Patent classifications
G06T2211/461
Edge Phase Effects Removal Using Wavelet Correction and Particle Classification Using Combined Absorption and Phase Contrast
An x-ray microscopy method that obtains a classification of different particles by distinguishing between different material phases through a combination of image processing involving morphological edge enhancement and possibly resolved absorption contrast differences between the phases along with optional wavelet filtering.
X-ray phase-contrast imaging
Systems and methods for X-ray phase-contrast imaging (PCI) are provided. A quasi-periodic phase grating can be positioned between an object being imaged and a detector. An analyzer grating can be disposed between the phase grating and the detector. Second-order approximation models for X-ray phase retrieval using paraxial Fresnel-Kirchhoff diffraction theory are also provided. An iterative method can be used to reconstruct a phase-contrast image or a dark-field image.
DEEP LEARNING FOR SLIDING WINDOW PHASE RETRIEVAL
An image processing system (IPS) and related method for supporting tomographic imaging. The system comprises an input interface (IN) for receiving, for a given projection direction (pi), a plurality of input projection images at different phase steps acquired by a tomographic X-ray imaging apparatus configured for dark-field and/or phase-contrast imaging. A machine learning component (MLC) processes the said plurality into output projection imagery that includes a dark-field projection image and/or a phase contrast projection image for the said given projection direction.
X-ray imaging apparatus and x-ray imaging method
An X-ray imaging apparatus is configured to acquire a plurality of pieces of slice image data from volume data, acquire a plurality of pieces of first processed image data by performing first processing, acquire a plurality of pieces of second processed image data by performing second processing, detect edges of the subject based on the acquired plurality of pieces of the second processed image data, and acquire edge image data including detected edges of the subject.
Correction of sharp-edge artifacts in differential phase contrast CT images and its improvement in automatic material identification
A method for correcting image data from a differential phase contrast imaging system is provided. Data comprising distorted data due to spatial variation is obtained. The data is corrected by correcting the distorted data.
Phase-contrast and dark-field CT reconstruction algorithm
A system and related method for signal processing. Interferometric projection data reconstructed into one or more images for a spatial distribution of a physical property of an imaged object. The interferometric projection data is derived from signals acquired by an X-ray detector (D), said signals caused by X-ray radiation after interaction of said X-ray radiation with an interferometer and with the object (OB) to be imaged, said interferometer (IF) having an inter-grating distance. The reconstructor (RECON) configured to perform, based on the projection data and a forward signal model, a reconstruction operation for one or more images in an image domain of a spatial distribution of at least one physical property of said object (OB) including a refractive index, wherein the reconstructor is configured to perform in the reconstruction operation a scaling operation based on the inter-grating distance of the interferometer and/or on a distance of a location in said image domain from said interferometer (IF).
X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD
An X-ray imaging apparatus is configured to acquire a plurality of pieces of slice image data from volume data, acquire a plurality of pieces of first processed image data by performing first processing, acquire a plurality of pieces of second processed image data by performing second processing, detect edges of the subject based on the acquired plurality of pieces of the second processed image data, and acquire edge image data including detected edges of the subject.
Robust reconstruction for dark-field and phase contrast CT
A system and related method for signal processing. Interferometric projection data reconstructed into one or more images for a spatial distribution of a physical property of an imaged object. The interferometric projection data is derived from signals acquired by an X-ray detector (D), said signals caused by X-ray radiation after interaction of said X-ray radiation with an interferometer and with the object (OB) to be imaged, said interferometer (IF) having a reference phase. A reconstructor (RECON) reconstructs for the image(s) by fitting said data to a signal model by adapting fitting variables, said fitting variables including i) one or more imaging variables for the one or more images and ii), in addition to said one or more imaging variables, a dedicated phase variable for a fluctuation of said reference phase.
CORRECTION OF SHARP-EDGE ARTIFACTS IN DIFFERENTIAL PHASE CONTRAST CT IMAGES AND ITS IMPROVEMENT IN AUTOMATIC MATERIAL IDENTIFICATION
A method for correcting image data from a differential phase contrast imaging system is provided. Data comprising distorted data due to spatial variation is obtained. The data is corrected by correcting the distorted data.
Beam hardening correction for scanning dark field and phase contrast imaging
An apparatus and related method for processing image data supplied by a scanning phase contrast or dark-field imaging apparatus (MA). Beam hardening artifact in phase contrast and dark-field imaging can be reduced by applying a beam hardening processing operation by a beam hardening processing module (BHC) in respect of a plurality of detector readings that contribute signals to the same image pixel position or geometric ray of an imaging region of the apparatus (MA). In one embodiment, a phantom body (PB) is used to acquire calibration data on which the beam hardening processing is based.