A method is performed at an electronic device that includes magnetic random access memory (MRAM). The method includes loading the MRAM with data including main data, first error correcting data, and second error correcting data. The MRAM comprises a plurality of MRAM cells characterized by a first magnetic anisotropy corresponding to a first error rate at a predefined temperature that exceeds a threshold for correcting errors using only the first error correcting data. The method further includes, after loading the MRAM with the data, heating the MRAM to the predefined temperature and correcting errors in the main data using both the first error correcting data and the second error correcting data. The method further includes after correcting the errors in the main data, erasing, from the MRAM, the second error correcting data and maintaining, on the MRAM, the first error correcting data.

A method is performed at an electronic device that includes magnetic random access memory (MRAM). The method includes loading the MRAM with data including main data, first error correcting data, and second error correcting data. The MRAM comprises a plurality of MRAM cells characterized by a first magnetic anisotropy corresponding to a first error rate at a predefined temperature that exceeds a threshold for correcting errors using only the first error correcting data. The method further includes, after loading the MRAM with the data, heating the MRAM to the predefined temperature and correcting errors in the main data using both the first error correcting data and the second error correcting data. The method further includes after correcting the errors in the main data, erasing, from the MRAM, the second error correcting data and maintaining, on the MRAM, the first error correcting data.

A sense amplifier circuit for sensing a data state of a data cell during a read cycle is described. The circuit includes a first stage with first circuitry to output a reference voltage and a data voltage relating to the data state of the data cell. The circuit further includes a second stage with circuitry to amplify a difference between the reference voltage and the data voltage. This circuitry includes a plurality of inverters and a plurality of capacitors. The read cycle includes a compensation phase. During the compensation phase the circuitry stores, at the capacitors, a voltage difference caused by a device mismatch of the inverters. After the compensation phase the circuitry amplifies the difference between the reference voltage and the data voltage, and compensates for the device mismatch using the stored voltage difference at the capacitors.

A magnetoresistive random access memory (MRAM) system is described. The system includes a sense amplifier circuit for sensing a data state of an MRAM data cell. The circuit includes a first leg and a second leg, and is configured to perform a two-phase read including a first phase in which a first transistor is coupled to a reference resistance circuitry and a second transistor is coupled to a data resistance circuitry, and a second phase in which the first transistor is coupled to the data resistance circuitry and the second transistor is coupled to the reference resistance circuitry. The circuit further includes a reference trim circuitry and a data trim circuitry configured to correct for device mismatch errors relating to the two-phase read of the sense amplifier circuit. The circuit further includes a comparator circuit configured to output the data state of the data cell.

A method is disclosed herein which includes obtaining an array of analog memory elements. It also includes programming an analog memory element included in the array, where prior to being programmed the analog memory element has a first value for an electrical property, and where it is programmed to cause the analog memory element to perform a computation included in a series of computations performed by the array. Programming the analog memory element includes applying light or heat to the analog memory element, where a value of the electrical property is changed from the first value to a second value based upon application of light or heat to the analog memory element, and further where upon the value of the electrical property being changed from the first value to the second value, the analog memory element is configured to perform the computation responsive to receipt of an input.