Disclosed herein is logic circuitry and techniques for operation that hardware to enable the construction of first-in-first-out (FIFO) buffers from latches while permitting stuck-at-1 fault testing for the enable pin of those latches, as well as testing the data path at individual points through the FIFO buffer.

An accelerator for bitonic sorting includes a plurality of compare-exchange circuits and a first-in, first-out (FIFO) buffer associated with each of the compare-exchange circuits. An output of each FIFO buffer is a FIFO value. The compare-exchange circuits are configured to, in a first mode, store a previous value from a previous compare-exchange circuit or a memory to its associated FIFO buffer and pass a FIFO value from its associated FIFO buffer to a subsequent compare-exchange circuit or the memory; in a second mode, compare the previous value to the FIFO value, store the greater value to its associated FIFO buffer, and pass the lesser value to the subsequent compare-exchange circuit or the memory; and in a third mode, compare the previous value to the FIFO value, store the lesser value to its associated FIFO buffer, and pass the greater value to the subsequent compare-exchange circuit or the memory.

A semiconductor device includes a memory circuit, a first FIFO, a second FIFO and an input/output circuit. The memory circuit outputs data. The first FIFO receives data from the memory circuit and outputs data synchronously with a first clock signal. The second FIFO receives data output from the first FIFO and outputs data synchronously with the first clock signal. The input/output circuit outputs data output from the second FIFO. The second FIFO is disposed in the vicinity of the input/output circuit than the first FIFO.

A semiconductor device includes a memory circuit, a first FIFO, a second FIFO and an input/output circuit. The memory circuit outputs data. The first FIFO receives data from the memory circuit and outputs data synchronously with a first clock signal. The second FIFO receives data output from the first FIFO and outputs data synchronously with the first clock signal. The input/output circuit outputs data output from the second FIFO. The second FIFO is disposed in the vicinity of the input/output circuit than the first FIFO.

Systems and corresponding methods employ an object-oriented (OO) memory (OOM) to effect inter-hardware-client (IHC) communication among a plurality of hardware clients included in same. A system comprises a centralized OOM and the plurality of hardware clients communicate, directly, to the centralized OOM device via OO message transactions. The centralized OOM device effects IHC communication among the plurality of hardware clients based on the OO message transactions. Another system comprises a plurality of OO memories (OOMs) capable of inter-object-oriented-memory-device communication. A hardware client communicates, directly, to a respective OOM device via OO message transactions. The inter-object-oriented-memory-device communication effects IHC communication among the plurality of hardware clients based on the OO message transactions.

Disclosed herein is logic circuitry and techniques for operation that hardware to enable the construction of first-in-first-out (FIFO) buffers from latches while permitting stuck-at-1 fault testing for the enable pin of those latches, as well as testing the data path at individual points through the FIFO buffer.

Disclosed examples include an apparatus. The apparatus may include first interfaces, second interfaces, a bus interface, and a buffer interface. The first interfaces may be to communicate at first data widths via first interconnects for operable coupling with data samples sources. The second interface may be to communicate at second data widths via second interconnects for operable coupling with data sinks. The buffer interface may be to communicate with a system to process data samples sampled using different sampling rates according to processing frame durations. The buffer interface may include an uplink channel handler and a downlink channel handler. The uplink channel handler may be to receive data samples from the first interfaces at first data widths and provide the data samples to the bus interface at third data widths. The downlink channel handler may be to receive processed data samples from the bus interface at third data widths and provide the processed data samples to the second interfaces at second data widths. The bus interface to communicate at a third data width via a third interconnect for operative coupling with allocated memory region utilized by the system to process data samples.

Disclosed examples include an apparatus. The apparatus may include first interfaces, second interfaces, a bus interface, and a buffer interface. The first interfaces may be to communicate at first data widths via first interconnects for operable coupling with data samples sources. The second interface may be to communicate at second data widths via second interconnects for operable coupling with data sinks. The buffer interface may be to communicate with a system to process data samples sampled using different sampling rates according to processing frame durations. The buffer interface may include an uplink channel handler and a downlink channel handler. The uplink channel handler may be to receive data samples from the first interfaces at first data widths and provide the data samples to the bus interface at third data widths. The downlink channel handler may be to receive processed data samples from the bus interface at third data widths and provide the processed data samples to the second interfaces at second data widths. The bus interface to communicate at a third data width via a third interconnect for operative coupling with allocated memory region utilized by the system to process data samples.

Embodiments of the present disclosure include a multipurpose multiply-accumulator (MAC) array circuit comprising one or more input memories for receiving operands and a plurality of multiply-accumulator circuits each selectively coupled to the one or more input memories to receive at least a pair of operands and generate a result. Each of the plurality of multiply-accumulator circuits receives operands from the one or more input memories independently. Additionally, selection of operands from the one or more input memories is controlled based on at least an operation and/or data types, where different operation and/or data types configure the plurality of multiply-accumulator circuits to receive different pairs of operands from the one or more input memories to execute particular operation types.

Embodiments of the present disclosure include a multipurpose multiply-accumulator (MAC) array circuit comprising one or more input memories for receiving operands and a plurality of multiply-accumulator circuits each selectively coupled to the one or more input memories to receive at least a pair of operands and generate a result. Each of the plurality of multiply-accumulator circuits receives operands from the one or more input memories independently. Additionally, selection of operands from the one or more input memories is controlled based on at least an operation and/or data types, where different operation and/or data types configure the plurality of multiply-accumulator circuits to receive different pairs of operands from the one or more input memories to execute particular operation types.