A semiconductor memory device and an operation method capable of suppressing malfunctions and the like and performing safe operations are provided. A flash memory of the disclosure includes a controller which controls an operation based on a code read from a ROM. The operation method of the disclosure includes detecting whether the code read from the ROM has an error by a CRC processing unit; determining whether to transition to a safe mode when the code having the error is detected; and detecting and correcting the error of the code by an ECC processing unit after transitioning to the safe mode.

An operation method for a memory device is provided. The memory device includes a two-terminal selector and a resistance variable storage element coupled to the two-terminal selector. The method includes providing a voltage pulse to the memory device. A voltage applied across the two-terminal selector during a falling part of the voltage pulse falls below a holding voltage of the two-terminal selector. A voltage falling rate of the falling part at which the voltage applied across the two-terminal selector reaches the holding voltage is raised for reducing threshold voltage drift of the two-terminal selector.

The invention relates to an apparatus and a system for debugging a solid-state disk (SSD) device. The apparatus includes a Joint Test Action Group (JTAG) add-on board; and a Raspberry Pi. The Raspberry Pi includes a General-Purpose Input/Output (GPIO) interface (I/F), coupled to the JTAG add-on board; and a processing unit, coupled to the GPIO I/F. The processing unit is arranged operably to: simulate to issue a plurality of JTAG command through the GPIO I/F to the SSD device for dumping data generated by the SSD device during operation from the SSD device.

Disclosed are devices and methods for improving the initialization of devices housing memories. In one embodiment, a method is disclosed comprising writing a test program to a first region of a memory device during production of the memory device; executing a self-test program in response to detecting a first power up of the memory device, the self-test program stored within the test program; and retrieving and installing an image from a remote data source in response to detecting a subsequent power up of the memory device, the retrieving performed by the test program.

Disclosed are devices and methods for improving the initialization of devices housing memories. In one embodiment, a method is disclosed comprising writing a test program to a first region of a memory device during production of the memory device; executing a self-test program in response to detecting a first power up of the memory device, the self-test program stored within the test program; and retrieving and installing an image from a remote data source in response to detecting a subsequent power up of the memory device, the retrieving performed by the test program.

The present disclosure relates to the field of integrated circuit technologies, and provides a method and device for testing an SR cycle as well as a method and device for testing an AR number. The method for testing an SR cycle includes: executing a preset number of data-retention-capacity acquisition steps, the data-retention-capacity acquisition step including determining a preset refresh time; sending an SR entry command to control a memory to enter an SR operation; sending an SR exit command to control the memory to exit the SR operation after the memory executes the SR for the preset refresh time; detecting a current data retention capacity of the memory; obtaining a cycle of a function of the data retention capacity with respect to the corresponding preset refresh time; and determining the SR cycle of the memory with the cycle of the function.

The present disclosure relates to the field of integrated circuit technologies, and provides a method and device for testing an SR cycle as well as a method and device for testing an AR number. The method for testing an SR cycle includes: executing a preset number of data-retention-capacity acquisition steps, the data-retention-capacity acquisition step including determining a preset refresh time; sending an SR entry command to control a memory to enter an SR operation; sending an SR exit command to control the memory to exit the SR operation after the memory executes the SR for the preset refresh time; detecting a current data retention capacity of the memory; obtaining a cycle of a function of the data retention capacity with respect to the corresponding preset refresh time; and determining the SR cycle of the memory with the cycle of the function.

A data storage system can employ a read destructive memory configured with multiple levels. A non-volatile memory unit can be programmed with a first logical state in response to a first write voltage of a first hysteresis loop by a write controller prior to being programmed to a second logical state in response to a second write voltage of the first hysteresis loop, as directed by the write controller. The first and second logical states may be present concurrently in the non-volatile memory unit and subsequently read concurrently as the first logical state and the second logical state.

A data storage system can employ a read destructive memory configured with multiple levels. A non-volatile memory unit can be programmed with a first logical state in response to a first write voltage of a first hysteresis loop by a write controller prior to being programmed to a second logical state in response to a second write voltage of the first hysteresis loop, as directed by the write controller. The first and second logical states may be present concurrently in the non-volatile memory unit and subsequently read concurrently as the first logical state and the second logical state.

A memory module includes a first memory device, a second memory device, and a processing buffer circuit that is connected to the first memory device and the second memory device (independently of each other) and a host. A processing buffer circuit is provided, which includes a processing circuit and a buffer. The processing circuit processes at least one of data received from the host, data stored in the first memory device, or data stored in the second memory device based on a processing command received from the host. The buffer is configured to store data processed by the processing circuit. The processing buffer circuit is configured to communicate with the host in compliance with a DDR SDRAM standard.