H03K19/003

CIRCUITS FOR CONVERTING SFQ-BASED RZ AND NRZ SIGNALING TO BILEVEL VOLTAGE NRZ SIGNALING

Edge-sensitive, state-based single flux quantum (SFQ) based circuitry and related methods convert return-to-zero (RZ) or non-return-to-zero (NRZ) encoded SFQ-pulse-based signals to bilevel NRZ phase signals that can subsequently be converted to bilevel voltage signals by an output amplifier (OA). The SFQ-based circuitry can be integrated with a current amplification stage of a driver that can be coupled to a stage of the OA. The SFQ-based circuitry can be made to be compatible with RQL-encoded input signals that can be either RZ or NRZ. The SFQ-based circuitry can thus be compatible with both wave-pipelined (WPL) and phase-mode (PML) RQL circuitry. Because the SFQ-based circuitry and related methods are edge-sensitive and state-based, they can function at system clock rates in excess of 1 GHz with reduced glitches and improved bit error rates as compared to other superconducting RZ-NRZ conversion circuitry and methods.

CIRCUITS FOR CONVERTING SFQ-BASED RZ AND NRZ SIGNALING TO BILEVEL VOLTAGE NRZ SIGNALING

Edge-sensitive, state-based single flux quantum (SFQ) based circuitry and related methods convert return-to-zero (RZ) or non-return-to-zero (NRZ) encoded SFQ-pulse-based signals to bilevel NRZ phase signals that can subsequently be converted to bilevel voltage signals by an output amplifier (OA). The SFQ-based circuitry can be integrated with a current amplification stage of a driver that can be coupled to a stage of the OA. The SFQ-based circuitry can be made to be compatible with RQL-encoded input signals that can be either RZ or NRZ. The SFQ-based circuitry can thus be compatible with both wave-pipelined (WPL) and phase-mode (PML) RQL circuitry. Because the SFQ-based circuitry and related methods are edge-sensitive and state-based, they can function at system clock rates in excess of 1 GHz with reduced glitches and improved bit error rates as compared to other superconducting RZ-NRZ conversion circuitry and methods.

Systems, methods, and apparatuses for temperature and process corner sensitive control of power gated domains
11581889 · 2023-02-14 · ·

Apparatuses and methods for temperature and process corner sensitive control of power gated domains are described. An example apparatus includes an internal circuit; a power supply line; and a power gating control circuit which responds, at least in part, to a first change from a first state to a second state of a control signal to initiate supplying a power supply voltage from the power supply line to the internal circuit, and continue supplying the power supply voltage from the power supply line to internal circuit for at least a timeout period from a second change from the second state to the first state of the control signal, in which the timeout period represent temperature dependency.

SEMICONDUCTOR DEVICE IMPLEMENTING PHYSICALLY UNCLONABLE FUNCTION

An exemplary embodiment of the present disclosure provides a physically unclonable function (PUF) cell capable of exhibiting a stable performance and showing an excellent repeatability while being less affected by environmental factors such as a noise, temperature, and bias voltage. The PUF cell generates an output value by combining a scheme of amplifying a threshold voltage difference and a scheme of amplifying an oscillation frequency difference. In an oscillator that generates oscillation signals of different frequencies, the frequency difference of the oscillation signals is amplified by alternately supplying bias voltages of different magnitudes generated by utilizing the threshold voltage difference to a plurality of stages in the oscillator.

SEMICONDUCTOR DEVICE IMPLEMENTING PHYSICALLY UNCLONABLE FUNCTION

An exemplary embodiment of the present disclosure provides a physically unclonable function (PUF) cell capable of exhibiting a stable performance and showing an excellent repeatability while being less affected by environmental factors such as a noise, temperature, and bias voltage. The PUF cell generates an output value by combining a scheme of amplifying a threshold voltage difference and a scheme of amplifying an oscillation frequency difference. In an oscillator that generates oscillation signals of different frequencies, the frequency difference of the oscillation signals is amplified by alternately supplying bias voltages of different magnitudes generated by utilizing the threshold voltage difference to a plurality of stages in the oscillator.

