Patent classifications
G05B2219/32225
Inspection method for inspecting display panel and inspection apparatus
The present application provides a method for inspecting a display panel and an inspection apparatus. Wherein the method for inspecting the display panel including the following steps: setting substrate random sampling parameters in a manufacturing process by a manufacturing execution module, and transmitting the random sampling parameters to a production line control module; receiving and storing the random sampling parameters by the production line control module; generating a random sampling control signal and transmitting to a detector according to the random sampling parameters by the production line control module; and performing a random sampling to a substrate by the detector in accordance with the random sampling control signal.
INSPECTION METHOD FOR INSPECTING DISPLAY PANEL AND INSPECTION APPARATUS
The present application provides a method for inspecting a display panel and an inspection apparatus. Wherein the method for inspecting the display panel including the following steps: setting substrate random sampling parameters in a manufacturing process by a manufacturing execution module, and transmitting the random sampling parameters to a production line control module; receiving and storing the random sampling parameters by the production line control module; generating a random sampling control signal and transmitting to a detector according to the random sampling parameters by the production line control module; and performing a random sampling to a substrate by the detector in accordance with the random sampling control signal.