A method for measuring distorted illumination patterns and correcting image artifacts in structured illumination microscopy. The method includes the steps of generating an illumination pattern by interfering multiple beams, modulating a scanning speed or an intensity of a scanning laser, or projecting a mask onto an object; taking multiple exposures of the object with the illumination pattern shifting in phase; and applying Fourier transform to the multiple exposures to produce multiple raw images. Thereafter, the multiple raw images are used to form and then solve a linear equation set to obtain multiple portions of a Fourier space image of the object. A circular 2-D low pass filter and a Fourier Transform are then applied to the portions. A pattern distortion phase map is calculated and then corrected by making a coefficient matrix of the linear equation set varying in phase, which is solved in the spatial domain.

A method for measuring distorted illumination patterns and correcting image artifacts in structured illumination microscopy. The method includes the steps of generating an illumination pattern by interfering multiple beams, modulating a scanning speed or an intensity of a scanning laser, or projecting a mask onto an object; taking multiple exposures of the object with the illumination pattern shifting in phase; and applying Fourier transform to the multiple exposures to produce multiple raw images. Thereafter, the multiple raw images are used to form and then solve a linear equation set to obtain multiple portions of a Fourier space image of the object. A circular 2-D low pass filter and a Fourier Transform are then applied to the portions. A pattern distortion phase map is calculated and then corrected by making a coefficient matrix of the linear equation set varying in phase, which is solved in the spatial domain.

Various methods and systems are provided for artifact reduction with resolution preservation. In one example, a method includes obtaining projection data of an imaging subject, identifying a metal-containing region in the projection data, interpolating the metal-containing region to generate interpolated projection data, extracting high frequency content information from the projection data in the metal-containing region, adding the extracted high frequency content information to the interpolated projection data to generate adjusted projection data, and reconstructing one or more diagnostic images from the adjusted projection data.

Various methods and systems are provided for artifact reduction with resolution preservation. In one example, a method includes obtaining projection data of an imaging subject, identifying a metal-containing region in the projection data, interpolating the metal-containing region to generate interpolated projection data, extracting high frequency content information from the projection data in the metal-containing region, adding the extracted high frequency content information to the interpolated projection data to generate adjusted projection data, and reconstructing one or more diagnostic images from the adjusted projection data.

A system can receive downhole acquisition data relating to a wellbore. The system can pre-process the downhole acquisition data. The system can generate an incomplete borehole image using the downhole acquisition data. The system can determine a sparse representation based on the incomplete borehole image by performing an optimization with respect to the incomplete borehole image. The system can generate a complete borehole image based on an inverse of the sparse representation.

There are provided techniques for analyzing an atom probe tomography data set obtained from a tip-shaped sample. The techniques include defining analysis sub-volumes in the atom probe tomography data set; performing a fast Fourier transform (FFT) on each of the analysis sub-volumes to obtain a signal in a Fourier domain; identifying at least one FFT peak in the signal in the Fourier domain, each FFT peak being indicative of an expected crystal feature in the corresponding analysis sub-volume; continuously and automatically calculating an image compression factor and a radius of the tip-shaped sample, based on identified crystal features, the identified crystal features being obtained from a collection of expected crystal features; and reconstructing a three-dimensional model of the tip-shaped sample. Said reconstructing includes comparing the identified crystal features with calibration data; and dynamically adjusting the image compression factor and the radius of the tip-shaped sample.

There are provided techniques for analyzing an atom probe tomography data set obtained from a tip-shaped sample. The techniques include defining analysis sub-volumes in the atom probe tomography data set; performing a fast Fourier transform (FFT) on each of the analysis sub-volumes to obtain a signal in a Fourier domain; identifying at least one FFT peak in the signal in the Fourier domain, each FFT peak being indicative of an expected crystal feature in the corresponding analysis sub-volume; continuously and automatically calculating an image compression factor and a radius of the tip-shaped sample, based on identified crystal features, the identified crystal features being obtained from a collection of expected crystal features; and reconstructing a three-dimensional model of the tip-shaped sample. Said reconstructing includes comparing the identified crystal features with calibration data; and dynamically adjusting the image compression factor and the radius of the tip-shaped sample.

An imaging device 10 according to one aspect of the present invention includes: a subject distance acquisition section 115; a movement amount acquisition section 120 that acquires an amount of movement of the subject on the basis of the subject distance; a restoration processing determination section 125 that determines, on the basis of the amount of movement acquired by the movement amount acquisition section 120, whether the restoration processing should be performed on the images through a restoration filter, a restoration strength of the restoration processing should be adjusted and the restoration processing should be performed on the images, or the restoration processing should not be performed on the images; and a restoration processing execution section 105 that performs the restoration processing on the images through the restoration filter or with the adjusted restoration strength, on the basis of the determination of the restoration processing determination section 125.

An imaging device 10 according to one aspect of the present invention includes: a subject distance acquisition section 115; a movement amount acquisition section 120 that acquires an amount of movement of the subject on the basis of the subject distance; a restoration processing determination section 125 that determines, on the basis of the amount of movement acquired by the movement amount acquisition section 120, whether the restoration processing should be performed on the images through a restoration filter, a restoration strength of the restoration processing should be adjusted and the restoration processing should be performed on the images, or the restoration processing should not be performed on the images; and a restoration processing execution section 105 that performs the restoration processing on the images through the restoration filter or with the adjusted restoration strength, on the basis of the determination of the restoration processing determination section 125.

In one embodiment, a computer-based method includes obtaining a first image where the first image includes one or more patterns, generating a second image that substantially removes or reduces the one or more patterns from the first image at least partially by automatically detecting the one or more patterns and a zone where the one or more patterns occur in the first image, converting the first image to frequency domain data, applying a multi-parameter filter to the frequency domain data to substantially remove or reduce the one or more patterns. The parameters may include bandwidths in a depth and azimuthal direction. The parameters may be adapted in the multi-parameter filter based on the one or more patterns. The method also includes transforming the frequency domain data to spatial domain data and outputting the second image based at least in part on the spatial domain data.