A method of providing transformed target points for integrating a component into an assembly includes collecting a set of component target points, collecting a set of assembly target points, identifying target points common to the set of component target points and the set of assembly target points; performing a specified number of Monte Carlo transformations of selected ones of the common target points to yield a set of transformed target points and vectors and an associated uncertainty value for each transformed target point and vector, and using certain ones of the transformed target points for integrating the component into the assembly based on the associated uncertainty value for each of the transformed target points.

A method determines the connectivity components defined by a set of relations over a set of data elements. For each first data element of a selected subset of data elements, a second data element that is linked to the first data element by a path of relations is selected as its representative, using a randomization process. A new set of relations is created by replacing each first data element of the subset by its representative in at least part of the set of relations.

A device for generating true random numbers by way of a quantum optic process, the device having a light source for generating at least one single-photon within a light beam; and at least two detectors each for detecting single-photons within the beam thereby providing detector signals; and control means provided and adapted to control generation of a series of single photons and to register the detector signals for generating the true random number values; wherein the detectors for detecting single-photons each including at least one quantum dot; and wherein the detectors are positioned at substantially equivalent spatial position of detection probability of single-photons in the beam.

This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.

This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.

Provided is an apparatus for generating a digital value, including: an identification value generator including a plurality of unit cells; and an identification value extractor outputting an identification value of a plurality of bits by using output values of the plurality of unit cells, wherein each of the plurality of unit cells includes an identification value generating element including a first upper electrode and a second upper electrode formed on the same layer, and determines the output value according to electrical connection or cut-off of the first upper electrode and the second upper electrode.

This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.

This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.

Systems and methods for calculating random values based on data errors are presented. A message collection circuit may collect sets of data having data errors and store them to a memory. The stored sets of data may then be processed to produce a random value based on errors in the sets of data. The random value(s) may be provided to random number generator(s), encryption circuit(s), or other circuit(s).

A device for random number generation based on an optical process of quantum nature, including a light source emitting photons randomly, a light detector adapted to absorb the randomly emitted photons and to measure a number n of photons produced by the light source in a time interval T, and a randomness extractor. The detector includes a photon sensor acting as a photon-to-electron converter, an amplifier for converting the electron signal received from the photon sensor into a voltage and amplifying the voltage signal, as well as an analog-to-digital converter for processing the amplified signal received from the amplifier by encoding the amplified signal into digital values and sending these digital values to the randomness extractor for further processing such as to produce quantum random numbers (QRNs) based on the number of photons produced by the light source in a time interval T.