Patent classifications
H
H01
H01C
8/00
H01C8/02
H01C8/02
Semiconductor device, mechanical quantity measuring device, and semiconductor device fabricating method
10247630
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2019-04-02
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A semiconductor device includes a metal body; a bonding layer placed on the metal body; and a semiconductor chip placed on the bonding layer. The bonding layer includes a filler-containing first layer formed between the metal body and the semiconductor chip and a second layer bonded to the first layer and the semiconductor chip. The second layer has a thermal expansion coefficient higher than that of the first layer.