Patent classifications
G05B2219/37085
ANALYSIS DEVICE, ANALYSIS METHOD, MACHINING SYSTEM, AND PROGRAM
An analysis device according to the present disclosure analyzes the state of a machining tool. The analysis device includes: an acquisition unit that acquires a measurement result from at least one sensor fitted to the machining tool; a computation unit that performs data processing to the measurement result acquired by the acquisition unit; and an image processing unit that displays a first image and a second image on a display screen, the first image displaying the measurement result acquired by the acquisition unit in time-series, the second image displaying a computation result after the data processing is performed by the computation unit. The image processing unit displays, as the second image, the computation result corresponding to the measurement result for a specific time period in the first image.