A method and system for measuring an inert gas by an ion probe. Embedding a to-be-measured sample into an epoxy resin, to obtain a sample target, where the to-be-measured sample includes an inert gas atom; after putting the obtained sample target into an analysis chamber of the ion probe, vacuumizing the analysis chamber, where the ion probe includes a primary ion source, an electron gun, a mass analyzer, and an ion detector; bombarding the sample target by using a primary ion beam formed by the primary ion source to release the inert gas atom in the sample target; ionizing the released inert gas atom by using an electron beam formed by the electron gun to form an inert gas ion; and analyzing a secondary ion containing the inert gas ion by using the mass analyzer and the ion detector to achieve measurement of the inert gas.

Disclosed herein are embodiments of a system for selectively ionizing samples that may comprise a plurality of different analytes that are not normally detectable using the same ionization technique. The disclosed system comprises a unique split flow tube that can be coupled with a plurality of ionization sources to facilitate using different ionization techniques for the same sample. Also disclosed herein are embodiments of a method for determining the presence of analytes in a sample, wherein the number and type of detectable analytes that can be identified is increased and sensitivity and selectivity are not sacrificed.

There is disclosed a method for eliminating an added crosstalk signal from a measured data signal, which is generated by an image current. There is further disclosed a signal processing unit for carrying out the method. There is still further disclosed a mass spectrometer and a mass analyser comprising the signal processing unit for carrying out the method. There is yet still further disclosed a Fourier transform mass spectrometer configured to eliminate the added crosstalk signal from a measured data signal.

A method and system for measuring an inert gas by an ion probe. Embedding a to-be-measured sample into an epoxy resin, to obtain a sample target, where the to-be-measured sample includes an inert gas atom; after putting the obtained sample target into an analysis chamber of the ion probe, vacuumizing the analysis chamber, where the ion probe includes a primary ion source, an electron gun, a mass analyzer, and an ion detector; bombarding the sample target by using a primary ion beam formed by the primary ion source to release the inert gas atom in the sample target; ionizing the released inert gas atom by using an electron beam formed by the electron gun to form an inert gas ion; and analyzing a secondary ion containing the inert gas ion by using the mass analyzer and the ion detector to achieve measurement of the inert gas.

There is disclosed a method for eliminating an added crosstalk signal from a measured data signal, which is generated by an image current. There is further disclosed a signal processing unit for carrying out the method. There is still further disclosed a mass spectrometer and a mass analyser comprising the signal processing unit for carrying out the method. There is yet still further disclosed a Fourier transform mass spectrometer configured to eliminate the added crosstalk signal from a measured data signal.

An electrostatic trap such as an orbitrap is disclosed, with an electrode structure. An electrostatic trapping field of the form U(r, , z) is generated to trap ions within the trap so that they undergo isochronous oscillations. The trapping field U(r, , z) is the result of a perturbation W to an ideal field U(r, , z) which, for example, is hyperlogarithmic in the case of an orbitrap. The perturbation W may be introduced in various ways, such as by distorting the geometry of the trap so that it no longer follows an equipotential of the ideal field U(r, , z), or by adding a distortion field (either electric or magnetic). The magnitude of the perturbation is such that at least some of the trapped ions have an absolute phase spread of more than zero but less than 2 radians over an ion detection period T.sub.m.

Disclosed herein are embodiments of a system for selectively ionizing samples that may comprise a plurality of different analytes that are not normally detectable using the same ionization technique. The disclosed system comprises a unique split flow tube that can be coupled with a plurality of ionization sources to facilitate using different ionization techniques for the same sample. Also disclosed herein are embodiments of a method for determining the presence of analytes in a sample, wherein the number and type of detectable analytes that can be identified is increased and sensitivity and selectivity are not sacrificed.

Elongation of orthogonal accelerators is assisted by ion spatial transverse confinement within novel confinement means, formed by spatial alternation of electrostatic quadrupolar field (22). Contrary to prior art RF confinement means, the static means provide mass independent confinement and may be readily switched. Spatial confinement defines ion beam (29) position, prevents surfaces charging, assists forming wedge and bend fields, and allows axial fields in the region of pulsed ion extraction, this way improving the ion beam admission at higher energies and the spatial focusing of ion packets in multi- reflecting, multi-turn and singly reflecting TOF MS or electrostatic traps.

A method of isotope ratio mass spectrometry comprising: flowing a liquid mobile phase through a separation device; reducing the flow rate of the mobile phase through the separation device for at least a portion of time that at least one molecular species is emerging from the separation device to achieve a desired isotope ratio precision, wherein the flow rate is reduced from a first rate to a second rate corresponding to a higher theoretical plate height of the separation device; and mass analyzing the molecular species that has emerged from the separation device at least while the flow rate is reduced; and determining at least one isotope ratio from the intensities of mass peaks of at least two isotopologues, wherein the mass analysis is performed with mass resolving power high enough to resolve the two most abundant mass peaks at the nominal mass of at least one of the isotopologues.

An apparatus 41 and operation method are provided for an electrostatic trap mass spectrometer with measuring frequency of multiple isochronous ionic oscillations. For improving throughput and space charge capacity, the trap is substantially extended in one Z-direction forming a reproduced two-dimensional field. Multiple geometries are provided for trap Z-extension. The throughput of the analysis is improved by multiplexing electrostatic traps. The frequency analysis is accelerated by the shortening of ion packets and either by Wavelet-fit analysis of the image current signal or by using a time-of-flight detector for sampling a small portion of ions per oscillation. Multiple pulsed converters are suggested for optimal ion injection into electrostatic traps.