Embodiments of the invention are directed to a computer-implemented method of determining timing constraints of a first component-under-design (CUD). The computer-implemented method includes accessing, using a processor, a plurality of timing constraint requirements configured to be placed on the first CUD by one or more second CUDs, wherein each of the plurality of timing constraint requirements is specifically designed for the CUD. The processor is used to perform a comparative analysis of each of the plurality of timing constraints to identify a single timing constraint that satisfies each of the plurality of timing constraints.

Embodiments of the invention are directed to a computer-implemented method of determining timing constraints of a first component-under-design (CUD). The computer-implemented method includes accessing, using a processor, a plurality of timing constraint requirements configured to be placed on the first CUD by one or more second CUDs, wherein each of the plurality of timing constraint requirements is specifically designed for the CUD. The processor is used to perform a comparative analysis of each of the plurality of timing constraints to identify a single timing constraint that satisfies each of the plurality of timing constraints.

A margin correction method and a margin correction system for static timing analysis are provided. The margin calibration method includes: measuring dies on a to-be-tested chip with a target circuit to obtain performance data records; obtaining simulation data records for simulating performances of the dies; executing a static timing analysis (STA) tool to obtain timing analysis results; statistically calculating a simulation process corner based on the timing analysis results; obtaining a measurement process corner based on the performance data records; establishing a statistical model that defines a margin as a difference between the measurement process corner and the simulation process corner; substituting the timing analysis results and the measurement process corner into the statistical model and execute a model fitting algorithm, for fitting the statistical model to a target model to obtain the margin; and obtaining calibrated timing analysis results.

A margin correction method and a margin correction system for static timing analysis are provided. The margin calibration method includes: measuring dies on a to-be-tested chip with a target circuit to obtain performance data records; obtaining simulation data records for simulating performances of the dies; executing a static timing analysis (STA) tool to obtain timing analysis results; statistically calculating a simulation process corner based on the timing analysis results; obtaining a measurement process corner based on the performance data records; establishing a statistical model that defines a margin as a difference between the measurement process corner and the simulation process corner; substituting the timing analysis results and the measurement process corner into the statistical model and execute a model fitting algorithm, for fitting the statistical model to a target model to obtain the margin; and obtaining calibrated timing analysis results.

A method of manufacturing a semiconductor device includes reducing errors in a migration of a first netlist to a second netlist, the first netlist corresponding to a first semiconductor process technology (SPT), the second first netlist corresponding to a second SPT, the first and second netlists each representing a same circuit design, the reducing errors including: inspecting a timing constraint list corresponding to the second netlist for addition candidates; generating a first version of the second netlist having a first number of comparison points relative to a logic equivalence check (LEC) context, the first number of comparison points being based on the addition candidates; performing a LEC between the first netlist and the first version of the second netlist, thereby identifying migration errors; and revising the second netlist to reduce the migration errors, thereby resulting in a second version of the second netlist.

Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.

Disclosed in the present invention is a method for optimizing circuit timing based on a flexible register timing library. First, registers are simulated respectively in a case of a plurality of groups of an input signal conversion time, a clock signal conversion time, and a register load capacitance, corresponding actual propagation delays at this time are obtained by changing setup slack and hold slack of the registers, and actual propagation delays of the registers under specific input signal conversion time, clock signal conversion time, register load capacitances, setup slack, and hold slack are obtained through linear interpolation, to establish a flexible register timing library; and then static timing analysis is performed on all register paths in a circuit by using the library, a minimum clock cycle under a condition of satisfying that a setup time margin and a hold time margin are both greater than zero is found by changing the setup slack and hold slack of the registers, thereby improving the performance of the circuit without changing the design of the circuit and without increasing the area overheads of the circuit.

Disclosed in the present invention is a method for optimizing circuit timing based on a flexible register timing library. First, registers are simulated respectively in a case of a plurality of groups of an input signal conversion time, a clock signal conversion time, and a register load capacitance, corresponding actual propagation delays at this time are obtained by changing setup slack and hold slack of the registers, and actual propagation delays of the registers under specific input signal conversion time, clock signal conversion time, register load capacitances, setup slack, and hold slack are obtained through linear interpolation, to establish a flexible register timing library; and then static timing analysis is performed on all register paths in a circuit by using the library, a minimum clock cycle under a condition of satisfying that a setup time margin and a hold time margin are both greater than zero is found by changing the setup slack and hold slack of the registers, thereby improving the performance of the circuit without changing the design of the circuit and without increasing the area overheads of the circuit.

A non-transitory computer-readable recording medium storing a timing library creation program of causing a computer to execute processing, the processing including: extracting, from a delay variation database that stores delay variation values of gates included in circuit design data, a delay variation value, out of the delay valuation values matching to characteristics which are characteristics of one of signal paths in the circuit design data and which include a threshold voltage, a drive force, and a number of gate stages of the signal path; calculating an extended delay variation coefficient based on the extracted delay variation value and the characteristics; and creating, based on a basic timing library in which the delay variation value is not reflected and the extended delay variation coefficient, an extended timing library in which the delay variation value is reflected.

A non-transitory computer-readable recording medium storing a timing library creation program of causing a computer to execute processing, the processing including: extracting, from a delay variation database that stores delay variation values of gates included in circuit design data, a delay variation value, out of the delay valuation values matching to characteristics which are characteristics of one of signal paths in the circuit design data and which include a threshold voltage, a drive force, and a number of gate stages of the signal path; calculating an extended delay variation coefficient based on the extracted delay variation value and the characteristics; and creating, based on a basic timing library in which the delay variation value is not reflected and the extended delay variation coefficient, an extended timing library in which the delay variation value is reflected.