APPARATUSES AND METHODS FOR PHASE INTERPOLATING CLOCK SIGNALS AND FOR PROVIDING DUTY CYCLE CORRECTED CLOCK SIGNALS
20180006636 · 2018-01-04 · ·

Apparatuses and methods for phase interpolating clock signals and for providing duty cycle corrected clock signals are described. An example apparatus includes a clock generator circuit configured to provide first and second clock signals responsive to an input clock signal. A duty phase interpolator circuit may be coupled to the clock generator circuit and configured to provide a first and second duty cycle corrected interpolated clock signals. A duty cycle adjuster circuit may be coupled to the duty phase interpolator circuit and configured to receive the first and second duty cycle corrected interpolated clock signals and provide a duty cycle corrected clock signal responsive thereto. A duty cycle detector may be coupled to the duty cycle adjuster circuit and configured to detect duty cycle error of the duty cycle corrected clock signal and provide the adjustment signals to correct the duty cycle error.

APPARATUSES AND METHODS FOR PHASE INTERPOLATING CLOCK SIGNALS AND FOR PROVIDING DUTY CYCLE CORRECTED CLOCK SIGNALS
20180006636 · 2018-01-04 · ·

Apparatuses and methods for phase interpolating clock signals and for providing duty cycle corrected clock signals are described. An example apparatus includes a clock generator circuit configured to provide first and second clock signals responsive to an input clock signal. A duty phase interpolator circuit may be coupled to the clock generator circuit and configured to provide a first and second duty cycle corrected interpolated clock signals. A duty cycle adjuster circuit may be coupled to the duty phase interpolator circuit and configured to receive the first and second duty cycle corrected interpolated clock signals and provide a duty cycle corrected clock signal responsive thereto. A duty cycle detector may be coupled to the duty cycle adjuster circuit and configured to detect duty cycle error of the duty cycle corrected clock signal and provide the adjustment signals to correct the duty cycle error.

Mixed-Signal Integrated Circuit
20180003770 · 2018-01-04 ·

A mixed-signal integrated circuit includes an analog circuit comprising at least one digital block embedded in the analog circuit, the at least one digital block comprising a plurality of functional bits and a plurality of configuration bits, the plurality of functional bits providing for a functionality of the analog circuit according to a designed functionality and the plurality of configuration bits being usable for configuring a plurality of operational modes of the analog circuit; and a digital circuit comprising a scan chain configured to scan at least part of the functional bits of the digital block embedded in the analog circuit with respect to the designed functionality, wherein the scan chain is further configured to set at least part of the configuration bits of the digital block embedded in the analog circuit according to a selected operational mode of the plurality of operational modes of the analog circuit.

Mixed-Signal Integrated Circuit
20180003770 · 2018-01-04 ·

A mixed-signal integrated circuit includes an analog circuit comprising at least one digital block embedded in the analog circuit, the at least one digital block comprising a plurality of functional bits and a plurality of configuration bits, the plurality of functional bits providing for a functionality of the analog circuit according to a designed functionality and the plurality of configuration bits being usable for configuring a plurality of operational modes of the analog circuit; and a digital circuit comprising a scan chain configured to scan at least part of the functional bits of the digital block embedded in the analog circuit with respect to the designed functionality, wherein the scan chain is further configured to set at least part of the configuration bits of the digital block embedded in the analog circuit according to a selected operational mode of the plurality of operational modes of the analog circuit.

BREAKDOWN-BASED PHYSICAL UNCLONABLE FUNCTION

A device and a method for implementing a physically unclonable function is disclosed. In one aspect, the device includes at least one electronic structure including a dielectric. A conductive path is formed at a random position through the dielectric due to an electrical breakdown of the dielectric, or the electronic structure is adapted for generating an electrical breakdown of the dielectric such that the conductive path is formed through the dielectric at a random position. The at least one electronic structure is adapted for determining a distinct value of a set comprising at least two predetermined values. The distinct value is determined by the position of the conductive path through the dielectric.