A system and method for using a probe assembly to apply a desired force to a target surface. The method includes moving the probe assembly into an approach position, the approach position being a predetermined distance from the target surface. The probe assembly is then moved from the approach position to the target surface pursuant to a soft landing procedure. The soft landing procedure includes determining that the probe assembly has moved into soft contact with the target surface. The method further includes applying, subsequent to establishment of the soft contact between the probe assembly and the target surface, force to the probe assembly until an applied force on the target surface reaches the desired force. The applied force may then be monitored based upon an output of a load cell responsive to a force exerted by the probe assembly.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to and operable to stress a smart device in an enclosure, wherein the enclosure comprises a plurality of components, and wherein the system controller comprises: (a) a memory comprising test logic; and (b) a processor configured to automatically control the plurality of components and test the smart device in accordance with the test logic. Further, the plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto, wherein the stylus is operable to manipulate the smart device; and (b) a platform comprising a device holder affixed thereto, wherein the device holder is operable to receive the smart device, and wherein the platform and the robotic arm are robotically controlled to move by the processor.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

A method for modeling a working environment of a robot comprising providing a robot having a base, a reference point, a plurality of links by which the reference point is movably connected to the base, and sensors for detecting positions of or angles between the links, providing a controller adapted to associate a position of the reference point to detected positions or angles between of the links, installing the base in a working environment which is delimited by at least one surface, moving the reference point to at least one sample point of the at least one surface, determining the position of the sample point from positions of or angles between the links detected while the reference point is at the sample point, and inferring the position of the surface from the determined position.

An automated test system for testing smart devices is presented. The system includes a system controller coupled to a smart device, wherein the system controller includes a memory with test logic and a processor. The system also includes an enclosure with a plurality of components. The plurality of components include (a) a robotic arm with a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; (b) a platform with a device holder, wherein the device holder is operable to hold a smart device inserted therein; (c) an audio capture and generator device; and (d) a microphone. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

The robot of this embodiment moves a work tool to points where multiple work-pieces are placed, and executes a process specified at each point where the work-piece is placed. A point sequence memory stores the point where the work-piece is placed. A work-instruction-sequence memory stores a work instruction executed at the point where the work-piece is placed. A work-piece-correction-level memory stores, in association with each other, a work-piece correction level at each point and a parameter of each point where the work-piece is placed. A work-piece-correction counter memory stores a counter indicating to which point the work-piece correction level at the point is reflected.