A piezoelectric multiplexer includes an actuator and multiple piezo-morph beams. The actuator includes an actuator conducting head and an actuator stem, and each piezo-morph beam includes a conducting beam contact head and a beam stem manufactured out of piezo-morph material. A control voltage is selectively applied to electrical contacts coupled to the beam stems to create a piezoelectric effect that bends the selected piezo-morph beam and creates an electrical connection between its contact head and the conducting head of the actuator. A control circuit with a controller signals which piezo-morph beam to connect to the actuator. This multi-piezo-morph-beam piezoelectric multiplexer can be affixed to the electrical terminals of different electrical components (e.g., a transistor) to create an electrical cell that can be manufactured on a semiconductor chip or in a microelectromechanical system (MEMS) device.

A piezoelectric multiplexer includes an actuator and multiple piezo-morph beams. The actuator includes an actuator conducting head and an actuator stem, and each piezo-morph beam includes a conducting beam contact head and a beam stem manufactured out of piezo-morph material. A control voltage is selectively applied to electrical contacts coupled to the beam stems to create a piezoelectric effect that bends the selected piezo-morph beam and creates an electrical connection between its contact head and the conducting head of the actuator. A control circuit with a controller signals which piezo-morph beam to connect to the actuator. This multi-piezo-morph-beam piezoelectric multiplexer can be affixed to the electrical terminals of different electrical components (e.g., a transistor) to create an electrical cell that can be manufactured on a semiconductor chip or in a microelectromechanical system (MEMS) device.

A switching device for a test stand for electrical components has a support structure and a first contact block attached thereto. The first contact block has first connections for connecting a battery to be tested; one or more second connections for connecting a high-voltage tester; and third connections for connecting a function tester. A second contact block that is a contact bridge and is movable relative to the first contact block is included. The second contact block, in a first contact position, connects first connections to at least one second connection. The first connections are bridged in the first contact position by a bridge element of the first contact block and connected to at least one second connection via the bridge element or, in a first contact position, connects first connections to second connections, wherein the second contact block, in a second contact position, connects first connections to third connections.

A switching device for a test stand for electrical components has a support structure and a first contact block attached thereto. The first contact block has first connections for connecting a battery to be tested; one or more second connections for connecting a high-voltage tester; and third connections for connecting a function tester. A second contact block that is a contact bridge and is movable relative to the first contact block is included. The second contact block, in a first contact position, connects first connections to at least one second connection. The first connections are bridged in the first contact position by a bridge element of the first contact block and connected to at least one second connection via the bridge element or, in a first contact position, connects first connections to second connections, wherein the second contact block, in a second contact position, connects first connections to third connections.