Circuits for measuring a leakage current of one or more capacitors coupled to a power supply line that powers an apparatus, such as a storage device, are disclosed. In one embodiment, the circuit includes first and second resistors between the power supply line, and first and second respective switches to ground. A controller may charge the voltage line to a first voltage. Thereafter, the controller discharges the first voltage to a second voltage via the first resistor during a first identified time. After recharging the voltage line, the controller then discharge the first voltage to the second voltage via at least the second resistor during a second identified time. The controller determines the parasitic resistance using the first and second identified times, and then the leakage current from the parasitic resistance. Removing the leakage current factor from subsequent measurements can greatly improve testing accuracy and can avoid false positives in the testing process that would otherwise require removal of drives or other systems that are working properly.

A data storage device is disclosed comprising a head actuated over a magnetic media, wherein the head comprises a write element, a read element, a laser, and a near field transducer. An operating thermal gradient of the magnetic media is periodically measured at an operating power setting for the laser that achieves a target magnetic write width. When a slope of the operating thermal gradient exceeds a threshold, a test thermal gradient and magnetic write width of the magnetic media is measured at multiple power settings for the laser in order to detect a contamination of the near field transducer.

An apparatus and method for precise and fast measurement of distances between fiducial features of samples such as transducers spans. In one approach, the apparatus includes a sample holder for holding a plurality of discrete samples having fiducial features thereon. The apparatus also includes a device configured to acquire locations of the fiducial features of the samples positioned in the sample holder. An x-y stage is configured to move the sample holder along an x-y plane for selectively positioning a first fiducial feature of a selected one of the samples to within ±10 micrometers or better of a predefined location in a field of view of the device in both x and y directions. A precision stage is configured to control an extent of movement of the selected one of the samples along an axis a predefined distance to an accuracy of about ±50 nanometers or better.

Circuits for measuring a leakage current of one or more capacitors coupled to a power supply line that powers an apparatus, such as a storage device, are disclosed. In one embodiment, the circuit includes first and second resistors between the power supply line, and first and second respective switches to ground. A controller may charge the voltage line to a first voltage. Thereafter, the controller discharges the first voltage to a second voltage via the first resistor during a first identified time. After recharging the voltage line, the controller then discharge the first voltage to the second voltage via at least the second resistor during a second identified time. The controller determines the parasitic resistance using the first and second identified times, and then the leakage current from the parasitic resistance. Removing the leakage current factor from subsequent measurements can greatly improve testing accuracy and can avoid false positives in the testing process that would otherwise require removal of drives or other systems that are working properly.

An apparatus and method for precise and fast measurement of distances between fiducial features of samples such as transducers spans. In one approach, the apparatus includes a sample holder for holding a plurality of discrete samples having fiducial features thereon. The apparatus also includes a device configured to acquire locations of the fiducial features of the samples positioned in the sample holder. An x-y stage is configured to move the sample holder along an x-y plane for selectively positioning a first fiducial feature of a selected one of the samples to within ±10 micrometers or better of a predefined location in a field of view of the device in both x and y directions. A precision stage is configured to control an extent of movement of the selected one of the samples along an axis a predefined distance to an accuracy of about ±50 nanometers or better.

A data storage device is disclosed comprising a head actuated over a magnetic media, wherein the head comprises a write coil and a write pole. A test pattern is written to the magnetic media by applying a first current to the write coil. A second current is applied to the write coil while the head passes over the test pattern, wherein the second current has a polarity opposite the first current. After applying the second current to the write coil while the head passes over the test pattern, the test pattern is read from the magnetic media using the head to generate a first read signal, and a first noise power of the first read signal is measured. A degradation of the write pole is detected based on the first noise power measurement.

A data storage device is disclosed comprising a head actuated over a magnetic media, wherein the head comprises a write coil and a write pole. A test pattern is written to the magnetic media by applying a first current to the write coil. A second current is applied to the write coil while the head passes over the test pattern, wherein the second current has a polarity opposite the first current. After applying the second current to the write coil while the head passes over the test pattern, the test pattern is read from the magnetic media using the head to generate a first read signal, and a first noise power of the first read signal is measured. A degradation of the write pole is detected based on the first noise power measurement.

A method, computer system, and computer program product for determining head wear of magnetic tape head elements of tape drives during operation. The method may include receiving a first calibration parameter for a first tape head element at a first time. Calibration parameter for the first tape head element may be compared with a reference parameter. Determination may be made whether to remove the first tape head element from service or generate a warning, based on a result of the comparison. Method may include generating the first calibration parameter by calculating midpoint bias voltage for the first tape head element as a function of bias current and head resistance. The first calibration parameter for the first tape head element may be bias current parameter or bias resistance parameter. The first calibration parameter for the first tape head element may be less than, equal to, or greater than the reference parameter.

A method, computer system, and computer program product for determining head wear of magnetic tape head elements of tape drives during operation. The method may include receiving a first calibration parameter for a first tape head element at a first time. Calibration parameter for the first tape head element may be compared with a reference parameter. Determination may be made whether to remove the first tape head element from service or generate a warning, based on a result of the comparison. Method may include generating the first calibration parameter by calculating midpoint bias voltage for the first tape head element as a function of bias current and head resistance. The first calibration parameter for the first tape head element may be bias current parameter or bias resistance parameter. The first calibration parameter for the first tape head element may be less than, equal to, or greater than the reference parameter.

A method of forming a read head. The method includes forming first and second read sensors that are substantially trapezoidal in shape. A first read measurement is performed on a storage medium using the first read sensor. A second read measurement is performed on the storage medium using the second read sensor. Based on a comparison of the first and second read measurements to a predetermined quantity, either the first read sensor or the second read sensor is selected to be operational in a data storage device.