A shift register unit, a gate line driving device includes multiple stages of the shift register units, and a driving method for being applied to the shift register unit; the shift register unit includes: an input module connected between an input terminal and a pull-up node, and configured to charge the pull-up node; an output module connected between the pull-up node, a first clock signal terminal and an output terminal, and configured to output to the output terminal a first clock signal received at the first clock signal terminal; a pull-up node reset module connected between a reset terminal, a pull-down node and the pull-up node, and configured to reset the pull-up node; and an output reset module connected between a second clock signal terminal, the pull-down node and the output terminal, and configured to reset the output terminal.

In a non-volatile memory circuit, performance is improved by converting data between a serial format, for transfer on and off of the memory circuit, and a parallel format, for transfer to and from the memory latches used for read and writing data into the memory array of the memory circuit. The memory array is split into M+N divisions, but transferred with a degree of parallelism of M, allowing M words of data to be transferred in parallel at a fixed transfer rate while allowing for up to N bad columns in a transfer. In the write path, a column skipping mechanism is used when converting words of write data into a parallel format. In the read path, a set of (M+N) to 1 multiplexers is used to align the word of read data so that read data can be transferred at a fixed rate and without any added latency.

Disclosed herein is an apparatus suitable for detecting an image, comprising: a plurality of pixels configured to generate an electric signal upon exposure to a radiation; an electronics system associated with each of the pixels, wherein the electronics system comprises a first memory on a first signal path and a second memory on a second signal path, both signal paths being between an input terminal and an output terminal of the electronics system; wherein each of the first memory and the second memory is configured to store the electric signal generated by the pixel the electronics system is associated with, configured to store the electric signal generated in another pixel, and configured to transmit the electric signal stored in the electronics system to another pixel; wherein the electronics system comprises a switch configured to select one of the signal paths.

In a non-volatile memory circuit, performance is improved by converting data between a serial format, for transfer on and off of the memory circuit, and a parallel format, for transfer to and from the memory latches used for read and writing data into the memory array of the memory circuit. The memory array is split into M+N divisions, but transferred with a degree of parallelism of M, allowing M words of data to be transferred in parallel at a fixed transfer rate while allowing for up to N bad columns in a transfer. In the write path, a column skipping mechanism is used when converting words of write data into a parallel format. In the read path, a set of (M+N) to 1 multiplexers is used to align the word of read data so that read data can be transferred at a fixed rate and without any added latency.

Embodiments of the present invention are directed to methods, systems, and circuitry for memory arrays. A system for testing a memory array having self-test circuitry includes a register having register latches operable to receive error logic signals having respective first states or second states. The register latches are arranged in series having respective latch inputs cascaded with preceding latch outputs operable to shift the error logic signals to a serial output according to a control signal that is common to the register latches. The system includes an aggregate latch operable to receive the serial output and having input logic configured to maintain a first state of the aggregate latch until the serial output is a second state. The system includes a built-in self-test (BIST) engine including stored instructions operable upon execution by the BIST engine to output the control signal.

A method for hardware assisted data lookup in a storage unit is provided. The method includes formatting data in at least one of a plurality of data formats for storage in the storage unit. The method includes configuring a logic unit with one or more parameters associated with the plurality of data formats and identifying incoming data with the one or more parameters as an instruction for execution.

Embodiments of the present invention are directed to methods, systems, and circuitry for memory arrays. A system for testing a memory array having self-test circuitry includes a register having register latches operable to receive error logic signals having respective first states or second states. The register latches are arranged in series having respective latch inputs cascaded with preceding latch outputs operable to shift the error logic signals to a serial output according to a control signal that is common to the register latches. The system includes an aggregate latch operable to receive the serial output and having input logic configured to maintain a first state of the aggregate latch until the serial output is a second state. The system includes a built-in self-test (BIST) engine including stored instructions operable upon execution by the BIST engine to output the control signal.

A method for hardware assisted data lookup in a storage unit is provided. The method includes formatting data in at least one of a plurality of data formats for storage in the storage unit. The method includes configuring a logic unit with one or more parameters associated with the plurality of data formats and identifying incoming data with the one or more parameters as an instruction for execution.

Disclosed herein is an apparatus suitable for detecting an image, comprising: a plurality of pixels configured to generate an electric signal upon exposure to a radiation; an electronics system associated with each of the pixels, wherein the electronics system comprises a first memory on a first signal path and a second memory on a second signal path, both signal paths being between an input terminal and an output terminal of the electronics system; wherein each of the first memory and the second memory is configured to store the electric signal generated by the pixel the electronics system is associated with, configured to store the electric signal generated in another pixel, and configured to transmit the electric signal stored in the electronics system to another pixel; wherein the electronics system comprises a switch configured to select one of the signal paths.

A method for hardware assisted data lookup in a storage unit is provided. The method includes formatting data in at least one of a plurality of data formats for storage in the storage unit. The method includes configuring a logic unit with one or more parameters associated with the plurality of data formats and identifying incoming data with the one or more parameters as an instruction for execution.