Physical layer devices and related methods for determining Bit Error Rates (BERs) and correcting errors in signals received through shared transmission media of wireless local area networks are disclosed. A physical layer device is configured to identify coding violations in received signal, determine a rate of the coding violations in the signal, and estimate a BER of the signal to be equal to the determined rate of the coding violations. A physical layer device is configured to invert a half symbol immediately preceding or immediately following a coding violation based, at least in part, on signal integrities of the half symbol immediately preceding and the half symbol immediately following the coding violation to correct a bit error.

A sensor system may include first and second sensors configured to be coupled to a vehicle and generate respective first and second sensor signals indicative of operation of the vehicle. The sensor system may also include a sensor anomaly detector including an anomalous sensor model configured to receive the first and second sensor signals and determine that one or more of the first sensor or the second sensor is an anomalous sensor generating inaccurate sensor data. The sensor system may also be configured to identify one or more of the first sensor or the second sensor as the anomalous sensor generating inaccurate sensor data.

An improved method for investigating a functional behavior of a component of a technical installation includes comparing a signal of the component to be investigated and representing the functional behavior of the component with a reference signal which describes an average functional behavior of identical components. During the comparison, a comparison variable describing the deviation of the signal from the reference signal is determined. In addition, a probability of the occurrence of the comparison variable is determined by using a predefinable distribution of a multiplicity of such comparative variables. A computer program and a computer readable storage medium are also provided.

A memory device includes a path state check circuit configured to check states of signal transmission paths, each signal transmission path including a data transmission path and a clock transmission path of the memory device. The path state check circuit includes a sampling circuit configured to perform a sampling operation by using pattern data that has passed through the data transmission path and a clock signal that has passed through the clock transmission path, and generate sample data, and a management circuit configured to generate a comparison of the sample data with the pattern data and manage check result information indicating whether a re-training operation for the memory device is to be performed, based on a result of the comparison.

A memory device includes a path state check circuit configured to check states of signal transmission paths, each signal transmission path including a data transmission path and a clock transmission path of the memory device. The path state check circuit includes a sampling circuit configured to perform a sampling operation by using pattern data that has passed through the data transmission path and a clock signal that has passed through the clock transmission path, and generate sample data, and a management circuit configured to generate a comparison of the sample data with the pattern data and manage check result information indicating whether a re-training operation for the memory device is to be performed, based on a result of the comparison.

The disclosure relates to an apparatus and method for false pass detection in lockstep dual processing core systems, triple modular redundancy (TMR) systems, or other redundant processing systems. A false pass occurs when two processing cores generate matching data outputs, both of which are in error. A false pass may occur when the processing core are both subjected to substantially the same adverse condition, such as a supply voltage drop or a sudden temperature change or gradient. The apparatus includes processing cores configured to generate first and second data outputs and first and second timing violation signals. A voter-comparator validates the first and second data outputs if they match and the first and second timing violation signals indicate no timing violations. Otherwise, the voter comparator invalidates the first and second data outputs. Validated data outputs are used for performing additional operations, and invalidated data outputs may be discarded.

A method for tracing an error of a logic system design includes obtaining an assertion failure of a combinational cone of the logic system design, the combinational cone including a plurality of sub-cones; and obtaining machine learning models of the sub-cones. Each sub-cone represents a sub-circuitry of the logic system design and has one or more input signals and an output signal. The assertion failure indicates an actual signal value of the combinational cone at a current clock cycle being different from an expected output value at the current clock cycle. The method also includes: performing backtracing on the sub-cones according to the assertion failure, the machine learning models of the sub-cones, and dynamic backtracing sensitivities corresponding to the sub-cones, to obtain a backtracing result; and outputting one or more target sub-cones as candidate root causes of the assertion failure according to the backtracing result.

An embodiment of a circuit includes a data latch and a plurality of cascaded latches, wherein a first of the plurality of cascaded latches is configured to receive a first signal from the data latch and each subsequent cascaded latch is configured to receive a data output signal of a preceding cascaded latch, and an error-detection circuit configured to receive the respective data output signals and detect error in operation of the cascaded latches based thereon.

Disclosed herein is a test circuit for a 3D semiconductor device for detecting soft errors and a method for testing thereof. The test circuit includes a first Multiple Input Signature Register (MISR) disposed in a first semiconductor chip, the first MISR compressing a first test result signal corresponding to a test pattern, a second MISR disposed in a second semiconductor chip stacked on or under the first semiconductor chip, the second MISR compressing a second test result signal corresponding to the test pattern, and a first error detector to detect a soft error by comparing a first output signal output from the first MISR with a second output signal output from the second MISR.

A module health system includes a module health circuit comprising a hardware register that is set to a first value in response to the system starting, an application register that is set to the first value in response to the system starting and a watchdog timer register that is set to the first value in response to the system starting. The system further includes a power on self-test that determines whether the system has passed a plurality of tests and that selectively sets the hardware register to a second value based on the determination, an external software application that determines whether a safety critical system is healthy and selectively sets the application register based on the determination, a watchdog timer application that selectively sets the watchdog timer register, a central processing unit that determines whether to de-assert a module health signal.