A display system according to one or more embodiments includes: a control unit; a display unit; and a storage unit. The storage unit is configured to store a causal relationship model representing a relationship between two or more components of the plurality of components and an abnormality that may occur in the production facility, and the control unit is configured to: display, on the display unit, a model diagram that has nodes and one or more edges connecting the nodes to each other, based on the causal relationship model; and in response to a mode selection, such as a request from a user, display the model diagram in either a first mode in which all the nodes are displayed, or a second mode in which the nodes are allocated among a predetermined number of groups based on a predetermined criterion and the groups are displayed as nodes.

A technology for associating and ascertaining the location of device variables which are in a control program and correspond to devices, and the dependency relations between the device variables, when division programming is carried out, is provided. A graph display device according to one aspect of the present invention generates a first directed graph, which comprises a plurality of first nodes respectively representing the device variables, and edges representing the existence of a dependency relation, and a second directed graph, which comprises a plurality of regions corresponding respectively to each subprogram, a plurality of first nodes, and edges, wherein the first nodes are arranged in a region of a subprogram that uses the device variable to be expressed from among the plurality of regions. In response to an instruction from a user the display device switches between displaying the generated first directed graph and displaying the generated second directed graph.

A method to ascertain a quality of a product formed by a subtractive manufacturing device from a workpiece includes: determining a deflection/test force relation for a deflection of the device; measuring an actually exerted machining force applied by the device to the workpiece; automatically determining a machining force reference for the actually exerted machining force; automatically evaluating whether the actually exerted machining force deviates from the machining force reference. If an actually exerted machining force deviates from the machining force reference, then the method uses the deflection/test force relation to automatically determine for the actually exerted machining force, at least one correction deflection of the device and automatically creating at least one corrected drive control signal to fully or partially reduce the correction deflection.

A technology for associating and ascertaining the location of device variables which are in a control program and correspond to devices, and the dependency relations between the device variables, when division programming is carried out, is provided. A graph display device according to one aspect of the present invention generates a first directed graph, which comprises a plurality of first nodes respectively representing the device variables, and edges representing the existence of a dependency relation, and a second directed graph, which comprises a plurality of regions corresponding respectively to each subprogram, a plurality of first nodes, and edges, wherein the first nodes are arranged in a region of a subprogram that uses the device variable to be expressed from among the plurality of regions. In response to an instruction from a user the display device switches between displaying the generated first directed graph and displaying the generated second directed graph.

Among a plurality of sensors that detect a state of a control subject, a relationship fluctuation level between a magnitude of a signal output by a subject sensor and a magnitude of a signal output by another related sensor is calculated for each subject sensor and related sensor combination. Moreover, the subject sensor and related sensor combinations for which a value of the relationship fluctuation level is a predetermined value or more are identified, and a respective number of appearances of the subject sensor and the related sensor included in the identified combinations thereof is calculated.

Clusters of metrics in a system are stored. A display region is divided into n divided regions in such a way that an area of a divided region i (1in) is equal to or larger than an area of a divided region i+1. Each cluster is allocated to the divided region i sequentially selected from i=1, in the decreasing order of the number of metrics contained in each of the clusters, in such a way that the number of the clusters allocated to the divided region i+1 is equal to or more than the number of clusters allocated to the divided region i. The cluster allocated to the divided region i is drawn in the divided region i.

Clusters of metrics in a system are stored. A display region is divided into n divided regions in such a way that an area of a divided region i (1in) is equal to or larger than an area of a divided region i+1. Each cluster is allocated to the divided region i sequentially selected from i=1, in the decreasing order of the number of metrics contained in each of the clusters, in such a way that the number of the clusters allocated to the divided region i+1 is equal to or more than the number of clusters allocated to the divided region i. The cluster allocated to the divided region i is drawn in the divided region i.

A system and method can identify manufactured parts. A user can select a particular manufactured part, which can be out-of-specification. The system can retrieve test data for the selected part and for other manufactured parts. The system can normalize the retrieved test data against historical means and historical standard deviations to form normalized test data. The system can correlate the normalized test data for the selected part against normalized test data for each of the other manufactured parts to form correlation values. The system can display the correlation values with identifiers corresponding to the manufactured parts. Each correlation value can represent a degree of similarity between the selected part and a respective manufactured part. The manufactured parts with the highest correlation values can have the same failure mechanism as the selected part, which can help diagnose why the selected part can be out-of-specification.

In invariant relation analysis, a correlation diagram with improved visibility is obtained. A system analysis device (100) includes a correlation model storage unit (112), and the display control unit (105). The correlation model storage unit (112) stores the correlation model expressing correlations between metrics in the system. The display control unit (105) divides a display region into n divided regions such that an area of a divided region i (1in) is equal to or larger than an area of a divided region i+1. The display control unit 105 allocates each of the plurality of clusters obtained by tracking correlations contained in the correlation model to the divided region i sequentially selected from i=1, in the decreasing order of the number of metrics contained in each of the clusters, in such a way that the allocated number increases in accordance with increase in i. The display control unit 105 draws the cluster allocated to the respective divided region i in the divided region i.

[PROBLEM] To visually display the manufacturing statuses of products manufactured through a plurality of manufacturing processes in order and changes of process characteristic factors caused in the manufacturing processes.

[SOLVING MEANS] A visualization system according to an embodiment stores manufacturing log information including start times and end times of manufacturing processes of products grouped in manufacturing units and manufactured through a plurality of manufacturing processes in order, and chronological history information of process characteristic factors corresponding to factors affecting quality characteristics in the manufacturing processes. A time axis for the process characteristic factors in synchronization with the time course of the manufacturing log information is created, and a display object representing a state or a change of each of the process characteristic factors is created based on the chronological history information and placed on the time axis to create a time line object of each of the process characteristic factors. A process characteristic factor timeline screen including the timeline objects of the respective process characteristic factors arranged in parallel is displayed on a display apparatus.