The present invention provides methods and systems for manufacturing process control of photovoltaic products. Some embodiments relate to a method for tracking wafers for photovoltaic products with respect to which production tool processed them and their position within that production tool. Some embodiments relate to measuring and characterizing the critical-to-quality parameters of the partially-finished photovoltaic products emerging from the production tool in question. Some embodiments relate to display and visualization of the measured parameters on a computer screen, such that the parameters of each production unit can be directly observed in the context of which production tools processed them, which location within a specific production tool they were located in during processing, and which batch, or in the case of continuous processing, what time, the unit(s) was/where processed.

A method for manufacturing a plurality of components, each of the plurality of components including at least one electrical feedthrough, in which a functional element is fastened in a feedthrough opening in a base body by way of an electrically insulating material, an information being acquired in association with each of the plurality of components, the method comprising the steps of: providing, in one of a plurality of manufacturing steps of the method, each of the plurality of components or one of a plurality of pre-stages of each of the plurality of components with an information store, at least one of (i) the information being stored in the information store, and (ii) an identifier is stored in the information store and the information is stored in a database in association with the identifier.

A method for inspecting components includes providing a plurality of different three-dimensional component CAD models with each three-dimensional component CAD model of the plurality of different three-dimensional component CAD models sharing at least one common geometric feature. The method further includes generating an inspection sequence for the at least one common geometric feature, collecting feature manufacturing data for the at least one common geometric feature during manufacturing of a plurality of different components corresponding to the respective plurality of different three-dimensional component CAD models, analyzing the feature manufacturing data associated with the at least one common geometric feature, modifying the inspection sequence for the at least one common geometric feature based on the analyzed feature manufacturing data, and inspecting components based on the modified inspection sequence.

An information processing device includes: a memory; and a processor coupled to the memory and configured to: learn a classification rule that classifies an abnormal degree of a production facility from a text feature amount based on the text feature amount obtained from a number of texts included in a plurality of pieces of log data obtained in a predetermined process of the production facility and production history information of the production facility; extract a text feature amount of log data to be monitored obtained in the predetermined process of the production facility; and determine an abnormal degree of the production facility when the log data to be monitored is obtained based on the text feature amount and the classification rule.

One or more processors receive operational data. The operational data includes two or more fields that contain an identical type of data as two or more fields within a master table. One or more processors generate a plurality of first unique identifiers from the two or more fields within the operational data and the master table. One or more processors determine a match between a pair of the plurality of first unique identifiers. The match is between a first unique identifier included in a operational data record and a first unique identifier included in a master table record. One or more processors determine a second unique identifier from the master table record. One or more processors generate an operational table record that includes the second unique identifier and at least a portion of the operational data.

This disclosure provides an apparatus and method for interactive batch operations system enabling operation excellence and competency transition. The method includes collecting data related to a batch process from different departments within a batch processing facility into a common data repository; transforming the collected data based on provided intelligence; exploiting the transformed data in the common data repository; determining a best possible alternative for continued operation of the batch process based on the exploited data; providing a visualization of the best possible alternative of the batch process using a digital twin; and operating the batch process using the determined best possible alternative on a physical twin corresponding to the digital twin.

The present disclosure provides systems and methods for controlling a semiconductor manufacturing equipment. The control system includes an inspection unit capturing a set of images of the semiconductor manufacturing equipment, a sensor interface receiving the set of images and generating at least one input signal for a database server, and a control unit. The control unit includes a front end subsystem, a calculation subsystem, and a message and feedback subsystem. The calculation subsystem receives the data signal from the front end subsystem, wherein the calculation subsystem performs an artificial intelligence analytical process to determine, according to the data signal, whether a malfunction has occurred in the semiconductor manufacturing equipment and to generate an output signal. The message and feedback subsystem generates an alert signal and a feedback signal according to the output signal, and the alert signal is transmitted to a user of the semiconductor manufacturing equipment.

Provided is a production management system including: an operational data acquisition unit for acquiring operational data regarding a production element in a target production process as a target among a plurality of production processes for producing a product from a material; a quality data acquisition unit for acquiring quality data indicating quality of a target product; an analysis unit for analyzing the operational and quality data to estimate an influence, caused by an upstream product, on the quality of the target product, the upstream product being a product of an upstream production process and serving as a material in the target production process; and a feedback unit for outputting, based on an analysis result, feedback data for evaluating a production element in the upstream production process based on the quality of the target product in the upstream production process.

An information management method includes acquiring a component serial number identifying an individual of a target component used in each process and a unit serial number (or a product serial number) identifying an individual of an intermediate product (or a product) manufactured by the process according to work order of the process. The information management method includes registering the component serial number in a hierarchy of the target component in the acquired order in a BOM database, and registering the unit serial number (or the product serial number) in a hierarchy of the process in the acquired order in a BOP database.

Wafer inspection with stable nuisance rates and defect of interest capture rates are disclosed. This technique can be used for discovery of newly appearing defects that occur during the manufacturing process. Based on a first wafer, defects of interest are identified based on the classified filtered inspection results. For each remaining wafer, the defect classifier is updated and defects of interest in the next wafer are identified based on the classified filtered inspection results.