A sigma-delta ADC comprising: a first-input-terminal configured to receive a first-high-voltage-analogue-input-signal; a second-input-terminal configured to receive a second-high-voltage-analogue-input-signal; an output-terminal configured to provide an output-digital-signal, wherein the output-digital-signal is representative of the difference between the first-high-voltage-analogue-input-signal and the second-high-voltage-analogue-input-signal. The sigma-delta ADC also includes a feedback-current-block, which comprises: a first-feedback-transistor having a conduction channel; a second-feedback-transistor having a conduction channel; a first-feedback-switch; a second-feedback-switch; a first-feedback-current-source; and a second-feedback-current-source.

A differential to single-ended buffer amplifier with a swing suppression resistor in the differential amplification architecture is shown. The differential to single-ended buffer amplifier has a positive input terminal, a negative input terminal, a differential to single-ended operational amplifier (DISO op amp), and a swing suppression resistor. The DISO op amp has a non-inverting input terminal and an inverting input terminal respectively coupled to the positive input terminal and the negative input terminal, and it has a single-ended output terminal that outputs the output signal of the differential to single-ended buffer amplifier. The swing suppression resistor is connected between the negative input terminal of the differential to single-ended buffer amplifier and the non-inverting input terminal of the DISO op amp.

A multi-stage transimpedance amplifier (TIA) with an adjustable input linear range is disclosed. The TIA includes a first stage, configured to convert a single-ended current signal from an optical sensor of a receiver signal chain to a single-ended voltage signal, and a second stage, configured to convert the single-ended voltage signal provided by the first stage to a differential signal. In such a TIA, the input linear range may be adjusted using a clamp that is programmable with an output offset current to keep the second stage of the TIA from overloading and to maintain a linear transfer function without compression.

A transceiver includes a first common T-coil circuit coupled to a first input-output pin of the transceiver, a termination impedance coupled to the first common T-coil circuit and configured to match an impedance of a transmission line coupled to the first common T-coil circuit, an amplifier configured to receive an input signal from the first input-output pin through the first common T-coil circuit based on a receive enable signal, and a first transmission buffer configured to transmit an output signal to the first input-output pin through the first common T-coil circuit based on a transmit enable signal.

Sampling circuits and methods for sampling are provided. In a first operating phase, sampling capacitors are coupled to inputs, and in a second operating phase, to a common-mode signal.

A detection circuit for detecting a clock signal includes a multiplexer, a digital-to-analog converter, a comparator, and a counter. The multiplexer outputs either a first signal or a second signal as a selection signal. The digital-to-analog converter outputs a reference voltage according to the selection signal. The comparator compares the clock signal to the reference voltage to generate a comparison signal. The counter counts a reference clock signal to generate an overflow signal, and resets the overflow signal according to the comparison signal. The overflow signal indicates the amplitude of the clock signal.

An amplifying circuit includes a reference voltage generating circuit, a common-mode voltage conversion circuit, a common-mode negative feedback circuit, and an amplifying sub-circuit. The reference voltage generating circuit generates a first reference voltage, a second reference voltage, and a reference common-mode voltage according to a post-stage common-mode voltage. The common-mode voltage conversion circuit converts the pre-stage output differential signal into a differential input signal according to the reference common-mode voltage. The common-mode negative feedback circuit generates a control voltage to quickly establish a common-mode negative feedback of the amplifying sub-circuit, wherein the first reference voltage and the second reference voltage are used to cancel a baseline signal of the pre-stage output differential signal. The amplifying circuit can eliminate the baseline signal, convert the common-mode voltage and quickly establish the common-mode negative feedback.

Certain aspects of the present disclosure provide methods and apparatus for implementing an amplification system. The amplification system includes an amplifier comprising differential inputs and an output. The differential inputs include an inverting input and a non-inverting input. The amplification system further includes a feedback path from the output coupled to the inverting input. The feedback path from the output is coupled to at least one of an inverting amplifier or buffer, and the at least one of the inverting amplifier or buffer is further coupled to the non-inverting input.

In order to realize a circuit in a subsequent stage with a smaller circuit scale with respect to a single-ended input of a large signal, a double-sampling switched-capacitor input circuit includes a first switched-capacitor input circuit, which includes first capacitors for double sampling, and a second switched-capacitor input circuit, which includes second capacitors for double sampling, and which is configured to operate in opposite phase to the first switched-capacitor input circuit, the double-sampling switched-capacitor input circuit having a configuration in which the first capacitors and the second capacitors have different values, and in which the value of the second capacitors is adjusted so that a signal is attenuated.

An electronic device test system includes a contactor having probe pairs with first and second conductive probes to couple to a respective conductive feature of a packaged electronic device or wafer die region. The system also includes a test circuit having a voltage source to provide a common mode voltage signal; a first buffer with a first input coupled to an output of the voltage source, an output coupled to a first conductive probe of a first probe pair, and a second input coupled to a second conductive probe of the first probe pair; and a second buffer with a first input coupled to the output of the voltage source, an output coupled to a first conductive probe of a second probe pair, and a second input coupled to a second conductive probe of the second probe pair.