H01J49/401

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER

An orthogonal acceleration time-of-flight mass spectrometer (1) includes: an ion ejector (123) which ejects measurement-target ions in a predetermined direction; an orthogonal accelerator (132) which accelerates ions in a direction orthogonal to the direction in which the ions are ejected; a ring electrode (131) located between the ion ejector and the orthogonal accelerator, the ring electrode having an opening for allowing ions to pass through and arranged so that the central axis (C2) of the opening is shifted from the central axis (C1) of the ion ejector in a direction along the axis of the acceleration of the ions by the orthogonal accelerator; a reflectron electrode (134) which creates a repelling electric field for reversing the direction of the ions accelerated by the orthogonal accelerator; and an ion detector (135) which detects ions after the direction of flight of the ions is reversed by the reflectron electrode.

Mass spectrometer

A mass spectrometer is disclosed comprising an ion optics device housing having one or more external electrical connectors (1719) provided thereon. An ion optics device (301) is arranged inside the ion optics device housing, the ion optics device (301) comprising one or more electrodes for manipulating ions, the one or more electrodes being electrically connected to the one or more external electrical connectors (1719) provided on the ion optics device housing. A voltage supply housing (1717) is provided having one or more external electrical connectors provided thereon. One or more voltage supplies are arranged inside the voltage supply housing (1717), the one or more voltage supplies being in electrical communication with the one or more external electrical connectors provided on the voltage supply housing. The one or more external electrical connectors provided on the voltage supply housing are directly physically and electrically connected to the one or more external electrical connectors (1719) provided on the ion optics device housing.

Multi-pass mass spectrometer with high duty cycle
11587779 · 2023-02-21 · ·

A multi-pass time-of-flight mass spectrometer is disclosed having an elongated orthogonal accelerator (30). The orthogonal accelerator (30) has electrodes (31) that are transparent to the ions so that ions that are reflected or turned back towards it are able to pass through the orthogonal accelerator (30). The electrodes (31) of the orthogonal accelerator (30) may be pulsed from ground potential in order to avoid the reflected or turned ion packets being defocused. The spectrometer has a high duty cycle and/or space charge capacity of pulsed conversion.

Resonance ionization filter for secondary ion and accelerator mass spectrometry

A method of removing nuclear isobars from a mass spectrometric technique comprising directing ions, decelerating the ions, neutralizing a first portion of the ions, creating residual ions and a second portion of the ions, reionizing a selective portion of the ions, re-accelerating the selective reionized portion of ions, and directing the reionized portion of ions to a detector. An apparatus to remove nuclear isobars comprising a deceleration lens, an equipotential surface, an electron source to neutralize a portion of the ion beam, a deflector pair, a tunable resonance ionization laser for selective resonant reionization, and an acceleration lens.

Ionizer and mass spectrometer
11495447 · 2022-11-08 · ·

An ionizer 1 including an ionization chamber 10, a sample gas introduction port 14 provided in the ionization chamber 10 for introducing sample gas, an electron beam emitting section 11 which emits an electron beam toward the ionization chamber 10, electron beam passage openings 10a and 10b which are formed on a path of the electron beam emitted from the electron beam emitting section 11 on a wall of the ionization chamber 10 and has a length in a direction of the path longer than a width of a cross section orthogonal to the direction, and an ion outlet 10c provided in the ionization chamber 10 for emitting an ion of the sample gas generated by irradiation with the electron beam, and a mass spectrometer 60 including the ionizer 1.

Dynamic ion filter for reducing highly abundant ions
11488818 · 2022-11-01 · ·

The present disclosure relates to a device for filtering at least one selected ion from an ion beam includes a unit for creating an electric field for accelerating the ions of the ion beam along a flight path of predefinable length, and a controllable ion optical system, which delimits the flight path in one direction, and which is used to deflect the selected ion from a flight path of the ion beam. The device is further designed to control the ion optical system subject to a flight time of the selected ion along the flight path. The present disclosure also relates to a mass spectrometer having a device according to the present disclosure, and to a method for filtering at least one selected ion from an ion beam.

Compact Time-of-Flight Mass Analyzer
20220344143 · 2022-10-27 ·

A set of acceleration electrodes for the acceleration of charged particles in a vacuum ion optical system, wherein each acceleration electrode comprises a conical section and at least an elongated leg protruding from the conical section, the elongated leg and any further elongated leg each being configured as a mechanical support and as an electrical connection between the conical section and an intended source of electric potential.

Methods and apparatus for high speed mass spectrometry

A mass spectrometer system comprises: (a) an ion source; (b) a mass filter or a time-of-flight (TOF) ion separator configured to receive a stream of first-generation ions from the ion source; (c) an ion storage device having an ion inlet configured to receive a stream of filtered ions comprising a plurality of ion species from the mass filter or TOF separator and to accumulate the plurality of ion species therein; (d) an ion mobility cell having an ion inlet configured to receive an accumulated batch of ion species from the ion storage device and an ion outlet configured to release, one at a time, the individual ion species therefrom; and (e) a mass analyzer configured to receive and mass analyze each first-generation ion species or each fragment ion species generated by fragmentation or other reaction of the various first-generation ion species.

Atmospheric pressure ion focusing device employing nonlinear DC voltage sequences

Apparatus comprise an electrode arrangement comprising a plurality of electrodes defining a volume, an ion entrance, and an ion exit, and a voltage source coupled to the plurality of electrodes and configured to apply a nonlinear DC voltage sequence to the electrodes between the ion entrance and the ion exit that directs ions through the volume with the volume at a pressure of at least 1 Torr. Ions can be focused using nonlinear DC voltage sequences, including at atmospheric pressure. Related methods are also disclosed.

Ion detection system

An ion detection system is disclosed that comprises one or more first devices 11 configured to produce secondary electrons in response to incident ions. The one or more first devices 11 comprise a first ion collection region and a second ion collection region and are configured to produce first secondary electrons in response to one or more ions incident at the first ion collection region and to produce second secondary electrons in response to one or more ions incident at the second ion collection region. The ion detection system also comprises a first output device 14 configured to output a first signal in response to first secondary electrons produced by the one or more first devices 11 and a second output device 15 configured to output a second signal in response to second secondary electrons produced by the one or more first devices 11.