Integrated circuit devices, systems, and circuitry are provided to perform signal tests on a device under test. One such integrated circuit device may include memory having instructions to generate a number of test streams to send to a device under test and a testbench processor. The testbench processor may generate the test streams based on the instructions using thread execution circuitry that switches context based on context identifiers corresponding to respective test streams.

The present disclosure provides a semiconductor test method. The semiconductor test method includes the operations of: receiving a source code written in an interpreted language; and performing, by a first test apparatus, a first test on a device under test (DUT) based on the source code. The operation of performing, by the first test apparatus, the first test on the DUT based on the source code includes the operations of: interpreting, by a processor, the source code to generate a first interpreted code; and performing the first test on the DUT according to the first interpreted code. The first test apparatus is configured to execute the first interpreted code written in a first language.

The present disclosure provides a semiconductor testing apparatus with a connected unit, which is applied to a wafer probing testing or a final testing. The semiconductor testing apparatus comprises a semiconductor testing printed circuit board, a functional module and the connected unit. First contact points are disposed on a first surface of the semiconductor testing printed circuit board, and electrically connected to the functional module. Second contact points are disposed on a second surface of the semiconductor testing printed circuit board, and electrically connected to a functional controller. The first contact points and the second contact points have independent and non-interfering working time domains. Therefore, the present disclosure can utilize the area of the semiconductor testing printed circuit board, and can independently perform functional testing of a wafer or packaged integrated circuit devices using multiple time domains, in a multi-time domain, synchronous or asynchronous manner.

The signal generator includes the following: an oscillation generation circuit, configured to generate an initial oscillation signal based on an oscillation control signal; a duty cycle correction circuit, connected to an output end of the oscillation generation circuit and configured to adjust a duty cycle of the initial oscillation signal based on a duty cycle control signal, to generate an adjusted oscillation signal; an output interface, connected to an output end of the duty cycle correction circuit and configured to output the adjusted oscillation signal to an external test system; and an amplitude adjustment circuit, connected to the output end of the duty cycle correction circuit and configured to adjust an amplitude of the adjusted oscillation signal based on an amplitude control signal, to generate a test signal.

A testing system includes a plurality of memory circuits and a testing circuit. The testing circuit is coupled to the memory circuits. The testing circuit is configured to perform a read/write operation on the memory circuits, and each of the memory circuits has a read/write starting time point corresponding to the read/write operation. The testing circuit is further configured to control the read/write starting time points of the memory circuits to be different from each other.

The present disclosure provides a method, device and system for testing memory devices. The testing method includes: receiving a test instruction, the test instruction being used to characterize a model of a memory device to be tested that is connected to a test platform; selecting, according to the test instruction, a testing method corresponding to the model of the memory device to be tested from a plurality of pre-stored testing methods as a target testing method; and executing the target testing method to test the memory device to be tested.

A test device includes a test plate and an adapter box. The rest plate includes a test port, and a first positioning portion disposed on the test plate. The adapter box includes a box body configured to detachably mount Solid State Drives to be tested, and a second positioning portion disposed on the box body and configured to cooperate with the first positioning portion to cause the Solid State Drives to be tested to form a communication connection with the test port.

Methods, systems, and devices for shared error correction coding (ECC) circuitry are described. For example, a memory device configured with shared ECC circuitry may be configured to receive data at the shared circuitry from either a host device or a set of memory cells of the memory device. The shared circuitry may be configured to generate a set of multiple syndromes associated with a cyclic error correction code, based on the received data. As part of an encoding process, an encoder circuit may generate a set of parity bits based on the generated syndromes. As part of a decoding process, a decoder circuit may generate an error vector for decoding the received data, based on the generated syndromes. The decoder circuit may also correct one or more errors in the received data based on generating the error vector.

The present invention relates to a testing method, a testing system, and a testing apparatus for a semiconductor chip. The method includes: acquiring a target chip; obtaining an abnormal chip after a test of read and write functions is performed separately on a preset number of memory cells in an edge region of the target chip; recording location information of individual memory cells with abnormal read and write functions on the abnormal chip; judging whether an abnormality of read and write functions of the abnormal chip is a block abnormality based on the location information; wherein the abnormal chip refers to the target chip including the memory cell with abnormal read and write functions.

A memory chip may include: a plurality of memory banks; a data storage configured to store access information indicative of access operations for one or more segments of the plurality of memory banks; and a refresh controller configured to perform a refresh operation of the one or more segments based, at least in part, on the stored access information.