A control device moves a cutting tool relative to a workpiece to bring the workpiece and the cutting tool into contact with each other, and acquires a coordinate value of a reference point when the workpiece and the cutting tool come into contact with each other. The control device derives an error between the coordinate value thus acquired and a design coordinate value of the reference point at a position where the workpiece and the cutting tool come into contact with each other, and outputs information on the error.

A touch trigger probe interface for a machine tool is described that includes a probe communication portion for receiving probe event information from a touch trigger probe. A machine tool communication portion is also provided for outputting probe event information to a numerical controller of the machine tool. The machine tool communication portion outputs the probe event information as digital data packets, for example over a digital data bus. The digital data packets may include a time stamp and/or the touch trigger probe interface may receive timing information from the machine tool. A touch trigger probing system and a machine tool system including the probe interface are also described.

A touch trigger probe interface for a machine tool is described that includes a probe communication portion for receiving probe event information from a touch trigger probe. A machine tool communication portion is also provided for outputting probe event information to a numerical controller of the machine tool. The machine tool communication portion outputs the probe event information as digital data packets, for example over a digital data bus. The digital data packets may include a time stamp and/or the touch trigger probe interface may receive timing information from the machine tool. A touch trigger probing system and a machine tool system including the probe interface are also described.

A touch trigger probe interface for a machine tool is described that includes a probe communication portion for receiving probe event information from a touch trigger probe. A machine tool communication portion is also provided for outputting probe event information to a numerical controller of the machine tool. The machine tool communication portion outputs the probe event information as digital data packets, for example over a digital data bus. The digital data packets may include a time stamp and/or the touch trigger probe interface may receive timing information from the machine tool. A touch trigger probing system and a machine tool system including the probe interface are also described.

Systems and methods are disclosed for determining tool offset data for a tool attached to a robot at an attachment point. In an embodiment, a method includes controlling the robot to contact a reference object with the tool. The reference object is a rigid object with a known location. A force feedback sensor of the robot indicates when the tool has contacted the reference object. Once contact is made, data indicating robot position during tool contact is received. Additionally, the robot temporarily stops movement of the tool to prevent damage to the tool or the reference object. Next, tool offset data is determined based on the position of the reference object relative to the robot and the received robot position data. The tool offset data describes the distance between at least one point on the tool and the attachment point.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

A touch trigger probe interface for a machine tool is described that includes a probe communication portion for receiving probe event information from a touch trigger probe. A machine tool communication portion is also provided for outputting probe event information to a numerical controller of the machine tool. The machine tool communication portion outputs the probe event information as digital data packets, for example over a digital data bus. The digital data packets may include a time stamp and/or the touch trigger probe interface may receive timing information from the machine tool. A touch trigger probing system and a machine tool system including the probe interface are also described.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to and operable to stress a smart device in an enclosure, wherein the enclosure comprises a plurality of components, and wherein the system controller comprises: (a) a memory comprising test logic; and (b) a processor configured to automatically control the plurality of components and test the smart device in accordance with the test logic. Further, the plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto, wherein the stylus is operable to manipulate the smart device; and (b) a platform comprising a device holder affixed thereto, wherein the device holder is operable to receive the smart device, and wherein the platform and the robotic arm are robotically controlled to move by the processor.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.