An apparatus for generating electron radiation comprises: an elongated, wire-shaped hot cathode to emit electron radiation having an elongated, line-shaped cross section perpendicular to a direction of propagation of the electron radiation; a cathode electrode; an anode electrode with an opening through which the electron radiation emitted from the hot cathode can pass, wherein a voltage applied between the cathode electrode and the anode electrode accelerates electrons emitted from the hot cathode; and a deflecting unit to deflect the electron radiation downstream of the opening of the anode electrode, wherein a cross section of the electron radiation perpendicular to the direction of propagation is changed by the deflecting unit to decease a longitudinal extent of the electron radiation and to increase a transverse extent of the electron radiation such that longitudinal and transverse extents of the electron radiation perpendicular to the direction of propagation are about the same size.

A DC circuit breaker includes a gas discharge tube (GDT) coupled in parallel with an extinguishing path. The GDT conducts and interrupts a load current through a normal current path. The GDT includes a thermionic cathode, an anode, and a control grid. The control grid is configured to regulate opening and closing of the normal current path. The extinguishing path is configured to lengthen a break time for the DC circuit breaker.

An apparatus for generating electron radiation comprises: an elongated, wire-shaped hot cathode to emit electron radiation having an elongated, line-shaped cross section perpendicular to a direction of propagation of the electron radiation; a cathode electrode; an anode electrode with an opening through which the electron radiation emitted from the hot cathode can pass, wherein a voltage applied between the cathode electrode and the anode electrode accelerates electrons emitted from the hot cathode; and a deflecting unit to deflect the electron radiation downstream of the opening of the anode electrode, wherein a cross section of the electron radiation perpendicular to the direction of propagation is changed by the deflecting unit to decease a longitudinal extent of the electron radiation and to increase a transverse extent of the electron radiation such that longitudinal and transverse extents of the electron radiation perpendicular to the direction of propagation are about the same size.

A method includes performing by a processor: estimating a total cathode space current for a thermionic vacuum tube having at least one grid and a plate, such that at least one amplification factor associated with the at least one grid is determined by a polynomial based on a variable that represents at plurality of voltages associated with the at least one grid and the plate, the variable being heuristically determine. Transitions between positive and negative grid operation may experience a step change in estimated current value caused by the inclusion or elimination of grid current. A part of the grid current may be added back into the plate current during transition. This small contribution to plate current may gradually diminish as tube operation moves farther away from the transition boundary.

The present invention relates to an electron gun cathode mount adapted at one end to secure a thermionic cathode and at the other end to be connected to an attachment member, wherein the electron gun cathode mount is structured so as to be capable of, when in use, reducing heat transfer from the thermionic cathode to the attachment member, and the material forming the electron gun cathode mount has a thermal conductivity of less than 10 Wm.sup.?1K.sup.?1 at the operating temperature of the thermionic cathode in a direction from the thermionic cathode to the attachment member. The present invention also relates to an electron gun assembly having the electron gun cathode mount installed therein.

The embodiments provide a thermionic emission device and a method for tuning a work function in a thermionic emission device is provided. The method includes illuminating an N type semiconductor material of a first member of a thermionic emission device, wherein a work function of the N type semiconductor material is lowered by the illuminating. The method includes collecting, on one of the first member or a second member of the thermionic emission device, electrons emitted from one of the first member or the second member.

An ion generation device is provided, which includes: a heater; a counter electrode arranged on one side of the heater; at least one electric member arranged between the heater and the counter electrode, the electric member being made of a pyroelectric element or a piezoelectric element; an electrode arranged between the heater and the electric member to be in contact with the electric member; and a temperature control circuit to control a temperature of the heater. An ion detection device is provided, which includes the above-described ion generation device, an ion filter to sort ions generated at the ion generation device, and a detector to detect the ions sorted in the ion filter.

An ion generation device is provided, which includes: a heater; a counter electrode arranged on one side of the heater; at least one electric member arranged between the heater and the counter electrode, the electric member being made of a pyroelectric element or a piezoelectric element; an electrode arranged between the heater and the electric member to be in contact with the electric member; and a temperature control circuit to control a temperature of the heater. An ion detection device is provided, which includes the above-described ion generation device, an ion filter to sort ions generated at the ion generation device, and a detector to detect the ions sorted in the ion filter.

Disclosed is an electron beam generation source including: an electron discharge part extending on a desired axis and configured to discharge electrons; a support part electrically connected to a power supply device that supplies electric power to the electron discharge part; a tension holding part connected between one end of the electron discharge part and the support part and configured to hold tension of the electron discharge part with a pressing force or a tensile force; and a power supply path part having one end electrically connected to the support part and the other end electrically connected to the one end of the electron discharge part. An electric resistance value of the tension holding part is larger than an electric resistance value of the power supply path part.

Disclosed is an electron beam generation source including: an electron discharge part extending on a desired axis and configured to discharge electrons; a support part electrically connected to a power supply device that supplies electric power to the electron discharge part; a tension holding part connected between one end of the electron discharge part and the support part and configured to hold tension of the electron discharge part with a pressing force or a tensile force; and a power supply path part having one end electrically connected to the support part and the other end electrically connected to the one end of the electron discharge part. An electric resistance value of the tension holding part is larger than an electric resistance value of the power supply path part.