Patent classifications
H01L2224/2742
Semiconductor die package with warpage management and process for forming such
A device is disclosed. The device includes a first die, a plurality of chiplets above the first die, a first underfill material beneath the chiplets, and a gap fill material between the chiplets. The gap fill material is different from the first underfill material. An interface region is formed between the first underfill material and the gap fill material.
Semiconductor die package with warpage management and process for forming such
A device is disclosed. The device includes a first die, a plurality of chiplets above the first die, a first underfill material beneath the chiplets, and a gap fill material between the chiplets. The gap fill material is different from the first underfill material. An interface region is formed between the first underfill material and the gap fill material.
SEMICONDUCTOR DIE PACKAGE WITH WARPAGE MANAGEMENT AND PROCESS FOR FORMING SUCH
A device is disclosed. The device includes a first die, a plurality of chiplets above the first die, a first underfill material beneath the chiplets, and a gap fill material between the chiplets. The gap fill material is different from the first underfill material. An interface region is formed between the first underfill material and the gap fill material
SEMICONDUCTOR DIE PACKAGE WITH WARPAGE MANAGEMENT AND PROCESS FOR FORMING SUCH
A device is disclosed. The device includes a first die, a plurality of chiplets above the first die, a first underfill material beneath the chiplets, and a gap fill material between the chiplets. The gap fill material is different from the first underfill material. An interface region is formed between the first underfill material and the gap fill material
ENCAPSULANT MATERIAL CONTAINING FLUOROPHORES FOR IN-SITU VISUALIZATION OF STRESS IN AN ORGANIC PACKAGE
Embodiments include an encapsulation material, one or more semiconductor packages, and methods of the semiconductor packages. A semiconductor package including dies disposed on a package substrate. The semiconductor package also includes at least one of an underfill layer, a mold layer, and a dielectric layer on or in the package substrate. The semiconductor package further includes an encapsulation material having a fluorescent chemical compound and an epoxy. The encapsulation material may be incorporated into at least one of the underfill layer, the mold layer, and/or the dielectric layer on or in the package substrate. The fluorescent chemical compound of the encapsulation material may include at least one of a poly(vinylcarbazole) (PVCz), a 1,4-Bis(5-phenyl-2-oxazolyl) benzene (POPOP), and/or a plurality of conjugated, aromatic molecules and polymers. The encapsulation material may include at least one of a hardener, a filler, an additive, and/or a polymer.
ENCAPSULANT MATERIAL CONTAINING FLUOROPHORES FOR IN-SITU VISUALIZATION OF STRESS IN AN ORGANIC PACKAGE
Embodiments include an encapsulation material, one or more semiconductor packages, and methods of the semiconductor packages. A semiconductor package including dies disposed on a package substrate. The semiconductor package also includes at least one of an underfill layer, a mold layer, and a dielectric layer on or in the package substrate. The semiconductor package further includes an encapsulation material having a fluorescent chemical compound and an epoxy. The encapsulation material may be incorporated into at least one of the underfill layer, the mold layer, and/or the dielectric layer on or in the package substrate. The fluorescent chemical compound of the encapsulation material may include at least one of a poly(vinylcarbazole) (PVCz), a 1,4-Bis(5-phenyl-2-oxazolyl) benzene (POPOP), and/or a plurality of conjugated, aromatic molecules and polymers. The encapsulation material may include at least one of a hardener, a filler, an additive, and/or a polymer.