A power semiconductor module includes: a substrate with a metallization layer attached to a dielectric insulation layer and a semiconductor body mounted to the metallization layer; a housing at least partly enclosing the substrate and having sidewalls and a cover that at least partly covers an opening formed by the sidewalls and has a flexible portion; and a press-on pin having arranged on the substrate or semiconductor body. A first end of the press-on pin faces the substrate or semiconductor body and extends towards the cover such that a second end of the press-on pin contacts the flexible portion of the cover. The substrate in an area vertically below the press-on pin has a first spring constant k.sub.1 in a vertical direction that is perpendicular to a top surface of the substrate. The flexible portion of the cover has a second spring constant k.sub.2, where 0.5*k.sub.1≤k.sub.2≤5*k.sub.1.

Structures, methods and devices are disclosed, related to improved stack structures in electronic devices. In some embodiments, a stack structure includes a pad implemented on a substrate, the pad including a polymer layer having a side that forms an interface with another layer of the pad, the pad further including an upper metal layer over the interface, the upper metal layer having an upper surface. In some embodiments, the stack structure also includes a passivation layer implemented over the upper metal layer, the passivation layer including a pattern configured to provide a compressive force on the upper metal layer to thereby reduce the likelihood of delamination at the interface, the pattern defining a plurality of openings to expose the upper surface of the upper metal layer.

An air cavity package with one or more dovetail recesses configured with a first recess and a coincident second recess. The first recess has a first depth and the second recess has a second depth. The first recess has a lower width and an upper width smaller than the first lower width creating a dovetail shape. Individual dovetail recesses are created by creating a first recess in the flange at a first width and depth. A second recess with a second width and second depth and coincident with the first recess is pressed into the flange. The second width is greater than the first width and the second depth is smaller than the first depth. Pressing the second recess causes the first width at an upper portion to decrease, causing the first recess to develop a dovetail shape.

A device (2) is formed on a main surface of a substrate (1). The main surface of the substrate (1) is bonded to the undersurface of the counter substrate (14) via the bonding member (11,12,13) in a hollow state. A circuit (17) and a bump structure (26) are formed on the top surface of the counter substrate (14). The bump structure (26) is positioned in a region corresponding to at least the bonding member (11,12,13), and has a higher height than that of the circuit (17).

Embodiments of the present disclosure describe a die with integrated microphone device using through-silicon vias (TSVs) and associated techniques and configurations. In one embodiment, an apparatus includes an apparatus comprising a semiconductor substrate having a first side and a second side disposed opposite to the first side, an interconnect layer formed on the first side of the semiconductor substrate, a through-silicon via (TSV) formed through the semiconductor substrate and configured to route electrical signals between the first side of the semiconductor substrate and the second side of the semiconductor substrate, and a microphone device formed on the second side of the semiconductor substrate and electrically coupled with the TSV. Other embodiments may be described and/or claimed.

The present invention relates to a gas sensor package including an insulating substrate, a metal layer on one surface of the insulating substrate, a stepped portion disposed on the metal layer and configured to divide the metal layer into a plurality of portions, and a gas sensor chip mounted on the metal layer located on the stepped portion and including a sensing part, wherein a width of the stepped portion is provided to be equal to or less than an interval between two adjacent electrode terminals of a plurality of electrode terminals of the gas sensor chip.

Proximity coupling interconnect packaging systems and methods. A semiconductor package assembly comprises a substrate, a first semiconductor die disposed adjacent the substrate, and a second semiconductor die stacked over the first semiconductor die. There is at least one proximity coupling interconnect between the first semiconductor die and the second semiconductor die, the proximity coupling interconnect comprising a first conductive pad on the first coupling face on the first semiconductor die and a second conductive pad on a second coupling face of the second semiconductor die, the second conductive pad spaced apart from the first conductive pad by a gap distance and aligned with the first conductive pad. An electrical connector is positioned laterally apart from the proximity coupling interconnect and extends between the second semiconductor die and the substrate, the position of the electrical connector defining the alignment of the first conductive pad and the second conductive pad.

A semiconductor package is disclosed for efficiently facilitating heat dissipation. The semiconductor package includes a substrate layer, a chip, a housing lid and thermal-conductive liquid. A chip is disposed on the substrate layer and electrically coupled to the substrate layer. The chip includes at least one through silicon via (TSV). The housing lid is disposed above both the substrate layer and the chip. Also, the housing lid is coupled to the substrate layer at its edge for forming an internal space that encompasses the chip. The thermal-conductive liquid is filled within the internal space.

A device (2) is formed on a main surface of a semiconductor substrate (1). A passivation film (5) covers the main surface. A metallized pattern (6) is formed on the passivation film (5) and surrounds the device (2). A sealing metal layer (7) is formed on the metallized pattern (6) and includes a corner portion (10) in a planar view. A lid (8) is bonded to the metallized pattern (6) with the sealing metal layer (7) interposed therebetween and vacuum-seals the device (2). A dummy wiring (11) is softer than the metallized pattern (6), is formed at least between an outer portion of the corner portion of the sealing metal layer (7) and the semiconductor substrate (1), and does not electrically connected to the device (2).

An encapsulation hood is fastened onto electrically conductive zones of a support substrate using springs. Each spring has a region in contact with an electrically conductive path contained in the encapsulation hood and another region in contact with a corresponding one of the electrically conductive zones. The fastening of the part of the encapsulation hood onto the support substrate compresses the springs and further utilizes a bead of insulating glue located between the compressed springs.