Patent classifications
H01L33/18
PHOTOELECTRIC CONVERSION DEVICE
Provided are a solar cell and a light emitting device with low leakage current and low cost, using ZnO fine particles. A p-type ZnO layer (p-type layer) (14) made primarily of p-type ZnO fine particles (931) is formed. P-side electrodes (16) are formed at a plurality of regions on the p-type layer (14). A thin insulating layer (18) is formed between an n-type layer (13) and the p-type layer (14). In the insulating layer (18), openings are formed at regions A each not overlapping the p-side electrodes (16) and being apart from them in a plan view. In the configuration, by thus making the p-side electrodes (16) apart from the regions A, the length of a current path in the p-type layer (14) can be made substantially larger than the layer thickness. Accordingly, even when n-type ZnO fine particles (932) are incorporated in the p-type layer (14), it is possible to interpose some of the p-type ZnO fine particles (931) along a leakage current path caused by the incorporation, and thereby cut off the current path.
PHOTOELECTRIC CONVERSION DEVICE
Provided are a solar cell and a light emitting device with low leakage current and low cost, using ZnO fine particles. A p-type ZnO layer (p-type layer) (14) made primarily of p-type ZnO fine particles (931) is formed. P-side electrodes (16) are formed at a plurality of regions on the p-type layer (14). A thin insulating layer (18) is formed between an n-type layer (13) and the p-type layer (14). In the insulating layer (18), openings are formed at regions A each not overlapping the p-side electrodes (16) and being apart from them in a plan view. In the configuration, by thus making the p-side electrodes (16) apart from the regions A, the length of a current path in the p-type layer (14) can be made substantially larger than the layer thickness. Accordingly, even when n-type ZnO fine particles (932) are incorporated in the p-type layer (14), it is possible to interpose some of the p-type ZnO fine particles (931) along a leakage current path caused by the incorporation, and thereby cut off the current path.
Optoelectronic device
A method of manufacturing an optoelectronic device, including the steps of: forming, on a first surface of a first including assemblies of electronic components, a stack of insulating layers and of conductive tracks; forming, on another wafer, light-emitting diodes each comprising ends; forming a metal layer on at least a portion of the surface of the first wafer and another metal layer on at least a portion of the surface of the second wafer, the other metal layer being electrically coupled to the end of each light-emitting diode; placing into contact the metal layers; forming an insulated conductive via connecting another surface of the wafer to a conductive track; and forming insulated conductive trenches surrounding diodes.
Group 13 element nitride layer, free-standing substrate and functional element
A layer of a crystal of a group 13 nitride selected from gallium nitride, aluminum nitride, indium nitride and the mixed crystals thereof has an upper surface and a bottom surface. The upper surface includes a linear high-luminance light-emitting part and a low-luminance light-emitting region adjacent to the high-luminance light-emitting part. The high-luminance light-emitting part includes a portion extending along an m-plane of the crystal of the group 13 nitride. A normal line to the upper surface has an off-angle of 2.0° or less with respect to <0001> direction of the crystal of the nitride of the group 13 element.
Group 13 element nitride layer, free-standing substrate and functional element
A layer of a crystal of a group 13 nitride selected from gallium nitride, aluminum nitride, indium nitride and the mixed crystals thereof has an upper surface and a bottom surface. The upper surface includes a linear high-luminance light-emitting part and a low-luminance light-emitting region adjacent to the high-luminance light-emitting part. The high-luminance light-emitting part includes a portion extending along an m-plane of the crystal of the group 13 nitride. A normal line to the upper surface has an off-angle of 2.0° or less with respect to <0001> direction of the crystal of the nitride of the group 13 element.
DEVICES COMPRISING DISTRIBUTED BRAGG REFLECTORS AND METHODS OF MAKING THE DEVICES
A method for making a device. The method comprises forming a buffer layer on a substrate; forming a periodically doped layer on the buffer layer; forming one or more wires on the periodically doped layer, the wires being chosen from nanowires and microwires; and introducing porosity into the periodically doped layer to form a porous distributed Bragg reflector (DBR). Various devices that can be made by the method are also disclosed.
DEVICES COMPRISING DISTRIBUTED BRAGG REFLECTORS AND METHODS OF MAKING THE DEVICES
A method for making a device. The method comprises forming a buffer layer on a substrate; forming a periodically doped layer on the buffer layer; forming one or more wires on the periodically doped layer, the wires being chosen from nanowires and microwires; and introducing porosity into the periodically doped layer to form a porous distributed Bragg reflector (DBR). Various devices that can be made by the method are also disclosed.
NANOROD LED, DISPLAY APPARATUS INCLUDING THE SAME, AND METHOD OF MANUFACTURING THE NANOROD LED
Provided are nanorod light emitting diodes (LEDs), display apparatuses, and manufacturing methods thereof. The nanorod LED includes a first-type semiconductor layer including a body and a pyramidal structure continuously provided from the body, a nitride light emitting layer provided on the pyramidal structure, and a second-type semiconductor layer provided in the nitride light emitting layer.
GROUP III-N LIGHT EMITTER ELECTRICALLY INJECTED BY HOT CARRIERS FROM AUGER RECOMBINATION
A Group-III nitride light emitting device that utilizes scattering of hot carriers generated by Auger recombination from an externally electrically-driven, relatively narrow band gap carrier generation region into a relatively wide band gap carrier recombination region, such that the relatively wide band gap carrier recombination region of the Group-III nitride light emitting device is internally electrically injected by the hot carriers generated in the externally electrically-injected relatively narrow band gap carrier generation region. The device is used for generation of incoherent light (a light-emitting diode) or coherent light (a laser diode).
Micro-LED displays
A micro-light emitting diode (LED) display panel and a method of forming the display panel, the micro-LED display panel having a monolithically grown micro-structure including a first color micro-LED that is a first color nanowire LED, and a second color micro-LED that is a second color nanowire LED.