An arrangement for automated testing of mobile devices comprising a learning arrangement for learning how to use test devices that do not match with an earlier already defined test case pattern. In the arrangement the learning arrangement generates instructions for performing a set of tasks. The tasks are then executed in the mobile device being tested. The mobile device provides feedback in form of error/success messages, screenshots, source code, return values and similar. Based on the feedback and earlier accumulated information the learning entity can generate a new set of instructions in order to execute the set of tasks successfully.

Systems and methods for replacing and testing a data storage device are disclosed. In disclosed embodiments, a system including a data storage array (DSA) including a plurality of data storage devices (DSDs) in an enclosure. The system further includes an I/O server coupling the DSA to a client node and configured to provide data access between the client node and the DSA. The system further includes a management server coupled to the DSA, configured to detect a failed DSD in the DSA, detect a replacement DSD in the enclosure that replaces the failed DSD, and add the replacement DSD to a logical path of the DSA. The management server is further configured to display an indication of a state of the DSA based on the comparing.

There are disclosed various methods, apparatuses and computer program products for a testing apparatus. In accordance with an embodiment the testing apparatus includes a frame; a gripping head for gripping a device to be tested; a first movement element for moving the gripping head with respect to the frame; a movement detector to detect at least one of a location and a position of the device; a touching element for touching the device; an imaging device for capturing images of the device; a display for generating visual information for capturing by the device; a set of sensors for examining operations of the device; a set of actuators for providing signals for reception by the device; and a set of plugs adapted to be inserted into a socket of the device.

A system, method, and computer program are provided for combining results of event processing received from a plurality of virtual processes or servers. In use, an event is sent to a plurality of virtual processes or virtual servers. Further, a result of processing of the event is received from each of the virtual processes or virtual servers. In addition, the results received from the plurality of virtual processes or virtual servers are combined.

Examples of electronic devices are described herein. In some examples, an electronic device may include a communication interface to receive information from a peripheral device. In some examples, the electronic device may include logic circuitry to determine a target latency tolerance reporting (LTR) value based on the information via a machine learning model.

Example techniques may be implemented as a method, a system or more non-transitory machine-readable media storing instructions that are executable by one or more processing devices, Operations performed by the example techniques include obtaining data representing results of tests executed by one or more test instruments on an initial set of devices under test (DUTs) in a test system; and using the data to train a machine learning model. The machine learning model is for predicting which of the tests will produce failing results for a different set of DUTs. DUTs in the different set have one or more features in common with DUTs in the initial set.

A test apparatus is provided for use with a mainframe and an adapter. The test apparatus includes a logical adapter interface unit and a control system. The logical adapter interface unit is interposable between the adapter and the mainframe whereby an I/O signal transmittable from the adapter and to the mainframe is transmitted through the logical adapter interface unit. The logical adapter interface unit is configured to manipulate the I/O signal. The control system is coupled to the logical adapter interface unit and the mainframe and is configured to control manipulations of the I/O signal by the logical adapter interface unit to mimic a condition of I/O traffic being run through the adapter and to log a response of the mainframe to the manipulations.

A configuration device in a test and measurement system including an event generator and a Device Under Test (DUT) to receive one or more events generated by the event generator includes an output display structured to graphically illustrate a first event timeline that includes source event markers for a first test channel for a second test channel, in which the first event timeline and the second event timeline appear on the output display as separate timelines vertically separated from one another. The position of the event delay indicator or a position of the event width indicator may be movable by a user, and moving the position of the event delay indicator or moving the position of the event width indicator causes the event generator to change one or more event generation parameters of the first event based on such movement. Methods are also disclosed.

An apparatus includes operational circuitry and Hardware Diagnostics Circuitry (HDC). The HDC is configured to receive a definition of multiple trigger rules, each trigger rule specifying a respective trigger event as a function of trigger data sources in the operational circuitry, to receive a definition of (i) a pre-trigger logging set selected from among a plurality of diagnostics data sources in the operational circuitry, and (ii) for each trigger rule, a respective post-trigger logging set including a set of one or more of the diagnostics data sources, and, during operation of the operational circuitry, to log the diagnostics data sources in the pre-trigger logging set, to log the trigger data sources and to repeatedly evaluate the trigger rules, and, in response to triggering of a given trigger event by a given trigger rule, to start logging the diagnostics data sources in the post-trigger logging set of the given trigger rule.

An automated test platform is disclosed for use in developing and troubleshooting customized software for multimedia content receivers. The automated test platform allows developers to script test cases that permit interaction with multiple content receivers at the same time. The test platform can be applied generally to any client-server system. The automated test platform is used to create scripts, run the scripts on multiple content receivers, and view test results. A graphical user interface (GUI) is provided that allows technicians without any programming experience to build and run complex interactive test sequences in a modular fashion. Such an automated test platform can be used to test cable and satellite television set top boxes, as well as DVD players, streaming media receivers, and game consoles.