Systems and methods disclosed provide a laser-assisted micro-mass spectrometer, which can include a pulsed inlet, a multi-wavelength laser system, and a first mass spectrometer module including a plurality of first ionization sources. In an embodiment, the pulsed inlet can be configured to receive a neutral sample of analyte material and provide it to said first mass spectrometer module.

A mass spectrometer provided with an ionization chamber (10) in which ionization is performed on a sample by laser ionization, includes an opening part (12) that is provided on a side wall of the ionization chamber (10), and includes a door (13); a ventilation port (14) provided in a wall of the ionization chamber (10), which is opposite to the opening port (12); and a gas supplier (64), (67) for supplying high-pressure cleaning gas to the ionization chamber (10) through the ventilation port (14). In this configuration, the high-pressure cleaning gas flows into the ionization chamber (10) from the gas supplier (64), (67) while the door (13) is opened, thereby blowing up particles including fragments of bacterial cells, which are piled up on a floor of the ionization chamber (10), and/or sweeping particles floating near the floor, so as to discharge the particles to the outside.

Systems and methods for loading microfabricated ion traps are disclosed. Photo-ablation via an ablation pulse is used to generate a flow of atoms from a source material, where the flow is predominantly populated with neutral atoms. As the neutral atoms flow toward the ion trap, two-photon photo-ionization is used to selectively ionize a specific isotope contained in the atom flow. The velocity of the liberated atoms, atom-generation rate, and/or heat load of the source material is controlled by controlling the fluence of the ablation pulse to provide high ion-trapping probability while simultaneously mitigating generation of heat in the ion-trapping system that can preclude cryogenic operation. In some embodiments, the source material is held within an ablation oven comprising an electrically conductive housing that is configured to restrict the flow of agglomerated neutral atoms generated during photo-ablation toward the ion trap.

The present invention provides an imaging mass spectrometer which generates ions by irradiating a sample with a laser beam and performs mass spectrometry of the ions, the imaging mass spectrometer including: a laser irradiation unit 30 configured to emit the laser beam toward the sample, a condensing optical system 33 disposed between the laser irradiation unit 30 and the sample and configured to condense the laser beam emitted from the laser irradiation unit 30, an image acquiring unit 40 configured to acquire a condensing state checking image which is an optical microscopic image capable of checking a condensing state on the sample of the laser beam emitted from the laser irradiation unit 30, and a display unit 64 configured to display the condensing state checking image acquired by the image acquiring unit 40 on a display screen.

An ionizer includes a probe having multiple coaxially aligned conduits. The conduits may carry liquids, and nebulizing and heating gases at various flow rates and temperatures, for generation of ions from a liquid source. An outermost conduit defines an entrainment region that transports and entrains ions in a gas for a defined distance along the length of the conduits. In embodiments, various voltages may be applied to the multiple conduits to aid in ionization and to guide ions. Depending on the voltages applied to the multiple conduits and electrodes, the ionizer can act as an electrospray, APCI, or APPI source. Further, the ionizer may include a source of photons or a source of corona ionization. Formed ions may be provided to a downstream mass analyser.

A sample support used for ionizing a component of a sample includes: a substrate having a first surface, a second surface opposite the first surface, and a plurality of through-holes that are open on the first surface and on the second surface; a conductive layer provided on at least the first surface; and an anionizing agent provided in the plurality of through-holes to anionize the component.

An analysis apparatus includes a stage on which an analysis sample as an analysis target and a first adjustment sample used for adjusting a focus are provided. A laser generation unit generates a laser beam for vaporizing the analysis sample or the first adjustment sample by irradiating the sample with the laser beam. A detection unit detects a signal intensity of an element of the analysis sample or the first adjustment sample vaporized by irradiation with the laser beam. A controller determines a focus position of the laser beam with respect to a front surface position of the first adjustment sample based on the signal intensity of the first adjustment sample, and performs a control such that the focus position of the laser beam corresponds with a front surface of the analysis sample.

A system for the mass spectrometry analysis of an analyte includes a droplet ejection device, a spray head comprising a spray tip for ejecting the solvent as a spray, and a solvent delivery conduit for delivering solvent to the spray tip. The spray head includes a droplet inlet opening communicating with the surrounding atmosphere for receiving liquid droplets comprising the analyte. The droplet ejection device selectively ejects a liquid analyte droplet comprising the analyte through a surrounding atmosphere and the droplet inlet opening into a solvent flowing through the solvent delivery conduit. A method for the mass spectrometry analysis of an analyte is also disclosed.

A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.

An ion trap system and an ion trapping method are provided. The ion trap system may include: an ion source, configured to: generate an ion, and shoot the ion to an ion trap; the electromagnetic field device, configured to change a moving direction of the ion, to transfer the ion to an ion trap; and the ion trap, configured to trap the ion transferred by the electromagnetic field device. The electromagnetic field device changes the moving direction of the ion, to transfer the ion to the ion trap.