G11B2007/25708

Recording layer for optical recording medium and optical recording medium
09830941 · 2017-11-28 · ·

An optical recording medium includes a transmissive recording layer containing an oxide of a metal M.sub.A, an oxide of a metal M.sub.B, and an oxide of a metal M.sub.C. The metal M.sub.A is at least one kind selected from the group consisting of Mn and Ni. The metal M.sub.B is at least one kind selected from the group consisting of W and Mo. The metal Mc is Zr. An atomic ratio (M.sub.A/M.sub.B) of the metal M.sub.A to the metal M.sub.B is not less than 0.37 and not more than 1.31. The metal M.sub.C is contained in the transmissive recording layer at not less than 0.9 atomic % and not more than 27.5 atomic %.

Dielectric layer, optical recording medium, sputtering target and oxide
10971183 · 2021-04-06 · ·

A dielectric layer is formed from an oxide containing Sn and at least one of Zn, Zr, Si and Ga. The molar percentages of Sn, Zn, Zr, Si, and Ga, relative to the total elements in the oxide, represented by a, b, c, d, and e, respectively, satisfy the conditions (1)-(7): (1) 0≤b/(a+b)≤0.6, (2) 0≤(c+d)/(a+b+c+d+e)≤0.5, (3) 0≤b≤50, (4) 0≤c≤40, (5) 0≤d≤45, (6) 0≤e≤40, and (7) 20≤b+c+d+e≤80. The dielectric layer enables favorable information recording in an oxide-based recording layer on which the dielectric layer is directly overlaid, does not require preventive measures for health hazard, and is superior in durability.

High density optical recording medium having multiple recording layers
10522181 · 2019-12-31 · ·

Provided is an optical recording medium including two or more recording layers, and a light irradiation surface that is irradiated with light for recording an information signal on the two or more recording layers. Among the two or more recording layers, at least one layer other than a layer located on the deepest side from the light irradiation surface includes an oxide of a metal A, an oxide of a metal B, and an oxide of a metal C. The metal A is at least one kind among W, Mo, and Zr, the metal B is Mn, and the metal C is at least one kind among Cu, Ag, and Ni. Ratios of the metal A, the metal B, and the metal C satisfy a relationship of 0.46x1 (provided that, x1=a/(b+0.8c), a representing an atomic ratio [atom %] of the metal A with respect to the sum of the metal A, the metal B, and the metal C, b representing an atomic ratio [atom %] of the metal B with respect to the sum of the metal A, the metal B, and the metal C, and c representing an atomic ratio [atom %] of the metal C with respect to the sum of the metal A, the metal B, and the metal C.

DIELECTRIC LAYER, OPTICAL RECORDING MEDIUM, SPUTTERING TARGET AND OXIDE

A dielectric layer is formed from an oxide containing Sn and at least one of Zn, Zr, Si and Ga. The molar percentages of Sn, Zn, Zr, Si, and Ga, relative to the total elements in the oxide, represented by a, b, c, d, and e, respectively, satisfy the conditions (1)-(7): (1) 0b/(a+b)0.6, (2) 0(c+d)/(a+b+c+d+e)0.5, (3) 0b50, (4) 0c40, (5) 0d45, (6) 0e40, and (7) 20b+c+d+e80. The dielectric layer enables favorable information recording in an oxide-based recording layer on which the dielectric layer is directly overlaid, does not require preventive measures for health hazard, and is superior in durability.

OPTICAL RECORDING MEDIUM, METHOD FOR PRODUCING SAME AND RECORDING LAYER FOR OPTICAL RECORDING MEDIA
20190108854 · 2019-04-11 ·

Provided is an optical recording medium including two or more recording layers, and a light irradiation surface that is irradiated with light for recording an information signal on the two or more recording layers. Among the two or more recording layers, at least one layer other than a layer located on the deepest side from the light irradiation surface includes an oxide of a metal A, an oxide of a metal B, and an oxide of a metal C. The metal A is at least one kind among W, Mo, and Zr, the metal B is Mn, and the metal C is at least one kind among Cu, Ag, and Ni. Ratios of the metal A, the metal B, and the metal C satisfy a relationship of 0.46x1 (provided that, x1=a/(b+0.8c), a representing an atomic ratio [atom %] of the metal A with respect to the sum of the metal A, the metal B, and the metal C, b representing an atomic ratio [atom %] of the metal B with respect to the sum of the metal A, the metal B, and the metal C, and c representing an atomic ratio [atom %] of the metal C with respect to the sum of the metal A, the metal B, and the metal C.