The embodiments relate to a CT system with a stationary part and a rotatable part, which is supported rotatably in the stationary part. At least one x-ray tube unit cooled by a cooling fluid, an x-ray detector lying opposite the x-ray tube unit, and a cooling device coupled in terms of fluid technology to the x-ray tube unit via a coolant circuit are disposed in the rotatable part. A cooling air channel, through which cooling air is able to be fed into the rotatable part, and an exhaust air channel, through which heated exhaust air is able to be taken away from the rotatable part, are disposed in the stationary part. In accordance with the embodiments, at least one overpressure relief valve is disposed in the coolant circuit, through which the cooling fluid is able to be conveyed away in the exhaust air channel.

An X-ray source (100) for generating X-ray radiation of first and second energy spectra is proposed, wherein the X-ray intensity imbalance between the first and second energy spectra is reduced as compared to conventional X-ray sources. The reduction of the X-ray intensity imbalance is achieved by configuring a smaller electron impact angle (141) onto the anode (102) when the higher tube voltage is applied as compared to when the lower tube voltage is applied.

A method for generating X-ray radiation, the method including providing a liquid target in a chamber, directing an electron beam towards the liquid target such that the electron beam interacts with the liquid target to generated X-ray radiation, estimating a number of particles produced from the interaction between the electron beam and the liquid target by measuring a number of positively charged particles in the chamber and eliminating a contribution from scattered electrons to the estimated number of particles, and controlling the electron beam, and/or a temperature in a region of the liquid target in which the electron beam interacts with the target, such that the estimated number of particles is below a predetermined limit. Also, a corresponding X-ray source.

A system for x-ray analysis includes at least one x-ray source configured to emit x-rays. The at least one x-ray source includes at least one silicon carbide sub-source on or embedded in at least one thermally conductive substrate and configured to generate the x-rays in response to electron bombardment of the at least one silicon carbide sub-source. At least some of the x-rays emitted from the at least one x-ray source includes Si x-ray emission line x-rays. The system further includes at least one x-ray optical train configured to receive the Si x-ray emission line x-rays and to irradiate a sample with at least some of the Si x-ray emission line x-rays.

An x-ray device is presented. The x-ray device includes a cathode configured to emit an electron beam. Also, the x-ray device includes an anode configured to rotate about a longitudinal axis of the x-ray device and positioned to receive the emitted electron beam, where the anode includes a target element disposed on an anode surface of the anode and a track element embedded in the target element, where the track element is configured to generate x-rays in response to the emitted electron beam impinging on a focal spot on the track element, where at least a portion of the track element is configured to transition from a first phase to a second phase based on heat generated in at least a portion of the track element, and where at least the portion of the track element is configured to distribute the generated heat across the anode.

Disclosed herein is a system for x-ray backscatter inspection. The system comprises an interior cavity. The system also comprises a non-conductive fluid contained within the interior cavity. The system additionally comprises a power source within the interior cavity and submerged in the non-conductive fluid. The system further comprises an x-ray cathode within the interior cavity, submerged in the non-conductive fluid, and coupled to the power source. The system also comprises an x-ray anode within the interior cavity, submerged in the non-conductive fluid, and positioned to receive an electron emission from the x-ray cathode to generate an x-ray emission. The system additionally comprises a thermoelectric cooler surrounding the interior cavity and operable to draw heat from the non-conductive fluid.

Provided is a method for driving an X-ray source, which includes a cathode electrode, an electron source provided on the cathode electrode and configured to emit an electron beam, and an anode target including an electron beam irradiation surface with the electron beam irradiated thereto, the method including providing the electron beam in a plurality of main pulses, wherein each of the main pulses includes a plurality of short pulses having an idle time and a pulse time, and each of the idle time and the pulse time is shorter than a duration time of the main pulse, wherein applying the plurality of short pulses comprises irradiating the electron beam from the electron source towards the electron beam irradiation surface during the pulse time; and idling the electron beam during the idle time, wherein a duty cycle of the short pulse is 0.4 to 0.6, which is obtained by dividing the idle time by a sum of the pulse time and the idle time.

A system for x-ray analysis includes at least one x-ray source configured to emit x-rays. The at least one x-ray source includes at least one silicon carbide sub-source on or embedded in at least one thermally conductive substrate and configured to generate the x-rays in response to electron bombardment of the at least one silicon carbide sub-source. At least some of the x-rays emitted from the at least one x-ray source includes Si x-ray emission line x-rays. The system further includes at least one x-ray optical train configured to receive the Si x-ray emission line x-rays and to irradiate a sample with at least some of the Si x-ray emission line x-rays.

Disclosed herein is a system for x-ray backscatter inspection. The system comprises an interior cavity. The system also comprises a non-conductive fluid contained within the interior cavity. The system additionally comprises a power source within the interior cavity and submerged in the non-conductive fluid. The system further comprises an x-ray cathode within the interior cavity, submerged in the non-conductive fluid, and coupled to the power source. The system also comprises an x-ray anode within the interior cavity, submerged in the non-conductive fluid, and positioned to receive an electron emission from the x-ray cathode to generate an x-ray emission. The system additionally comprises a thermoelectric cooler surrounding the interior cavity and operable to draw heat from the non-conductive fluid.

A method for generating X-ray radiation, the method including providing a liquid target in a chamber, directing an electron beam towards the liquid target such that the electron beam interacts with the liquid target to generated X-ray radiation, estimating a number of particles produced from the interaction between the electron beam and the liquid target by measuring a number of positively charged particles in the chamber and eliminating a contribution from scattered electrons to the estimated number of particles, and controlling the electron beam, and/or a temperature in a region of the liquid target in which the electron beam interacts with the target, such that the estimated number of particles is below a predetermined limit. Also, a corresponding X-ray source.