A manufacturing method for a wire bonding structure of the present invention includes a step of preparing a wire made of Cu and a step of joining the wire to a first joining target formed on an electronic device. Before the joining step, the wire has an outer circumferential surface and a withdrawn surface. The withdrawn surface is withdrawn toward a central axis of the wire from the outer circumferential surface. In the joining step, ultrasonic vibration is applied to the wire in a state in which the withdrawn surface is pressed against the first joining target.

A method forming a bond wire connection includes providing a wire bonder including a bond wedge with a wire guide, and forming a wire bond loop by initially bonding a bond wire to a first bonding surface using the bond wedge, then moving the wire bonder in a loop pattern whereby the bond wire passes through the wire guide, and then bonding the bond wire to a second bonding surface using the bond wedge, wherein moving the wire bonder in the loop pattern comprises a retrograde movement whereby the wire bonder moves away from the second bonding surface, and wherein the wire guide is formed from a material with a higher material hardness than the bond wire.

A method of cleaning a tip of a wire bonding tool on a wire bonding machine is provided. The method includes the steps of: (a) moving a wire away from the wire bonding tool such that the tip of the wire bonding tool is accessible to a cleaning station of the wire bonding machine; and (b) cleaning at least a portion of the tip of the wire bonding tool with the cleaning station after step (a).