A FBDDA amplifier comprising: a first differential input stage, which receives an input voltage; a second differential input stage, which receives a common-mode voltage; a first resistive-degeneration group coupled to the first differential input; a second resistive-degeneration group coupled to the second differential input; a differential output stage, generating an output voltage; a first switch coupled in parallel to the first resistive-degeneration group; and a second switch coupled in parallel to the second resistive-degeneration group. The first and second switches are driven into the closed state when the voltage input assumes a first value such that said first input stage operates in the linear region, and are driven into the open state when the voltage input assumes a second value, higher than the first value, such that the first input stage operates in a non-linear region.

The disclosure relates to an alternating current (AC) coupling circuit including first and second capacitors having first and second input terminals configured to receive an input differential signal and generate an output differential signal at first and second output terminals of the first and second capacitors. The AC coupling circuit further includes a baseline wander correction circuit configured to make the output differential signal resistant to baseline wander due to the input differential signal including one or more time intervals of unbalanced data. The baseline wander correction circuit includes a differential difference amplifier (DDA) having a first differential input configured to receive the input differential signal, a differential output configured to generate a compensation differential signal, and a second differential input configured to receive the compensation differential signal. The compensation differential signal is applied to the output terminals of the first and second capacitors via a pair of resistors, respectively.

A magnetic operational amplifier having a differential stage includes a first magnetic field effect transistor MAGFET and a differential signal conditioner, the differential signal conditioner including a load stage, a differential input pair connected to the load stage and a biasing current source connected to the differential input pair; the magnetic field effect transistor MAGFET being connected to the load stage as a second differential input pair and the differential signal conditioner including a second biasing current source connected to the magnetic field effect transistor MAGFET.

An amplifier circuitry includes a current source circuit, a voltage regulator circuit, and an amplifier. The current source circuit generates a first bias current. The voltage regulator circuit regulates a reference voltage to generate a supply voltage. The voltage regulator circuit includes a first and a second compensation resistors, the first and the second compensation resistors are configured to generate the reference voltage according to a reference a second bias currents, and a first ratio is present between the first and the second biasing currents. The amplifier includes first load resistors which are configured to generate a first common-mode output signal based on the supply voltage and the first bias current. The second ratio is present between the second compensation resistor and one of the first load resistors, and the first and the second ratios are arranged to compensate the first common-mode output signal.

An amplifier circuitry includes a current source circuit, a voltage regulator circuit, and an amplifier. The current source circuit generates a first bias current. The voltage regulator circuit regulates a reference voltage to generate a supply voltage. The voltage regulator circuit includes a first and a second compensation resistors, the first and the second compensation resistors are configured to generate the reference voltage according to a reference a second bias currents, and a first ratio is present between the first and the second biasing currents. The amplifier includes first load resistors which are configured to generate a first common-mode output signal based on the supply voltage and the first bias current. The second ratio is present between the second compensation resistor and one of the first load resistors, and the first and the second ratios are arranged to compensate the first common-mode output signal.

A magnetic operational amplifier having a differential stage includes a first magnetic field effect transistor MAGFET and a differential signal conditioner, the differential signal conditioner including a load stage, a differential input pair connected to the load stage and a biasing current source connected to the differential input pair; the magnetic field effect transistor MAGFET being connected to the load stage as a second differential input pair and the differential signal conditioner including a second biasing current source connected to the magnetic field effect transistor MAGFET.

High-data rate channel interface modules and equalization methods employing a finite impulse response (FIR) analog receive filter. Embodiments include an illustrative channel interface module having multiple amplifier-based delay units arranged in a sequential chain to convert an analog input signal into a set of increasingly-delayed analog signals that are weighted and combined together with the analog input signal to form an equalized signal; and a symbol decision element operating on the equalized signal to obtain a sequence of symbol decisions. An interface that extracts received data from the sequence of symbol decisions. The delay units may employ one or more delay cells each having a common-source amplifier stage followed by a source follower output stage, the two stages providing approximately equal portions of the propagation delay. An enhanced gate-to-drain capacitance in the common-source amplifier may increase propagation delay while reducing bandwidth limitations.

A fully balanced differential difference amplifier includes a first differential input stage that receives an input voltage and a second differential input stage that receives a common-mode voltage. A first resistive-degeneration group is coupled to the first differential input and a second resistive-degeneration group is coupled to the second differential input. A differential output stage generates an output voltage. A first switch is coupled in parallel to the first resistive-degeneration group and a second switch is coupled in parallel with the second resistive-degeneration group. The first and second switches are driven into the closed state when the voltage input assumes a first value such that said first input stage operates in the linear region, and are driven into the open state when the voltage input assumes a second value, higher than the first value, such that the first input stage operates in a non-linear region.

A method for making a semiconductor device may include forming active circuitry on a substrate including differential transistor pairs, and forming threshold voltage test circuitry on the substrate. The threshold voltage test circuitry may include a pair of differential test transistors replicating the differential transistor pairs within the active circuitry, with each test transistor having a respective input and output, and at least one gain stage configured to amplify a difference between the outputs of the differential test transistors for measuring a threshold voltage thereof. The differential transistor pairs and the pair of differential test transistors each includes spaced apart source and drain regions, a channel region extending between the source and drain regions, and a gate overlying the channel region. Moreover, each of the channel regions may include a superlattice.

A semiconductor device may include a substrate, active circuitry on the substrate and including differential transistor pairs, and threshold voltage test circuitry on the substrate. The threshold voltage test circuitry may include a pair of differential test transistors replicating the differential transistor pairs within the active circuitry, with each test transistor having a respective input and output, and at least one gain stage configured to amplify a difference between the outputs of the differential test transistors for measuring a threshold voltage thereof. The differential transistor pairs and the pair of differential test transistors may each include spaced apart source and drain regions, a channel region extending between the source and drain regions, and a gate overlying the channel region. Each of the channel regions may include a superlattice.