A data processing apparatus includes a processor. The processor generates visualization data for displaying estimation results of manufacturing conditions based on estimation results and relationship data. The relationship data includes first relationship data as a relationship between first manufacturing conditions recorded during an analysis, and second relationship data as a relationship between second manufacturing conditions corresponding. The processor divides the estimation results of the manufacturing conditions into a first group based on the first relationship data, and into a second group based on the second relationship data. The processor generates the visualization data based on a change in manufacturing condition relationship between the first group and the second group.

A method for factory analysis and/or maintenance, preferably including receiving factory information and/or associating defects with factory components, and optionally including acting based on defect associations and/or operating factory machines. The method is preferably associated with one or more manufacturing systems and/or elements thereof.

A method for factory analysis and/or maintenance, preferably including receiving factory information and/or associating defects with factory components, and optionally including acting based on defect associations and/or operating factory machines. The method is preferably associated with one or more manufacturing systems and/or elements thereof.

One or more aspects of the present invention relate to a computer-implemented method for part analytics, in particular for analyzing the quality, the machining process and preferably the engineering process, of a workpiece machined by at least one CNC machine. According to these aspects, the method may include providing a digital machine model of the CNC machine with realtime and non-realtime process data of the at least one CNC machine, the realtime and non-realtime process data being recorded during the machining process of the workpiece under consideration; and subsequently simulating the machining process under consideration by means of the digital machine model based at least partially on the recorded realtime and non-realtime process data.

A production system includes a cell control apparatus that is connected to a machine control apparatus and an inspection control apparatus. The cell control apparatus includes a storage part that stores data on a state of the manufacturing machine, data on an environment state, and data on an inspection result of a product. The cell control apparatus includes a correlation analysis part that selects a variable relating to an abnormality based on a correlation between the inspection result of the product, and the data on the state of the manufacturing machine and the data on the environment state when the abnormality occurs in the inspection result, and a determination value setting part that sets a determination value of the variable relating to the abnormality.

A defect profiling and tracking system for a process-manufacturing enterprise is provided. The system includes a memory and a processor. The processor is configured to access entity data for a plurality of entities of the process-manufacturing enterprise and process parameter data for one or more deviating entities. The processor is configured to analyze the entity data and the process parameter data for each of the deviating entities to determine a plurality of relationships between quality defects and the process parameters to generate a unique entity specific process signature (EPS) for each entity. The processor is configured to receive real-time process parameter data for one or more entities to generate a real-time process signature for the one or more entities and compare the real-time process signature of each entity with EPS corresponding to the entity to detect one or more EPS matches that are indicative of a quality defect.

In general, according to one embodiment, a data processing apparatus includes a processor including hardware. The processor acquires state data related to a state of each product and order data related to order related to manufacturing of each product. The processor calculates a first score by using the acquired state data and the acquired order data. The first score regards a change in the acquired state data and is based on a first change model. The first change model represents the change in the state data using the order data. The processor outputs the first score.

A system for analyzing cause of product defect, including: a distributed storage device configured to store production data generated by a factory device; an analysis device including one or more processors configured to perform: acquiring a production record from the production data; the production record includes information of processing devices used during production procedures for producing the products and information of defects occurring, where each product is processed by multiple processing devices, and each processing device participates in only the production procedures of a portion of the products; determining a correlation weight of the processing device to be analyzed corresponding to a defect to be analyzed according to the production record, and determining a correlation between the processing device to be analyzed and the defect to be analyzed according to the correlation weight; a display device configured to display an analysis result of the analysis device.

Disclosed are a production management method and a production management system. The method includes: acquiring a first time data of a first type machine; filtering to obtain a production data of a first type product produced by the first type machine under the first time data based on a preset algorithm; searching to obtain a current distribution site of the first type product, according to the production data of the first type product; and withholding the first type product in the current distribution site.

An analysis system 10 includes: an operational data acquisition unit 11 that acquires operational data including an operational state of a production line 20; a product information acquisition unit 13 that acquires a state of a product manufactured in the production line and outputs the state of the product as product information; a production state analyzer 12 that obtains a predetermined physical quantity of the product on a basis of the operational data acquired by the operational data acquisition unit 11 and outputs the predetermined physical quantity as information on the physical quantity; and a correlation analyzer 14 that performs analysis of a correlation between the information on the physical quantity and the product information.