Enhanced operational amplifier trim circuitry and techniques are presented herein. In one implementation, a circuit includes a reference circuit configured to produce a set of reference voltages, and a digital-to-analog conversion (DAC) circuit. The DAC circuit comprises a plurality of transistor pairs, where each pair among the plurality of transistor pairs is configured to provide portions of adjustment currents for an operational amplifier based at least on the set of reference voltages and sizing among transistors of each pair. The circuit also includes drain switching elements coupled to drain terminals of the transistors of each pair and configured to selectively couple one or more of the portions of the adjustment currents to the operational amplifier in accordance with digital trim codes.

Broadly speaking, embodiments of the present techniques provide an amplification circuit comprising a sense amplifier and at least one Correlated Electron Switch (CES) configured to provide a signal to the sense amplifier. The sense amplifier outputs an amplified version of the input signal depending on the signal provided by the CES element. The signal provided by the CES element depends on the state of the CES material. The CES element provides a stable impedance to the sense amplifier, which may improve the reliability of reading data from the bit line, and reduce the number of errors introduced during the reading.

An offset-cancellation circuit having a first amplification stage with a gain of the first amplification stage and configured to receive an offset voltage of a first amplifier. A storage element is configured to be coupled to and decoupled from the first amplification stage and configured to store a potential difference output by the first amplification stage. The potential difference is determined by the offset voltage of the first amplifier and the gain of the first amplification stage. A second amplification stage is coupled to the storage element and configured to receive the potential difference from the storage element when the storage element is decoupled from the first amplification stage and configured to deliver an offset-cancellation current. The offset-cancellation current is determined by the potential difference and a gain of the second amplification stage.

Enhanced operational amplifier trim circuitry and techniques are presented herein. In one implementation, a circuit includes a reference circuit configured to produce a set of reference voltages, and a digital-to-analog conversion (DAC) circuit. The DAC circuit comprises a plurality of transistor pairs, where each pair among the plurality of transistor pairs is configured to provide portions of adjustment currents for an operational amplifier based at least on the set of reference voltages and sizing among transistors of each pair. The circuit also includes drain switching elements coupled to drain terminals of the transistors of each pair and configured to selectively couple one or more of the portions of the adjustment currents to the operational amplifier in accordance with digital trim codes.

An analog-to-digital converter circuit includes: a first operation amplifier suitable for comparing a ramp voltage and a voltage to be converted so as to produce an amplification result and outputting the amplification result; a second operation amplifier suitable for comparing the amplification result transferred to a first input terminal with a reference voltage transferred to a second input terminal so as to produce a comparison result and outputting the comparison result; a leakage current measurer suitable for measuring a leakage current to the first input terminal; and a leakage current generator suitable for causing a current of the same amount as that of the leakage current measured by the leakage current measurer to flow to the second input terminal.

A FBDDA amplifier comprising: a first differential input stage, which receives an input voltage; a second differential input stage, which receives a common-mode voltage; a first resistive-degeneration group coupled to the first differential input; a second resistive-degeneration group coupled to the second differential input; a differential output stage, generating an output voltage; a first switch coupled in parallel to the first resistive-degeneration group; and a second switch coupled in parallel to the second resistive-degeneration group. The first and second switches are driven into the closed state when the voltage input assumes a first value such that said first input stage operates in the linear region, and are driven into the open state when the voltage input assumes a second value, higher than the first value, such that the first input stage operates in a non-linear region.

A device includes an amplifier and calibration circuitry coupled to the amplifier. The calibration circuitry is configured to receive calibration values. The calibration circuitry is also configured to generate an output value in response to receiving a timing input.

Broadly speaking, embodiments of the present techniques provide an amplification circuit comprising a sense amplifier and at least one Correlated Electron Switch (CES) configured to provide a signal to the sense amplifier. The sense amplifier outputs an amplified version of the input signal depending on the signal provided by the CES element. The signal provided by the CES element depends on the state of the CES material. The CES element provides a stable impedance to the sense amplifier, which may improve the reliability of reading data from the bit line, and reduce the number of errors introduced during the reading.

Apparatus and methods for reducing input bias current of electronic circuits are provided herein. In certain implementations, an electronic circuit includes a first input terminal, a second input terminal, an input circuit, and a plurality of input switches including at least a first input switch and a second input switch. The first input switch is electrically connected between the first input terminal and a first input of the input circuit, the second input switch is electrically connected between the second input terminal and a second input of the input circuit, and the first and second input switches can be opened and closed using a clock signal. The electronic circuit further includes a charge compensation circuit for compensating for charge injection through the first and second input switches during transitions of the clock signal.

The present disclosure relates to a device comprising two error amplifier stages having their first inputs interconnected, their second inputs interconnected and their outputs coupled to an output of the device, each stage comprising an operational amplifier; a circuit for calibrating the amplifier; a switch coupling an input of the amplifier to the first input; a switch coupling another input of the amplifier to the second input; a switch coupling an output of the amplifier to the stage output; a switch having on state which short-circuits the inputs of the amplifier; and a switch coupling the output of the amplifier to the calibration circuit.