Disclosed is an intelligent micromanipulation system based on machine vision, including a base, wherein a microscope, a rotating table and two lifting tables are arranged on the base, the microscope is located right above the rotating table, the two lifting tables are arranged at two sides of the rotating table, respectively, and each is provided with a mechanical arm, each of the two manipulators is provided with an end effector, the mechanical arm is capable of driving the corresponding end effector to perform fine adjustment in x, y and z directions, one of the end effectors clamps a suction holding needle in communication with a suction pump, while the other end effector clamps an injection needle in communication with an injection pump; and the rotating table includes a tray, a rotating mechanism and a driving device, and the driving device drives the tray to rotate via the rotating mechanism.

Disclosed is an intelligent micromanipulation system based on machine vision, including a base, wherein a microscope, a rotating table and two lifting tables are arranged on the base, the microscope is located right above the rotating table, the two lifting tables are arranged at two sides of the rotating table, respectively, and each is provided with a mechanical arm, each of the two manipulators is provided with an end effector, the mechanical arm is capable of driving the corresponding end effector to perform fine adjustment in x, y and z directions, one of the end effectors clamps a suction holding needle in communication with a suction pump, while the other end effector clamps an injection needle in communication with an injection pump; and the rotating table includes a tray, a rotating mechanism and a driving device, and the driving device drives the tray to rotate via the rotating mechanism.

Methods, devices, and systems for controlling a scanning tunneling microscope system are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a control system included in or added to a scanning tunneling microscope (STM) to receive data characterizing a tunneling current between a tip of the scanning tunneling microscope system and a sample, to estimate, in real-time, a work function associated with the scanning tunneling microscope system, and to adjust, by a control system, a position of the tip based on an estimated work function. Associated systems are described herein.

A manipulation system includes: a manipulator that operates a microscopic object; a first input unit that generates a first movement command signal for moving the manipulator to a manipulator position corresponding to an input operation position; and a second input unit that generates a second movement command signal for moving the manipulator to a manipulator stored position stored in a storage. When the input operation position of the first input unit is a predetermined input operation position, the manipulator is enabled to be moved by an operation of the first input unit, or the manipulator is enabled to be moved by an operation of the second input unit.

A grid plate encoder based positioning system (1) for positioning of an element is provided, the positioning system (1) comprises a grid plate (2) with a grid plate surface (21); an encoder unit (3) with one or more optical sensors (31) for sensing a grid plate surface pattern (23) of the grid plate surface (21); an input (7) to receive coordinates (Xd, Yd) specifying a desired position of the element; a mapping unit (8) to compute compensated coordinate data (Xa, Ya) corresponding to estimated position data expected from the encoder unit (3) when the element is positioned at a desired position (Xd, Yd) specified by the setpoint coordinates; a feedback control unit (9) providing the compensated coordinate data (Xa, Ya) as a setpoint (Xs, Ys) to a positioning unit (12), with feedback control based on the estimated position data obtained from the encoder unit.

Additionally, a grid plate encoder based positioning method and a method for computing compensation data are provided.

Methods, devices, and systems for controlling a scanning tunneling microscope system are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a control system included in or added to a scanning tunneling microscope (STM) to receive data characterizing a tunneling current between a tip of the scanning tunneling microscope system and a sample, to estimate, in real-time, a work function associated with the scanning tunneling microscope system, and to adjust, by a control system, a position of the tip based on an estimated work function. Associated systems are described herein.

A manipulation system includes: a manipulator that operates a microscopic object; a first input unit that generates a first movement command signal for moving the manipulator to a manipulator position corresponding to an input operation position; and a second input unit that generates a second movement command signal for moving the manipulator to a manipulator stored position stored in a storage. When the input operation position of the first input unit is a predetermined input operation position, the manipulator is enabled to be moved by an operation of the first input unit, or the manipulator is enabled to be moved by an operation of the second input unit.