High-data rate channel interface modules and equalization methods employing a finite impulse response (FIR) analog receive filter. Embodiments include an illustrative channel interface module having multiple amplifier-based delay units arranged in a sequential chain to convert an analog input signal into a set of increasingly-delayed analog signals that are weighted and combined together with the analog input signal to form an equalized signal; and a symbol decision element operating on the equalized signal to obtain a sequence of symbol decisions. An interface that extracts received data from the sequence of symbol decisions. The delay units may employ one or more delay cells each having a common-source amplifier stage followed by a source follower output stage, the two stages providing approximately equal portions of the propagation delay. An enhanced gate-to-drain capacitance in the common-source amplifier may increase propagation delay while reducing bandwidth limitations.

A fully balanced differential difference amplifier includes a first differential input stage that receives an input voltage and a second differential input stage that receives a common-mode voltage. A first resistive-degeneration group is coupled to the first differential input and a second resistive-degeneration group is coupled to the second differential input. A differential output stage generates an output voltage. A first switch is coupled in parallel to the first resistive-degeneration group and a second switch is coupled in parallel with the second resistive-degeneration group. The first and second switches are driven into the closed state when the voltage input assumes a first value such that said first input stage operates in the linear region, and are driven into the open state when the voltage input assumes a second value, higher than the first value, such that the first input stage operates in a non-linear region.

A semiconductor device may include a substrate, active circuitry on the substrate and including differential transistor pairs, and threshold voltage test circuitry on the substrate. The threshold voltage test circuitry may include a pair of differential test transistors replicating the differential transistor pairs within the active circuitry, with each test transistor having a respective input and output, and at least one gain stage configured to amplify a difference between the outputs of the differential test transistors for measuring a threshold voltage thereof. The differential transistor pairs and the pair of differential test transistors may each include spaced apart source and drain regions, a channel region extending between the source and drain regions, and a gate overlying the channel region. Each of the channel regions may include a superlattice.

A method for making a semiconductor device may include forming active circuitry on a substrate including differential transistor pairs, and forming threshold voltage test circuitry on the substrate. The threshold voltage test circuitry may include a pair of differential test transistors replicating the differential transistor pairs within the active circuitry, with each test transistor having a respective input and output, and at least one gain stage configured to amplify a difference between the outputs of the differential test transistors for measuring a threshold voltage thereof. The differential transistor pairs and the pair of differential test transistors each includes spaced apart source and drain regions, a channel region extending between the source and drain regions, and a gate overlying the channel region. Moreover, each of the channel regions may include a superlattice.

A differential amplifier is disclosed. The differential amplifier includes: a pair of input terminals externally receiving an input signal; a first differential pair including a first transistor, a second transistor, a first resistor, and a second resistor and configured to generate a first signal; a second differential pair including a third transistor, a fourth transistor, a third resistor, and a fourth resistor and configured to generate a second signal; a current source connected to the first, second, third, and fourth resistors and configured to provide a current to the first and second differential pairs; a pair of level shifters configured to generate a shifted signal from the input signal; and a pair of output terminals externally outputting an output signal containing the first and second signals, wherein the first and second transistors receive the input signal and the third and fourth transistors receive the shifted signal.