Described herein are, among others, systems and methods associated with electrical test planning in a semiconductor manufacturing context. Within an electrical test planning system in the semiconductor industry, various models that allow a better utilization of installed capacity were developed. The workflow in the plant and the information flow in the electrical test planning area were analyzed to reduce or minimize setup times on the equipment. A paradigm shift is disclosed, with which planning is done at the product family level instead of at the level of the part number, starting with priority products required by the market.

Described herein are, among others, systems and methods associated with electrical test planning in a semiconductor manufacturing context. Within an electrical test planning system in the semiconductor industry, various models that allow a better utilization of installed capacity were developed. The workflow in the plant and the information flow in the electrical test planning area were analyzed to reduce or minimize setup times on the equipment. A paradigm shift is disclosed, with which planning is done at the product family level instead of at the level of the part number, starting with priority products required by the market.

Described herein are, among others, systems and methods associated with electrical test planning in a semiconductor manufacturing context. Within an electrical test planning system in the semiconductor industry, various models that allow a better utilization of installed capacity were developed. The workflow in the plant and the information flow in the electrical test planning area were analyzed to reduce or minimize setup times on the equipment. A paradigm shift is disclosed, with which planning is done at the product family level instead of at the level of the part number, starting with priority products required by the market.

In one embodiment, a production management apparatus includes a flow obtaining module configured to obtain a plurality of processing flows to process a wafer from a flow storage module. The apparatus further includes a route creating module configured to select a plurality of steps from the plurality of processing flows, and configured to create a processing route to execute the plurality of steps selected from the plurality of processing flows. The apparatus further includes a flow creating module configured to select a plurality of steps from the processing route, and configured to create a new processing flow including the plurality of steps selected from the processing route.

Described herein are, among others, systems and methods associated with electrical test planning in a semiconductor manufacturing context. Within an electrical test planning system in the semiconductor industry, various models that allow a better utilization of installed capacity were developed. The workflow in the plant and the information flow in the electrical test planning area were analyzed to reduce or minimize setup times on the equipment. A paradigm shift is disclosed, with which planning is done at the product family level instead of at the level of the part number, starting with priority products required by the market.

The present invention comprises a cloud-based interface layer comprising a plurality of telegram structures, a plurality of telegrams based on the plurality of telegram structures, and a telegram processor that parses said plurality of telegrams. The interface layer acts as a middleware architecture between a plurality of systems providing standardized storage for all of them. The telegrams are used to validate and control the processes between these systems. The systems may include a manufacturing execution system, a quality management system, a learning management, and a laboratory information management system. The interface layer is designed to be prevalidated according to one or more industry standards such as the Good Manufacturing Practices (GMP).