An electric component comprising a terminal electrode and a hot-melt polymer layer formed on the terminal electrode, wherein the hot-melt polymer layer comprises (i) 100 parts by weight of a metal powder and (ii) 1 to 30 parts by weight of a polymer, wherein melt mass-flow rate (MFR) of the polymer is 0.5 to 20 g/10 min. at 120 to 200° C. and 0.3 to 8 kgf.

Provided are a display structure and a preparation method thereof, and a display apparatus. The display structure includes a flexible back plate and a display substrate which are stacked, the flexible back plate including a bonding electrode for bonding to an integrated circuit chip, and the flexible back plate being bent to form a bent portion on which the bonding electrode is located.

Provided are a display structure and a preparation method thereof, and a display apparatus. The display structure includes a flexible back plate and a display substrate which are stacked, the flexible back plate including a bonding electrode for bonding to an integrated circuit chip, and the flexible back plate being bent to form a bent portion on which the bonding electrode is located.

A semiconductor device includes: an insulated circuit board including metal layers having recesses, and an insulating board having an upper surface on which the metal layers are arranged; external terminals having bottom ends with a width narrower than the width of openings of the recesses, these bottom ends being inserted into the recesses; a printed circuit board that directly supports the external terminals; and first bonding material that is arranged inside the recesses and respectively conductively connects the bottom ends of the external terminals to the metal layers.

An integrated circuit packaging method, including: a top surface of a substrate, a bottom surface of the substrate, or the interior of the substrate is provided with circuit layers, and the circuit layers are provided with circuit pins; a component element is mounted on the substrate, and a surface of the component element facing the substrate is provided with component pins; connection through holes are formed on the substrate, the connection through holes are made to abut on the circuit pins, and a first opening of the connection through holes is abutted on the component pins; conductive layers are fabricated inside of the connection through holes by means of a second opening of the connection through holes, and the conductive layers electrically connect the component pins with the circuit pins.

A chip connection method and structure are provided. The method includes: providing a first connection line and a second connection line on a substrate, wherein, in the thickness direction of the substrate, a distance between the first connection line and the chip is smaller than a distance between the second connection line and the chip; providing the chip on a top surface of the substrate, the chip being provided with at least two chip pins; and providing the substrate with a second through hole corresponding to the second connecting line and provided therein with a second conductive layer, at least one chip pin being electrically connected to the first connection line, and at least one of the remaining chip pin being corresponding to a first opening of the second through, and the second conductive layer electrically connecting the chip pin and the second connection line.

An integrated circuit packaging method, including: a top surface of a substrate, a bottom surface of the substrate, or the interior of the substrate is provided with circuit layers, and the circuit layers are provided with circuit pins; a component element is mounted on the substrate, and a surface of the component element facing the substrate is provided with component pins; connection through holes are formed on the substrate, the connection through holes are made to abut on the circuit pins, and a first opening of the connection through holes is abutted on the component pins; conductive layers are fabricated inside of the connection through holes by means of a second opening of the connection through holes, and the conductive layers electrically connect the component pins with the circuit pins.

A chip connection method and structure are provided. The method includes: providing a first connection line and a second connection line on a substrate, wherein, in the thickness direction of the substrate, a distance between the first connection line and the chip is smaller than a distance between the second connection line and the chip providing the chip on a top surface of the substrate, the chip being provided with at least two chip pins; and providing the substrate with a second through hole corresponding to the second connecting line, and provided therein with a second conductive layer, at least one chip pin being electrically connected to the first connection line, and at least one of the remaining chip pin being corresponding to a first opening of the second through hole, and the second conductive layer electrically connecting the chip pin and the second connection line.

A semiconductor device includes: an insulated circuit board including metal layers having recesses, and an insulating board having an upper surface on which the metal layers are arranged; external terminals having bottom ends with a width narrower than the width of openings of the recesses, these bottom ends being inserted into the recesses; a printed circuit board that directly supports the external terminals; and first bonding material that is arranged inside the recesses and respectively conductively connects the bottom ends of the external terminals to the metal layers.

An anisotropic conductive film or other filler-containing film 10A of the present invention includes a filler dispersed-layer 3 including a resin layer 2, a first filler layer with a filler 1A dispersed in a single layer in the resin layer 2, and a second filler layer with a filler 1B dispersed in a single layer in the resin layer 2 at a depth different from the depth of the first filler layer. The filler 1A of the first filler layer is exposed from one surface 2a of the resin layer 2, or is in close proximity to the surface 2a, and the filler 1B of the second filler layer is exposed from the other surface 2b of the resin layer 2, or is in close proximity to the surface 2b.