A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.

In a mass spectrometry apparatus, an electric field is applied to an injected specimen to ionize the specimen, and mass spectrometry of the specimen is performed. In an emitter which ionizes the specimen, a flashing process to increase a temperature of the emitter is repeatedly performed at a short-time interval during an injection period of the specimen. A flashing current controller controls a flashing current value to be applied to the emitter to increase, in a long term, a flashing temperature which the emitter reaches in the flashing process.

A mass spectrometer comprising: a vacuum chamber; and an ion inlet assembly for transmitting analyte ions into the vacuum chamber; wherein the spectrometer is configured to operate in a cooling mode in which it selectively controls one or more gas flow to the ion inlet assembly for actively cooling the ion inlet assembly.

A flight tube 246 is hollow, and ions emitted from an ion emission unit are introduced into the flight tube 246. A reflectron 244 is provided in the flight tube 246, and is configured by coaxially arranging a plurality of annular electrodes 244A and 244B. A vacuum vessel 247A that becomes in a vacuum state during analysis is formed in the vacuum chamber 247, and the flight tube 246 is provided in the vacuum vessel 247A. A temperature control mechanism 248 controls a temperature of the flight tube 246. An ambient temperature sensor 250 detects an ambient temperature outside the vacuum chamber 247. A target temperature of the temperature control mechanism 248 is set on the basis of the ambient temperature detected by the ambient temperature sensor 250.

The invention relates to an ionization chamber for connection to a mass spectrometer. The ionization chamber has a temperature-control block with a gas inlet and a gas channel which starts at the gas inlet and leads into a gas outlet. A temperature-control device is positioned along the gas channel and ensures that a gas flowing in the gas channel is brought to a specific temperature, i.e. it is heated or cooled, before it enters the ionization chamber. The temperature-control block has a formed part into which a structure of the gas channel is incorporated and which is fabricated by means of a sol-gel process, for example out of a glass or ceramic material.

An ion analyzer includes a reaction chamber into which precursor ions derived from a sample component are introduced, a radical irradiation unit that generates and emits a predetermined type of radicals, a standard substance supply unit that individually supplies kinds of standard substances to the reaction chamber, where activation energy of radical addition reaction is known for each of the kinds of standard substances, and the activation energies are different in magnitude, an ion measurement unit that measures an amount of predetermined product ions generated from precursor ions derived from the standard substance by irradiation with the radicals, and a radical temperature calculation unit that obtains an amount of radicals that caused the radical addition reaction from the amount of the predetermined product ions and obtains a radical temperature based on a relationship between the amount of the radicals obtained for each kind of standard substance and activation energy.

Imaging by cryo-electron microscopy (cryo-EM) requires that a sample be encased in an amorphous solid, such as amorphous ice. In current cryo-EM preparation systems, once the sample has been deposited on an EM grid and coated in the amorphous solid, the EM grid must be removed from vacuum and then transferred into the vacuum of the cryo-EM system. As a result, samples deposited on the grid are exposed to damage and contamination. The present invention provides improved EM grid handling systems and devices compatible with advanced cryo-EM sample preparation techniques and which reduce or eliminate exposure of the sample on the grid to atmosphere and elevated temperatures. These methods and devices will also significantly reduce handling time and complexities associated with cryo-EM sample preparation.

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.

A time-of-flight mass spectrometry device includes: an ion introduction unit; a vacuum chamber connected to the ion introduction unit; a support member provided inside the vacuum chamber; a flight tube having a part of the outer surface supported by the support member and provided inside the vacuum chamber; a temperature sensor provided in the vicinity of a connection portion with the support member of the vacuum chamber; a temperature adjustment element provided in the vicinity of the connection portion; and a temperature control unit that controls the temperature adjustment element based on a measurement result of the temperature sensor.