A memory device has multiple nonvolatile (NV) memory arrays that collectively store a block of data, with each array to store a portion of the data block. A selected NV memory array stores a write count for the block of data. In response to a write command, the NV memory arrays that store data perform an internal pre-write read. The selected NV memory array that stores the write count will perform a pre-write read of the write count, increment the write count internally to the selected NV memory array, and write the incremented write count back to the selected NV memory array.

A processing device, operatively coupled with a memory device, is configured to receive a write request identifying data to be stored in a segment of the memory device. The processing device determines a write-to-write (W2W) time interval for the segment and determines whether the W2W time interval falls within a first W2W time interval range, the first W2W time interval range corresponds to a first pre-read voltage level. Responsive to the W2W time interval for the segment falling within the first W2W interval range, the processing device performs a pre-read operation on the segment using the first pre-read voltage level. The processing device identifies a subset of the data to be stored in the segment comprising bits of data that are different than corresponding bits of the data stored in the segment. The processing device further performs a write operation to store the subset of the data in the segment.

Apparatuses and methods can be related to implementing a conditional write back scheme for memory. The data may be stored by memory cells of a memory array. The data may be moved to sense circuitry. The data can be conditionally held by the sense circuitry while a plurality of operations is performed. The results of the plurality of operations can dictate whether to commit the data to the memory cells.

The present embodiments relate to systems and methods for implementing wear leveling in a flash memory device that emulates an EEPROM. The embodiments utilize an index array, which stores an index word for each logical address in the emulated EEPROM. The embodiments comprise a system and method for receiving an erase command and a logical address, the logical address corresponding to a sector of physical words of non-volatile memory cells in an array of non-volatile memory cells, the sector comprising a first physical word, a last physical word, and one or more physical words between the first physical word and the last physical word; when a current word, identified by an index bit, is the last physical word in the sector, erasing the sector; and when the current word is not the last physical word in the sector, changing a next index bit.

Memory devices, controllers and associated methods are disclosed. In one embodiment, a memory device is disclosed. The memory device includes storage cells that are each formed with a metal-oxide-semiconductor (MOS) transistor having a floating body. Data is stored as charge in the floating body. A transfer interface receives a read command to access data stored in a first group of the storage cells. Sensing circuitry detects the data stored in the first group of storage cells. The transfer interface selectively performs a writeback operation of the sensed data associated with the read command.

Apparatuses and methods can be related to implementing a conditional write back scheme for memory. The data may be stored by memory cells of a memory array. The data may be moved to sense circuitry. The data can be conditionally held by the sense circuitry while a plurality of operations is performed. The results of the plurality of operations can dictate whether to commit the data to the memory cells.

The present invention relates to a method of operating memory cells, comprising reading a previous user data from the memory cells; writing a new user data and merging the new user data with the previous user data into write registers; generating mask register information, and wherein the mask register information indicates bits of the previous user data stored in the memory cells to be switched or not to be switched in their logic values; counting numbers of a first logic value and a second logic value to be written using the mask register information, respectively; storing the numbers of the first logic value and the second logic value into a first counter and a second counter, respectively; and applying a programming pulse to the memory cells according to the mask register information.

A processing device, operatively coupled with a memory device, performs operations including receiving a write request from a host system at a first time, the write request identifying first data to be stored in a segment of the memory device, determining whether a pre-read voltage level of the write request satisfies a pre-read voltage level criterion pertaining to a write-to-write time interval for the segment, wherein the write-to-write time interval is defined by the first time and a second time corresponding to a last time at which the segment was written, and responsive to determining that the pre-read voltage level satisfies the pre-read voltage level criterion pertaining to the write-to-write time interval, performing a pre-read operation on the segment using the pre-read voltage level to determine second data currently stored in the segment.

Methods, systems, and devices for overwriting at a memory system are described. A memory system may be configured to overwrite portions of a memory array with new data, which may be associated with omitting an erase operation. For example, write operations may be performed in accordance with a first demarcation configuration to store information at a portion of a memory array. A portion of a memory system may then determine to overwrite the portion of the memory array with different or updated information, which may include performing write operations in accordance with a second demarcation configuration. The second demarcation configuration may be associated with different cell characteristics for a one or more logic states, such as different distributions of stored charge or other cell property, different demarcation characteristics, different write operations, among other differences, which may support performing an overwrite operation without first performing an erase operation.

A memory controlling device configured to connect to a memory module including a resistance switching memory cell array which is partitioned into a plurality of partitions including a first partition and a second partition is provided. A first controlling module accesses the memory module. A second controlling module determines whether there is a conflict for the first partition to which a read request targets when an incoming request is the read request, instructs the first controlling module to read target data of the read request from the memory module when a write to the second partition is in progress, and suspends the read request when a write to the first partition is in progress.