A system includes a memory and a processing device, operatively coupled to the memory, to perform operations including receiving, as input to a trained machine learning model for identifying defect impact with respect to at least one type defect type, data associated with a process related to electronic device manufacturing. The data associated with the process comprises at least one of: an input set of recipe settings for processing a component, a set of desired characteristics to be achieved by processing the component, or a set of constraints specifying an allowable range for each setting of the set of recipe settings. The operations further include obtaining an output by applying the data associated with the process to the trained machine learning model. The output is representative of the defect impact with respect to the at least one defect type.

In a workpiece production method a plurality of nominally similar workpieces are produced in a production process on one production machine. The order or time of production of some of the workpieces on the production machine is recorded. Some of the workpieces recorded are measured at two or more inspection stations. Dimensions or points of one workpiece are measured at one of the inspection stations, and corresponding dimensions or points of another of the workpieces are measured at another of the inspection stations. The results of the measurements of corresponding dimensions or points made at the two or more inspection stations are analysed together, taking account of the order or time of production of the workpieces. An output signal is produced based on the analysing of the results together. The output signal indicates performance of the production machine or of one or more of the inspection stations.

A system and method are provided for determining operational parameters for improving energy efficiency of a process. The method includes obtaining energy usage data and production and operating data generated by utilizing at least one utility in the process and using the energy data and production and operating data to generate a first principles model. The method also includes obtaining sensor data from at least one sensor coupled to equipment used during operation of the process; generating an efficiency model using at least one data driven model, the sensor data, and the first principles model; and using the efficiency model to generate an energy optimization to achieve a greenhouse gas reduction in operation of the process. The method also includes generating an output comprising at least one operation parameter value to enable adjustment of the equipment to adjust operation of the process towards the greenhouse gas reduction; and providing the output to an operational controller.

The invention relates to a method (100) for controlling film production, in which at least one film is produced according to at least one formula information (R), the following steps being carried out: initiation of execution (210) of a film production process such that a film is produced on the basis of a specific formulation information (R); determination of monitoring information (I) during the execution (210) of the process; determination of at least one fingerprint (F) on the basis of the specific formula information (R) and on the basis of the monitoring information (I) such that the execution (210) of the process is characterised on the basis of the fingerprint (F); and comparison of the fingerprint (F) with a control matrix (M) such that at least one comparative result is determined in order to control the film production on the basis of the control matrix (M) as an evaluation basis.

The invention relates to a method for producing a plurality of mechanical devices, in which each mechanical device comprises a defined number N of identical parts to be assembled, the parts to be assembled having been produced according to a set of specifications including at least one compliance specification, the parts that meet the compliance specification being compliant parts and the parts that do not meet the compliance specification being non-compliant parts, characterized in that production is controlled in such a way that the number of mechanical devices containing a number of non-compliant parts strictly higher than a threshold value n1 are in a proportion less than or equal to a proportion p1, the proportion p1 being non-zero and strictly lower than 1. The invention also relates to a method for repairing a mechanical device that has been produced with such a production method.

A device for computing correction for control parameter in a manufacturing process executed on a manufacturing apparatus includes circuitry which acquires an index representing fluctuation in a manufacturing apparatus, acquires an apparatus model and a process model, acquires an output from a sensor in the manufacturing apparatus, transforms the output into first fluctuation for a process element, transforms the index into second fluctuation for the process element based on the apparatus model, computes fluctuation for performance indicator from the first and second fluctuation based on the process model, computes correction for the performance indicator from control range for the performance indicator and the fluctuation for the performance indicator, and converts the correction for the performance indicator into correction for each process element based on the process model such that correction for control parameter in process executed on the manufacturing apparatus is computed from the correction converted for each process element.

A production system and method may comprise a first production processing machine capable of processing a workpiece and a second production processing machine capable of processing the workpiece. The production system and method may also comprise a workpiece transfer device, the workpiece transfer device moving the workpiece from the first production processing machine to the second production processing machine, an inspection device identifying whether the workpiece meets at least one specification of the workpiece, and a computing device in communication with the inspection device notifying a user whether the workpiece is compliant with the at least one specification where the computing device is operative communication with either or both of the first production processing machine and the second production processing machine whereby the computing device alters operation of either or both of the first and second production processing machines.

A processing apparatus includes a central control unit, and a processing quality prediction unit, a processing unit, and a tool compensation unit which are respectively connected with the central control unit electrically. The processing quality prediction unit implements a virtual processing quality prediction method to predict the processing quality of the workpiece, output an accurate data of quality to the central control unit, and generate tool path for the processing unit to process the workpiece. The central control unit judges the data from the processing quality prediction unit and outputs the data to the tool compensation unit to calculate tool compensation data. The tool compensation unit provides the tool compensation data to the processing quality prediction unit to form a new processing path. Then the processing unit implements the compensated processing path to process the workpiece.

This method includes a step of imaging, by an imaging apparatus in a substrate treatment system, a reference substrate which is a reference for condition setting and acquiring a captured image of the reference substrate; and a step of imaging, by the imaging apparatus, a treated substrate on which the predetermined treatment has been performed under a current treatment condition and acquiring a captured image of the treated substrate. A deviation amount in color information between the captured image of the treated substrate and the captured image of the reference substrate is calculated. A correction amount of the treatment condition is calculated based on a correlation model acquired in advance and on the deviation amount in the color information. Also included is a step of setting the treatment condition based on the correction amount and performing the treatment on a target substrate based on the set treatment condition.

Computer systems (130, 120, 230) support a production process with a first sub-process to process a chemical substance at a production site and with a second sub-process to analyze a physical sample of the chemical substance at a laboratory site. A process control system (120) provides first type data (A) to identify physical samples, and a manufacturing system (130) provides second type data (B) that are required to control a production process. Connector modules (105, 205) transmit the data (A, B) in a message (150) to a laboratory system (230) to obtain laboratory data, as an analysis result. The connector module (205) that is associated with the laboratory system (230) distributes the data according to the types. A control signal module (139) derives a control signal (136/138) for controlling the production process. This control signal closes a control loop for adjusting the first sub-process until the laboratory data shows compliance.