An amplifier including a P-channel transistor having current terminals coupled between a first node and a second node and having a control terminal coupled to a third node receiving an input voltage, an N-channel transistor having current terminals coupled between a fourth node developing an output voltage and a supply voltage reference and having a control terminal coupled to the second node, a first resistor coupled between the first node and a supply voltage, a second resistor coupled between the first and fourth nodes, and a current sink sinking current from the second node to the supply reference node. The amplifier may be converted to differential form for amplifying a differential input voltage. Current devices may be adjusted for common mode, and may be moved or added to improve headroom or to improve power supply rejection. Chopper circuits may be added to reduce 1/f noise.

An amplifier including a P-channel transistor having current terminals coupled between a first node and a second node and having a control terminal coupled to a third node receiving an input voltage, an N-channel transistor having current terminals coupled between a fourth node developing an output voltage and a supply voltage reference and having a control terminal coupled to the second node, a first resistor coupled between the first node and a supply voltage, a second resistor coupled between the first and fourth nodes, and a current sink sinking current from the second node to the supply reference node. The amplifier may be converted to differential form for amplifying a differential input voltage. Current devices may be adjusted for common mode, and may be moved or added to improve headroom or to improve power supply rejection. Chopper circuits may be added to reduce 1/f noise.

A sample-and-hold amplifier can include: an operational amplifier; a sampling capacitor having a first terminal coupled to an inverting input terminal of the operational amplifier, and a second terminal coupled to a reference ground; and a switching circuit configured to switch feedback paths of the sample-and-hold amplifier in a first stage and a second stage, such that an offset voltage of the operational amplifier is at least partially eliminated.

A high-speed comparator circuit is provided. The circuit includes an amplifier portion, a latch portion, and a negative capacitance portion. The amplifier portion includes an input coupled to receive an analog signal and an output. The latch portion is coupled to the amplifier portion. The latch portion is configured to provide at the output a digital value based on the analog signal. The negative capacitance portion is coupled to the output. The negative capacitance portion is configured to cancel parasitic capacitance coupled at the first output.

A system has an output and receives an input signal. An operational amplifier has an input, an output and an offset at the input. A switched capacitor network samples the input signal at a switched capacitor frequency. An autozeroing capacitor connected to the input of the operational amplifier captures the offset during an offset capture interval according to an autozeroing frequency. Chopping and autozeroing switches, connected between the autozeroing capacitor and the switched capacitor network, chop the sampled input signal according to a chopping frequency and autozero the captured offset according to the autozeroing frequency. De-chopping switches, connected between the output of the operational amplifier and the output of the system, operate on the output of the operational amplifier at the chopping frequency to chop the autozeroed captured offset and de-chop the chopped sampled input signal processed by the operational amplifier.

A system has an output and receives an input signal. An operational amplifier has an input, an output and an offset at the input. A switched capacitor network samples the input signal at a switched capacitor frequency. An autozeroing capacitor connected to the input of the operational amplifier captures the offset during an offset capture interval according to an autozeroing frequency. Chopping and autozeroing switches, connected between the autozeroing capacitor and the switched capacitor network, chop the sampled input signal according to a chopping frequency and autozero the captured offset according to the autozeroing frequency. De-chopping switches, connected between the output of the operational amplifier and the output of the system, operate on the output of the operational amplifier at the chopping frequency to chop the autozeroed captured offset and de-chop the chopped sampled input signal processed by the operational amplifier.

A high-speed comparator circuit is provided. The circuit includes an amplifier portion, a latch portion, and a negative capacitance portion. The amplifier portion includes an input coupled to receive an analog signal and an output. The latch portion is coupled to the amplifier portion. The latch portion is configured to provide at the output a digital value based on the analog signal. The negative capacitance portion is coupled to the output. The negative capacitance portion is configured to cancel parasitic capacitance coupled at the first output.

An analog circuit including a pair of input nodes and a pair of output nodes is coupled to a mismatch reduction circuit including an input node, an output node, a phase controller that times even and odd phases, an input switch, and an output switch. The input switch electrically connects the mismatch reduction circuit input node to a first node of the pair of analog circuit input nodes during each even phase and to electrically connects the mismatch reduction circuit input node to a second node of the pair of analog circuit input nodes during each odd phase. The output switch electrically connects a first node of the pair of analog circuit output nodes to the mismatch reduction circuit output node during each even phase and electrically connects a second node of the pair of analog circuit output nodes to the mismatch reduction circuit output node during each odd phase.

An analog circuit including a pair of input nodes and a pair of output nodes is coupled to a mismatch reduction circuit including an input node, an output node, a phase controller that times even and odd phases, an input switch, and an output switch. The input switch electrically connects the mismatch reduction circuit input node to a first node of the pair of analog circuit input nodes during each even phase and to electrically connects the mismatch reduction circuit input node to a second node of the pair of analog circuit input nodes during each odd phase. The output switch electrically connects a first node of the pair of analog circuit output nodes to the mismatch reduction circuit output node during each even phase and electrically connects a second node of the pair of analog circuit output nodes to the mismatch reduction circuit output node during each odd phase.

An analog circuit including a pair of input nodes and a pair of output nodes is coupled to a mismatch reduction circuit including an input node, an output node, a phase controller that times even and odd phases, an input switch, and an output switch. The input switch electrically connects the mismatch reduction circuit input node to a first node of the pair of analog circuit input nodes during each even phase and to electrically connects the mismatch reduction circuit input node to a second node of the pair of analog circuit input nodes during each odd phase. The output switch electrically connects a first node of the pair of analog circuit output nodes to the mismatch reduction circuit output node during each even phase and electrically connects a second node of the pair of analog circuit output nodes to the mismatch reduction circuit output node during each odd phase.