Patent classifications
H03F2203/45212
DEVICES AND METHODS FOR OFFSET CANCELLATION
An offset-cancellation circuit having a first amplification stage with a gain of the first amplification stage and configured to receive an offset voltage of a first amplifier. A storage element is configured to be coupled to and decoupled from the first amplification stage and configured to store a potential difference output by the first amplification stage. The potential difference is determined by the offset voltage of the first amplifier and the gain of the first amplification stage. A second amplification stage is coupled to the storage element and configured to receive the potential difference from the storage element when the storage element is decoupled from the first amplification stage and configured to deliver an offset-cancellation current. The offset-cancellation current is determined by the potential difference and a gain of the second amplification stage.
Amplifier circuit, chip and electronic device
The present application discloses an amplifier circuit, a chip and an electronic device, which generates a positive output signal and a negative output signal according to a positive input signal and a negative input signal, wherein the positive input signal and the negative input signal have a corresponding input differential-mode voltage and input common-mode voltage, and the positive output signal and the negative output signal have a corresponding output differential-mode voltage and output common-mode voltage, and the amplifier circuit includes: an amplifying unit, configured to receive the positive input signal and the negative input signal and generate the positive output signal and the negative output signal; and an attenuation unit, including: a positive common-mode capacitor and a negative common-mode capacitor, configured to attenuate the input common-mode voltage below a first specific frequency.
Semiconductor device and potential measurement apparatus
To provide a semiconductor device that makes it possible to reduce a cell circuit area and an increase in resolution. There is provided a semiconductor device including: a first region in which readout cells are arranged in an array form, the readout cells having one of input transistors included in a differential amplifier: and a second region in which reference cells are arranged in an array form, the reference cells having another input transistor included in the differential amplifier, the first region and the second region being separated from each other.
REGULATED SUPPLY FOR IMPROVED SINGLE-ENDED CHOPPING PERFORMANCE
A circuit includes a single-ended amplifier having first and second transistors and an amplifier output. The first transistor has a first control input and first and second current terminals. The second transistor has a second control input and third and fourth current terminals. The first and third current terminals are coupled to an adaptively regulated voltage terminal. The circuit also includes a chopper circuit coupled to the amplifier output and to the first and second transistors. A voltage tracking circuit has a voltage tracking circuit input and a voltage tracking circuit output. The voltage tracking circuit input is coupled to the amplifier output, and the voltage tracking circuit output is coupled to the adaptively regulated voltage terminal. The voltage tracking circuit is configured to adaptively vary a voltage on the regulated voltage terminal based on the amplifier output.
Operational amplifier
A differential pair for an input stage includes two identical branches in parallel, each branch including a first MOS transistor and a second MOS transistor arranged in series, wherein the first transistor and the second transistor have a channel of the same type, and wherein each of the first transistor and the second transistor has a gate coupled to the same corresponding input of the differential pair and a circuit configured to apply to each of the first transistors a potential difference between a source and a channel-forming region of the first transistor.
COMMON MODE CORRECTION USING ADC IN ANALOG PROBE BASED RECEIVER
A method for removing offset in a receiver of an integrated circuit (IC) includes: determining digital codes of differential input voltages of an amplifier in a first receiving lane of the receiver; comparing the digital codes to a digital code corresponding to an optimum common mode voltage (VCM) of the receiver; according to the comparison, determining a bias code for adjusting both the differential input voltages to match the optimum VCM; and inputting the bias code to a bias circuit of the receiver. The first receiving lane of the receiver includes a plurality of amplifiers. The method steps are repeated for each amplifier of the plurality of amplifiers, and then repeated for all receiving lanes of the IC.
Transimpedance amplifier circuit
A transimpedance amplifier circuit (1) includes an amplifier (22) that amplifies a received signal, an automatic gain control (AGC) circuit (2) that controls the amplification gain of the amplifier by a first time constant in accordance with the level of the received signal, and a first selection circuit (25) that selects the first time constant from a plurality of predetermined values. This can simultaneously implement a short time constant of an AGC function necessary to instantaneously respond to a burst signal and a long time constant of the AGC function necessary to obtain a satisfactory bit error rate (BER) characteristic in a continuous signal by an inexpensive and compact circuit arrangement.
Offset compensation circuitry for an amplification circuit
Offset compensation circuitry for an amplification circuit. One example embodiment is a method of compensating a primary operational amplifier including: creating, by way of a companion circuit, a square wave having an amplitude, a period, and a direct current bias (DC bias), the amplitude proportional to an offset of the primary operational amplifier; integrating, by the companion circuit, the amplitude of the square wave for less than the period of the square wave, the integrating creates a compensation signal; and applying the compensation signal to the primary operational amplifier.
Analog-to-digital converter circuit and image sensor
An analog-to-digital converter circuit includes: a first operation amplifier suitable for comparing a ramp voltage and a voltage to be converted so as to produce an amplification result and outputting the amplification result; a second operation amplifier suitable for comparing the amplification result transferred to a first input terminal with a reference voltage transferred to a second input terminal so as to produce a comparison result and outputting the comparison result; a leakage current measurer suitable for measuring a leakage current to the first input terminal; and a leakage current generator suitable for causing a current of the same amount as that of the leakage current measured by the leakage current measurer to flow to the second input terminal.
Amplifier circuit
An amplifier circuit includes a sampling circuit and an amplifier connected to an output of the sampling circuit. A feedback capacitor is between an output terminal of the amplifier and an output terminal of the sampling circuit. A quantizer that includes a comparator is configured to quantize a voltage at the output terminal of the sampling circuit according to a comparison of a voltage at the output terminal of the sampling circuit to a voltage at the reference potential terminal of the comparator. The quantizer outputs a digital code according to the voltage comparison. A control circuit receives the digital code from the quantizer and stores the digital code in a register as a cancellation digital code. A digital-analog (D/A) converter outputs an analog signal in accordance with digital codes from the control circuit.