based on a level of uniqueness of the item to be manufactured and characteristics of the manufacturers, and returning, to the requesting member, a subset of the set of manufacturers.

State-of-the-art systems used for plant monitoring and optimization fail to efficiently monitor and improve the performance of blast furnace ironmaking plants due to complexity of such plants. In addition, they attempt optimization without considering the operational stability of the blast furnace. The disclosure herein generally relates to industrial plant monitoring, and, more particularly, to a method and system for ironmaking plant optimization. The system determines an operational stability of the plant in terms of value of a determined Blast Furnace Stability Index (BFSI). Further, if the BFSI or one or more Key Performance Indicators (KPIs) of the plant deviates from corresponding threshold, then the optimization is done.

The production line design apparatus includes a memory unit configured to store resource configuration information defining production resources constituting a production line to be designed, resource arrangement constraint information defining an arrangement constraint on the production resources, a production condition to be satisfied by the production line, work allocation information including a workpiece allocated to the production resources and a number of the workpiece, work order information including the production resources used in setup works of the production line and an order of the setup works, and resource candidate information defining a specification of the production resources; a layout generation unit configured to generate a plurality of layout candidates for each of the resource configuration information, where the layout candidate satisfies the arrangement constraint and the production condition; and a setup time calculation unit configured to calculate a setup time for each layout candidate.

A method for assigning a processing plan to a mobile unit data set of a mobile unit of an indoor location system of a manufacturing hall is provided. The method includes: providing a manufacturing control system for industrial processing of workpieces with a machine tool in accordance with workpiece-specific processing plans, each processing plan storing order information for a workpiece to be processed, providing a mobile unit with an image acquisition unit for acquiring image data, mobile unit data set belonging to the mobile unit and position data of the mobile unit acquired with the indoor location system being stored in the manufacturing control system, acquiring image data of a processing plan-specific object for identifying the processing plan to be assigned with the manufacturing control system, and assigning the identified processing plan to the mobile unit data set of the mobile unit in the manufacturing control system.