Systems and methods for adapting garbage collection (GC) operations in a memory device to a pattern of host accessing the device are discussed. The host access pattern can be represented by how frequent the device is in idle states free of active host access. An exemplary memory device includes a memory controller to track a count of idle periods during a specified time window, and to adjust an amount of memory space to be freed by a GC operation in accordance with the count of idle periods. The memory controller can also dynamically reallocate a portion of the memory cells between a single level cell (SLC) cache and a multi-level cell (MLC) storage according to the count of idle periods during the specified time window.

Systems, methods and apparatus to determine a programming mode of a set of memory cells that store an indicator of the programming mode. In response to a command to read the memory cells in a memory device, a first read voltage is applied to the memory cells to identify a first subset of the memory cells that become conductive under the first read voltage. The determination of the first subset is configured as an operation common to different programming modes. Based on whether the first subset of the memory cell includes one or more predefined memory cells, the memory device determines a programming mode of memory cells. Once the programming mode is identified from the common operation, the memory device can further execute the command to determine a data item stored, via the programming mode, in the memory cells.

A method for discarding personal information comprises at least one among partial overwriting, SLC programming, and applying an erase pulse. The method for discarding personal information comprises a step for acquiring the program status of personal information-containing data of a memory block to be erased, generating data having a status that is equal to or higher than the program status corresponding to the personal information, and carrying out a partial overwriting operation on the personal information by using the generated data.

Apparatuses and techniques are described for modifying program and erase parameters in a memory device in which memory cells can be operated in a single bit per cell (SLC) mode or a multiple bits per cell mode. In one approach, the stress on a set of memory cells in an SLC mode is reduced during programming and erasing when the number of program-erase cycles for the block in the SLC mode is below a threshold. For example, during programming, the program-verify voltage and program voltages can be reduced to provide a shallower than normal programming. During erasing, the erase-verify voltage can be increased while the erase voltages can be reduced to provide a shallower than normal erase. When the number of program-erase cycles for the block in the SLC mode is above the threshold, the program and erase parameters revert to a default levels.

According to one embodiment, a controller manages a first set of blocks and a second set of blocks. The controller allocates a second block included in the second set of blocks to a first block included in the first set of blocks. In response to receiving one or more write command specifying the first block, the controller writes data associated with the one or more received write commands to the second block in units of a second minimum write size. When the first block is filled with data that has been written to the first block and unwritten region remains in the second block, the controller deallocates the second block from the first block, and allocates the deallocated second block to a write destination block other than the first block.

Control logic in a memory device identifies a first plurality of groups of programming distributions, wherein each group comprises a subset of programming distributions associated with a portion of a memory array of the memory device configured as quad-level (QLC) memory. During a first pass of a multi-pass programming operation, the control logic coarsely programs memory cells in the portion configured as QLC memory to initial values representing a second plurality of pages of host data and stores, in a portion of the memory array of the memory device configured as single-level cell (SLC) memory, an indicator of the first plurality of groups of programming distributions with which each of the coarsely programmed memory cells is associated. During a second pass of the multi-pass programming operation, the control logic reads the coarsely programmed initial values from the first pass based on the indicator of the first plurality of groups of programming distributions and finely programs the memory cells in the portion configured as QLC memory to final values representing the second plurality of pages of host data.

A non-volatile memory device includes a plurality of memory cells arranged in a matrix, a plurality of word lines extended in a row direction, and a plurality of bit lines extended in a column direction. Each of the memory cells is coupled to one of the word lines and one of the bit lines. The memory device further includes a word-line control circuit coupled to and configured to control the word lines, a first bit-line control circuit configured to control the bit lines and sense the memory cells in a digital mode, and a second bit-line control circuit configured to bias the bit lines and sense the memory cells in an analog mode. The first bit-line control circuit is coupled to a first end of each of the bit lines. The second bit-line control circuit is coupled to a second end of each of the bit lines.

Systems and methods for adapting garbage collection (GC) operations in a memory device to an estimated device age are discussed. An exemplary memory device includes a memory controller to track an actual device age, determine a device wear metric using a physical write count and total writes over an expected lifetime of the memory device, estimate a wear-indicated device age, and adjust an amount of memory space to be freed by a GC operation according to the wear-indicated device age relative to the actual device age. The memory controller can also dynamically reallocate a portion of the memory cells between a single level cell (SLC) cache and a multi-level cell (MLC) storage according to the wear-indicated device age relative to the actual device age.

Technology is disclosed herein for concurrently programming the same data pattern in multiple sets of non-volatile memory cells. Voltage are applied to bit lines in accordance with a data pattern. A select voltage is applied to drain select gates of multiple sets of NAND strings. The system concurrently applies a program pulse to control gates of a different set of selected memory cells in each respective set of the multiple sets of the NAND strings while the select voltage is applied to the drain select gates of the multiple sets of the NAND strings and the voltages are applied to the plurality of bit lines to concurrently program the data pattern into each set of the selected memory cells.

A data storage device includes a non-volatile memory device including a memory block including a number of memory dies, and a controller coupled to the non-volatile memory device. A read command is received from an external device and the controller determines whether a read operation associated with the read command is a sequential read operation. One or more relocation operations are performed in response to determining that the read operation is a sequential read operation. The one or more relocation operations are executed in an order based on a priority associated with each of the one or more relocation operations.